Abstract: A device and process for positioning individual particles on a substrate is proposed. The device is equipped with at least one particle source which isolates particles of a defined material, with a focusing unit with an entry window facing the particle source and an exit window facing away from the particle source, with a substrate holder to hold the substrate, wherein the focusing unit guides the particles entering through its entry window into defined positions on the substrate, with at least one deflection unit arranged between the particle source and the focusing unit with an entry window facing the particle source and an exit window on the deflector unit facing away from the particle source, wherein the deflector unit preconditions the particles entering through its entry window before they reach the focusing unit.

Abstract: A device and process for positioning individual particles on a substrate is proposed. The device is equipped with at least one particle source which isolates particles of a defined material, with a focusing unit with an entry window facing the particle source and an exit window facing away from the particle source, with a substrate holder to hold the substrate, wherein the focusing unit guides the particles entering through its entry window into defined positions on the substrate, with at least one deflection unit arranged between the particle source and the focusing unit with an entry window facing the particle source and an exit window on the deflector unit facing away from the particle source, wherein the deflector unit preconditions the particles entering through its entry window before they reach the focusing unit.

Abstract: An X-ray image converter (2) for recording and evaluating information gained from X-ray investigations of persons (3), animals or objects is suggested, which comprises a carrier (4) of a material in which the impinging X-ray radiation causes detectable changes, as well as a method for recording X-ray images, wherein changes in charge carriers on the surface of a carrier (4) are determined for evaluation of the radiation from the object (3) being observed.