Abstract: Low-cost, semi-permanent rigid-wall modular Yurt-type, peaked-roof structures, polygonally “round” (in plan view), made of modular, light-weight, water-proof cellular extruded plastic sheet panels that are easily portable, quickly erectable and dismountable, having a wide variety of uses. The modular panels are easily die-cut from any water-resistant, non-metallic, rigid material, preferably an extruded plastic, such as a polyolefin polymer. Few panel configurations are needed to form all the structural elements. In addition, multiple similar modular structures may be grouped to form larger compound structures with individual ones of the Yurts being assigned to individual persons or dedicated work space usages: disaster shelters, sleeping, gathering, storage, hygiene, medical treatment, schooling, entertainment, goods manufacture, cooking, eating, herding, etc.

Abstract: A system and method for architecting design for test circuitry (e.g., scan architecting) within an integrated circuit design having subdesigns (e.g., modules). The novel system contains a default operational mode (no user specification) and an operational mode based on user specifications; within either mode, the system recognizes and allows definition of subdesign scan chains which can be linked together alone or with other scan elements to architect complex scan chains (e.g., top level scan chains). The system includes specification, analysis, synthesis and reporting processes which can be used in an IC design having a hierarchical structure including modules. The specification process accesses a design database and a script file and allows a user to define global scan properties (scan style, number of chains, etc.), properties of a particular scan chain (membership, name, etc.), test signals (scan-in, scan-out, scan-enable, etc.

Abstract: A system and method for architecting design for test circuitry (e.g., scan architecting) within an integrated circuit design having subdesigns (e.g., modules). The novel system contains a default operational mode (no user specification) and an operational mode based on user specifications; within either mode, the system recognizes and allows definition of subdesign scan chains which can be linked together alone or with other scan elements to architect complex scan chains (e.g., top level scan chains). The system includes specification, analysis, synthesis and reporting processes which can be used in an IC design having a hierarchical structure including modules. The specification process accesses a design database and a script file and allows a user to define global scan properties (scan style, number of chains, etc.), properties of a particular scan chain (membership, name, etc.), test signals (scan-in, scan-out, scan-enable, etc.