Abstract: A method for testing a signal path of a first IC formed as a monolithically integrated circuit on a semiconductor body together with a magnetic field sensor and has a signal output and a power supply connection and a test mode state and a normal operating state. A power supply of the first IC is switched off, and a signal output is connected with a reference potential, and the power supply of the first IC is switched on and the signal output is disconnected from the reference potential. Subsequently in a test mode state, a self-test is performed in the first IC and a test pattern is configured at the signal output or at the power supply connection and the test pattern is evaluated by the control unit for testing of the signal path.

Abstract: A method for testing a signal path of a first IC formed as a monolithically integrated circuit on a semiconductor body together with a magnetic field sensor and has a signal output and a power supply connection and a test mode state and a normal operating state. A power supply of the first IC is switched off, and a signal output is connected with a reference potential, and the power supply of the first IC is switched on and the signal output is disconnected from the reference potential. Subsequently in a test mode state, a self-test is performed in the first IC and a test pattern is configured at the signal output or at the power supply connection and the test pattern is evaluated by the control unit for testing of the signal path.

Abstract: A circuit arrangement is described for detecting the capacitance or change of capacitance of a capacitive circuit element or of a component, specifically of a sensor capacitor (1), with a control unit (2) ,with a monostable multivibrator (3) triggered by the control unit (2), and with an evaluation unit (4), the monostable multivibrator (3) having a first input (5) which is connected to the control unit (2), a second input (6)which is connected to the sensor capacitor (1), and one output (7), of the monostable multivibrator (3) is triggered by the control unit (2) at the output (7) of the monostable multivibrator (3) an output signal or output signals appearing, with a time duration which is proportional to the capacitance of the sensor capacitor (1), the output signal or output signals of the monostable multivibrator (3)being converted into a signal voltage proportional to its or their duration, and in the evaluation unit (4) a detection value corresponding to the capacitance or change of capacitance of the

Abstract: Circuit arrangement for detecting the capacitance or capacitance change of a capacitive circuit element, has a control unit, a monostable multivibrator triggered by the control unit, and an evaluation unit. The monostable multivibrator has an input connected to the control unit, a second input connected to the sensor capacitor, and an output. When the monostable multivibrator is triggered by the control unit, an output signal appears at the output of the monostable multivibrator having a time duration proportional to the capacitance of the sensor capacitor, and is converted into a signal voltage proportional to signal duration from which a detection value corresponding to the capacitance or change of capacitance is obtained in the evaluation unit. The output of the monostable multivibrator is to a constant current generator that is controlled by its output signal and an integrator that converts the current from the constant current generator into the signal voltage.