Patents by Inventor Markus Brandner

Markus Brandner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Imaging a gap between sample and probe of a scanning probe microscope in a substantially horizontal side view
    Patent number: 10684307
    Abstract: A scanning probe microscope analyses a sample by moving a probe and the sample relative to one another. The scanning probe microscope includes a detection unit for detecting an image of a gap between the sample and the probe in a substantially horizontal side view.
    Type: Grant
    Filed: November 20, 2017
    Date of Patent: June 16, 2020
    Assignee: Anton Paar GmbH
    Inventors: Daniel Koller, Alberto Gomez-Casado, Markus Brandner
  • Characterizing a height profile of a sample by side view imaging
    Patent number: 10488434
    Abstract: A scanning probe microscope, in particular an atomic force microscope, for analyzing a sample by moving a probe and the sample relative to one another, wherein the scanning probe microscope includes a detection unit with a side view camera arranged and configured for detecting an image of the sample in a substantially horizontal side view, and a determining unit for determining information indicative of a profile of at least part of a surface of the sample based on the detected image.
    Type: Grant
    Filed: July 27, 2018
    Date of Patent: November 26, 2019
    Assignee: Anton Paar GmbH
    Inventors: Martin Godec-Schönbacher, Alberto Gomez-Casado, Daniel Koller, Markus Brandner
  • Characterizing a Height Profile of a Sample by Side View Imaging
    Publication number: 20190049486
    Abstract: A scanning probe microscope, in particular an atomic force microscope, for analyzing a sample by moving a probe and the sample relative to one another, wherein the scanning probe microscope includes a detection unit with a side view camera arranged and configured for detecting an image of the sample in a substantially horizontal side view, and a determining unit for determining information indicative of a profile of at least part of a surface of the sample based on the detected image.
    Type: Application
    Filed: July 27, 2018
    Publication date: February 14, 2019
    Inventors: Martin GODEC-SCHÖNBACHER, Alberto GOMEZ-CASADO, Daniel KOLLER, Markus BRANDNER
  • Imaging a Gap Between Sample and Probe of a Scanning Probe Microscope in a Substantially Horizontal Side View
    Publication number: 20180143221
    Abstract: A scanning probe microscope analyses a sample by moving a probe and the sample relative to one another. The scanning probe microscope includes a detection unit for detecting an image of a gap between the sample and the probe in a substantially horizontal side view.
    Type: Application
    Filed: November 20, 2017
    Publication date: May 24, 2018
    Inventors: Daniel Koller, Alberto Gomez-Casado, Markus Brandner
  • Measurement method, sensor arrangement and measurement system
    Patent number: 8368393
    Abstract: In a measurement method, an array of magnetic field sensors (MS0-MS15) is provided, each emitting a sensor signal as a function of magnetic field intensity. A rotational value of a sector-wise magnetized magnetic source that is arranged movably with respect to the array is ascertained as a function of the emitted sensor signals. A set of sensor values is derived from the sensor signals. As a function of the ascertained rotational value, a number of sets of reference values is ascertained that corresponds to a number of predetermined positions of the magnetic source (MAG). The set of sensor values and the number of sets of reference values are compared to one another, and a position is selected from the number of predetermined positions as a function of the comparison.
    Type: Grant
    Filed: June 18, 2008
    Date of Patent: February 5, 2013
    Assignee: Austriamicrosystems AG
    Inventors: Hubert Zangl, Thomas Bretterklieber, Gerald Steiner, Markus Brandner
  • Measurement Method, Sensor Arrangement and Measurement System
    Publication number: 20110025313
    Abstract: In a measurement method, an array of magnetic field sensors (MS0-MS15) is provided, each emitting a sensor signal as a function of magnetic field intensity. A rotational value of a sector-wise magnetized magnetic source that is arranged movably with respect to the array is ascertained as a function of the emitted sensor signals. A set of sensor values is derived from the sensor signals. As a function of the ascertained rotational value, a number of sets of reference values is ascertained that corresponds to a number of predetermined positions of the magnetic source (MAG). The set of sensor values and the number of sets of reference values are compared to one another, and a position is selected from the number of predetermined positions as a function of the comparison.
    Type: Application
    Filed: June 18, 2008
    Publication date: February 3, 2011
    Inventors: Hubert Zangl, Thomas Bretterklieber, Gerald Steiner, Markus Brandner