Patents by Inventor Markus Raschke

Markus Raschke has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High frequency deflection measurement of IR absorption
    Patent number: 8869602
    Abstract: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface by using the AFM probe to detect wavelength dependent IR radiation interaction, typically absorption with the sample in the region of the tip. The tip may be configured to produce electric field enhancement when illuminated by a radiation source. This enhancement allows for significantly reduced illumination power levels resulting in improved spatial resolution by confining the sample-radiation interaction to the region of field enhancement which is highly localized to the tip.
    Type: Grant
    Filed: November 30, 2011
    Date of Patent: October 28, 2014
    Assignee: Anasys Instruments Corp.
    Inventors: Mikhail Belkin, Feng Lu, Vladislav V. Yakolev, Craig Prater, Kevin Kjoller, Markus Raschke