Patents by Inventor Markus Hertel

Markus Hertel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for increasing the interference resistance of a time frame reflectometer and a circuit device of implementing said method
    Patent number: 7145349
    Abstract: The invention relates to methods and a circuit for increasing the interference resistance of a time frame reflectometer, in particular with respect to high frequency irradiation. A transmitted pulse (XS) is generated at a pulse repeater frequency (fprf) and coupled to a wave guide (4). A return signal (Xprobe) is returned to the wavwguide (4) by a reflector (14) which is connected to said waveguide (4) and is scanned for time-expanded representation as a reflection profile with scan pulses (XA) which are repeated at a scan frequency (fA) and measurement values are continuously calculated from said reflection profiles, expressing the distance from the reflector (14) to the process connection.
    Type: Grant
    Filed: October 15, 2000
    Date of Patent: December 5, 2006
    Assignee: Endress + Hauser GmbH + Co. KG
    Inventors: Stefan Cramer, Markus Hertel, Bernd Krieger