Abstract: A method is used for determining a status of an encapsulation and/or a passivation layer of the encapsulation. The encapsulation forms a multi-layer system from multiple passivation layers arranged on top of one another and electrically contacted intermediate layers arranged between the passivation layers. The multi-layer system protects an implant surrounded by the encapsulation. In the method, an electrical measurement is carried out between a reference potential and at least one electrically contacted intermediate layer, and at least one current flowing between the reference potential and the at least one electrically contacted intermediate layer is detected. The at least one detected current is compared with at least one pre-determined threshold value. If the detected current falls below or exceeds the at least one threshold value, this indicates a functional state of a passivation layer adjacent to the at least one electrically contacted intermediate layer.

Abstract: In a method for isolating a passivation, an isolating wall is arranged along the circumference of at least one opening created in a predetermined way in the passivation. A resultant passivation system has an electrically and/or fluid-tightly and/or gas-tightly isolating wall along the circumference of at least the opening created in a predetermined way in the passivation. The isolating wall of a predetermined thickness along a circumference of an opening produced in a predetermined way in a passivation of a medical implant advantageously provides an isolation of the passivation or components of the same with respect to electricity and/or liquid acting on the passivation or the components of the same from the opening.

Abstract: A method is used for determining a status of an encapsulation and/or a passivation layer of the encapsulation. The encapsulation forms a multi-layer system from multiple passivation layers arranged on top of one another and electrically contacted intermediate layers arranged between the passivation layers. The multi-layer system protects an implant surrounded by the encapsulation. In the method, an electrical measurement is carried out between a reference potential and at least one electrically contacted intermediate layer, and at least one current flowing between the reference potential and the at least one electrically contacted intermediate layer is detected. The at least one detected current is compared with at least one pre-determined threshold value. If the detected current falls below or exceeds the at least one threshold value, this indicates a functional state of a passivation layer adjacent to the at least one electrically contacted intermediate layer.