Patents by Inventor Markus WENZEIS

Markus WENZEIS has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230220554
    Abstract: Polycrystalline silicon is produced in a chemical vapour deposition reactor, wherein, outside the reactor at at least one position on at least one reactor component, vibrations of the reactor are measured using a measurement device and optionally recorded. The vibrations may be used to identify rod fall over and other events occurring within the reactor.
    Type: Application
    Filed: March 14, 2023
    Publication date: July 13, 2023
    Applicant: WACKER CHEMIE AG
    Inventor: Markus WENZEIS
  • Patent number: 11655541
    Abstract: Polycrystalline silicon is produced in a chemical vapour deposition reactor, wherein, outside the reactor at at least one position on at least one reactor component, vibrations of the reactor are measured using a measurement device and optionally recorded. The vibrations may be used to identify rod fall over and other events occurring within the reactor.
    Type: Grant
    Filed: December 17, 2018
    Date of Patent: May 23, 2023
    Assignee: WACKER CHEMIE AG
    Inventor: Markus Wenzeis
  • Publication number: 20230011307
    Abstract: A method for producing and classifying polycrystalline silicon. The method includes producing polycrystalline silicon rod within a reaction space of a gas phase deposition reactor by introducing a reaction gas, which in addition to hydrogen contains silane and/or at least one halosilane. Once produced, the polycrystalline silicon rod is extracted from the reactor, and at least one two-dimensional and/or three-dimensional image is generated of at least one partial region of the polycrystalline silicon rod or of at least one silicon chunk created. At least one analysis region is selected per generated image and at least two surface-structure indices per analysis region are generated by using image processing methods, each of which is generated using a different image processing method. The surface-structure indices are combined to form a morphology index.
    Type: Application
    Filed: December 17, 2019
    Publication date: January 12, 2023
    Applicant: Wacker Chemie AG
    Inventors: Thomas Schröck, Markus WENZEIS
  • Patent number: 11515184
    Abstract: Siemens process rod growth is controlled by measuring rod diameter by a measuring system A and measuring rod temperature by a measuring system B, the two measuring systems located at different positions outside the reactor.
    Type: Grant
    Filed: December 5, 2017
    Date of Patent: November 29, 2022
    Assignee: WACKER CHEMIE AG
    Inventors: Olaf Seifarth, Stefan Sommerauer, Markus Wenzeis
  • Publication number: 20220274839
    Abstract: A process for producing polycrystalline silicon and a gas phase deposition chamber for the same. The process includes introducing a reaction gas containing an amount of silane and/or an amount of at least one halosilane as well as an amount of hydrogen into a reaction space of a gas phase deposition reactor. The reaction space includes at least one heated support body upon which by deposition silicon is deposited to form the polycrystalline silicon. For the detection of dust depositions, at least one measuring apparatus is used to determine the amount of haze inside the reaction space during deposition.
    Type: Application
    Filed: July 16, 2019
    Publication date: September 1, 2022
    Applicant: Wacker Chemie AG
    Inventors: Jürgen Wolff, Markus Wenzeis
  • Publication number: 20220234900
    Abstract: A method for producing polycrystalline silicon includes introducing a reaction gas, which in addition to hydrogen contains silane and/or at least one halosilane, into a reaction space of a gas phase deposition reactor. The reaction space includes at least one heated filament rod upon which by deposition silicon is deposited to form a polycrystalline silicon rod. During the deposition, the the morphology of the silicon rod is determined.
    Type: Application
    Filed: June 11, 2019
    Publication date: July 28, 2022
    Applicant: Wacker Chemie AG
    Inventors: Markus Wenzeis, Piotr Filar, Thomas Schröck
  • Publication number: 20220010434
    Abstract: Polycrystalline silicon is produced in a chemical vapour deposition reactor, wherein, outside the reactor at at least one position on at least one reactor component, vibrations of the reactor are measured using a measurement device and optionally recorded. The vibrations may be used to identify rod fall over and other events occurring within the reactor.
    Type: Application
    Filed: December 17, 2018
    Publication date: January 13, 2022
    Applicant: WACKER CHEMIE AG
    Inventor: Markus WENZEIS
  • Publication number: 20200373177
    Abstract: Siemens process rod growth is controlled by measuring rod diameter by a measuring system A and measuring rod temperature by a measuring system B, the two measuring systems located at different positions outside the reactor.
    Type: Application
    Filed: December 5, 2017
    Publication date: November 26, 2020
    Applicant: WACKER CHEMIE AG
    Inventors: Olaf SEIFARTH, Stefan SOMMERAUER, Markus WENZEIS