Patents by Inventor Markus Basel

Markus Basel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10853971
    Abstract: A method for determining an exposure, in particular an exposure time, for a recording in a method for determining the 3D coordinates of an object is provided, in which a pattern is projected onto the object and the light reflected by the object is recorded. To improve such a method, a recording of the object is produced with a predetermined exposure, in particular exposure time. A mask image of this recording is produced, in which mask image the regions of the object lying within the measurement volume are depicted. The exposure, in particular the exposure time, for the recording is determined depending on the predetermined exposure, in particular exposure time, depending on the mean greyscale value in the regions, lying within the measurement volume, of the recording with a predetermined exposure and depending on an ideal greyscale value.
    Type: Grant
    Filed: February 1, 2018
    Date of Patent: December 1, 2020
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Christian Schleith, Tom Jaeckel, Alexander Frey, Markus Basel
  • Patent number: 10200670
    Abstract: In a method for determining the 3D coordinates of an object a pattern (6) is projected onto the object (1) by a projector (3), the light reflected by the object (1) is captured by a camera (4), and the shots recorded by the camera (4) are evaluated. Reference marks (8) on and/or beside the object (1) are recorded by a reference camera (5). The reference camera (5) has a larger field of view (9) than the camera (4). To improve such method, the reference camera (5) is connected with the camera (4) or with a 3D sensor (2) which comprises the projector (3) and the camera (4).
    Type: Grant
    Filed: October 1, 2012
    Date of Patent: February 5, 2019
    Assignee: CARL ZEISS OPTOTECHNIK GMBH
    Inventors: Marcus Steinbichler, Herbert Daxauer, Thomas Mayer, Markus Basel
  • Publication number: 20180218517
    Abstract: A method for determining an exposure, in particular an exposure time, for a recording in a method for determining the 3D coordinates of an object is provided, in which a pattern is projected onto the object and the light reflected by the object is recorded. To improve such a method, a recording of the object is produced with a predetermined exposure, in particular exposure time. A mask image of this recording is produced, in which mask image the regions of the object lying within the measurement volume are depicted. The exposure, in particular the exposure time, for the recording is determined depending on the predetermined exposure, in particular exposure time, depending on the mean greyscale value in the regions, lying within the measurement volume, of the recording with a predetermined exposure and depending on an ideal greyscale value.
    Type: Application
    Filed: February 1, 2018
    Publication date: August 2, 2018
    Inventors: Christian Schleith, Tom Jaeckel, Alexander Frey, Markus Basel
  • Patent number: 7414732
    Abstract: The invention relates to a method for determining the 3D profile of an object. In order to improve a method of this type, several sections of the object (5) are measured. During at least one measuring operation, at least one reference object (4) is measured. The measured sections of the object (5) are combined (1).
    Type: Grant
    Filed: May 16, 2001
    Date of Patent: August 19, 2008
    Assignee: Steinbichler Optotechnik GmbH
    Inventors: Armin Maidhof, Peter Andrā, Manfred Adlhart, Michael Kaus, Markus Basel, Frank Thoss, Markus Lazar, Thomas Nasswetter, Hans Steinbichler
  • Publication number: 20050154548
    Abstract: A method is used to calibrate a 3D measuring device (1). In order to calibrate any 3D measuring device (1) without specific manufacturer's know-how, one or more characterizing objects (15, 16, 17) of a reference object (14) are measured at one or more positions in measurement volume (12) of 3D measuring device (1) to be calibrated. A gauge of the measurement error is calculated from the measured values as a function of the position in measurement volume (12). From that, an error correction function is calculated (FIG. 3).
    Type: Application
    Filed: November 1, 2004
    Publication date: July 14, 2005
    Inventors: Markus Basel, Bertram Kaupert, Armin Maidhof, Frieder Petri, Matthias Prams
  • Publication number: 20030112448
    Abstract: The invention relates to a method for determining the 3D profile of an object. In order to improve a method of this type, several sections of the object (5) are measured. During at least one measuring operation, at least one reference object (4) is measured. The measured sections of the object (5) are combined (1).
    Type: Application
    Filed: November 18, 2002
    Publication date: June 19, 2003
    Inventors: Armin Maidhof, Peter Andra, Manfred Adlhart, Michael Kaus, Markus Basel, Frank Thoss, Markus Lazar, Thomas Nasswetter, Hans Steinbichler