Patents by Inventor Markus F Eurlings

Markus F Eurlings has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7057711
    Abstract: A lithography tool includes an exposure chamber and a reticle handler that exchanges a reticle being exposed as prescribed by the user of the lithography tool. The reticle handler can include a vacuum-compatible robot, a vacuum chamber to house the robot, a load-lock to input reticles and transition them from atmospheric pressure to vacuum, a processing station for processing the reticle, and a reticle library for storing at least one extra reticle so that it is quickly available for exchange during an exposure process. The robot can have a two or more handed gripper to simultaneously hold multiple reticles. This allows a first reticle to be removed from the reticle stage with a first hand and a second reticle to be loaded onto the reticle stage with a second hand, and so on, which minimizes exchange time.
    Type: Grant
    Filed: October 27, 2004
    Date of Patent: June 6, 2006
    Assignee: ASML Holding N.V.
    Inventors: Santiago del Puerto, Markus F. A. Eurlings
  • Patent number: 6833907
    Abstract: An illuminator for controlling a beam of radiation for a lithographic projection apparatus includes a plurality of optical elements and an exchanger for inserting and removing the optical elements from the beam path. The intensity distribution of the beam at a pupil plane of the illuminator is determined by the optical elements. Different illumination settings (intensity distributions) can be obtained by the exchanger swapping between different optical elements, without the need for a zoom-axicon module.
    Type: Grant
    Filed: June 19, 2003
    Date of Patent: December 21, 2004
    Assignee: ASML Netherlands B.V.
    Inventors: Markus F Eurlings, Jan J Krikke
  • Patent number: 6826451
    Abstract: A lithography tool includes an exposure chamber and a reticle handler that exchanges a reticle being exposed as prescribed by the user of the lithography tool. The reticle handler can include a vacuum-compatible robot, a vacuum chamber to house the robot, a load-lock to input reticles and transition them from atmospheric pressure to vacuum, a processing station for processing the reticle, and a reticle library for storing at least one extra reticle so that it is quickly available for exchange during an exposure process. The robot can have a two or more handed gripper to simultaneously hold multiple reticles. This allows a first reticle to be removed from the reticle stage with a first hand and a second reticle to be loaded onto the reticle stage with a second hand, and so on, which minimizes exchange time.
    Type: Grant
    Filed: August 22, 2002
    Date of Patent: November 30, 2004
    Assignee: ASML Holding N.V.
    Inventors: Santiago del Puerto, Markus F. A. Eurlings
  • Publication number: 20040019408
    Abstract: A lithography tool includes an exposure chamber and a reticle handler that exchanges a reticle being exposed as prescribed by the user of the lithography tool. The reticle handler can include a vacuum-compatible robot, a vacuum chamber to house the robot, a load-lock to input reticles and transition them from atmospheric pressure to vacuum, a processing station for processing the reticle, and a reticle library for storing at least one extra reticle so that it is quickly available for exchange during an exposure process. The robot can have a two or more handed gripper to simultaneously hold multiple reticles. This allows a first reticle to be removed from the reticle stage with a first hand and a second reticle to be loaded onto the reticle stage with a second hand, and so on, which minimizes exchange time.
    Type: Application
    Filed: August 22, 2002
    Publication date: January 29, 2004
    Applicant: ASML US, Inc.
    Inventors: Santiago del Puerto, Markus F. A. Eurlings
  • Patent number: 6671035
    Abstract: An illuminator for controlling a beam of radiation for a lithographic projection apparatus includes a plurality of optical elements and an exchanger for inserting and removing the optical elements from the beam path. The intensity distribution of the beam at a pupil plane of the illuminator is determined by the optical elements. Different illumination settings (intensity distributions) can be obtained by the exchanger swapping between different optical elements, without the need for a zoom-axicon module.
    Type: Grant
    Filed: December 12, 2000
    Date of Patent: December 30, 2003
    Assignee: ASML Netherlands B.V.
    Inventors: Markus F Eurlings, Jan J Krikke
  • Publication number: 20030214643
    Abstract: An illuminator for controlling a beam of radiation for a lithographic projection apparatus comprises a plurality of optical elements and an exchanger for inserting and removing the optical elements from the beam path. The intensity distribution of the beam at a pupil plane of the illuminator is determined by the optical elements. Different illumination settings (intensity distributions) can be obtained by the exchanger swapping between different optical elements, without the need for a zoom-axicon module.
    Type: Application
    Filed: June 19, 2003
    Publication date: November 20, 2003
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Markus F. Eurlings, Jan J. Krikke