Patents by Inventor Markus Dattwiler

Markus Dattwiler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20030063302
    Abstract: A new testing means and process for determining typographic parameters were developed. The present invention pertains to a pattern of recorded dots, so-called dots, which is reduced such that it is nearly invisible to the observer. This test target is microscopically enlarged and preferably recorded by means of a CCD camera. The signal-to-noise ratio of the measurement is advantageously increased by averaging over a plurality of consecutive printed patterns. Using highly developed image analysis, it is possible to determine the typographic parameters directly from the miniaturized patterns. The measures taken to reduce the test target are described. The application to the type of a process control, which is based essentially on the geometric features of a certain dot pattern, is then schematically outlined as an example.
    Type: Application
    Filed: September 5, 2002
    Publication date: April 3, 2003
    Inventors: Kurt Munger, Markus Dattwiler, Karl Heuberger, Herbert Janser