Patents by Inventor Marlene Isabel Almonte

Marlene Isabel Almonte has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electrical method for assessing yield-limiting asperities in silicon-on-insulator wafers
    Patent number: 6528335
    Abstract: An electrical method is described for determining the presence of certain defects in the buried oxide of silicon-on-insulator wafers which cause electrical breakdown at voltages low enough to cause failure during circuit processing. The method consists of carrying out current-voltage measurements on gold/silicon/buried oxide/substrate devices isolated by selective etching and analyzing the current-voltage behavior in terms of short circuit defect densities, low voltage breakdown defects, and excess current leakage defects. An additional method for detecting the low voltage breakdown defects is to monitor light flashes which accompany the breakdown.
    Type: Grant
    Filed: February 14, 2001
    Date of Patent: March 4, 2003
    Assignee: International Business Machines Corporation
    Inventors: Marlene Isabel Almonte, Harold John Hovel, Richard Leo Kleinhenz
  • Electrical method for assessing yield-limiting asperities in silicon-on-insulator wafers
    Publication number: 20020109521
    Abstract: An electrical method is described for determining the presence of certain defects in the buried oxide of silicon-on-insulator wafers which cause electrical breakdown at voltages low enough to cause failure during circuit processing. The method consists of carrying out current-voltage measurements on gold/silicon/buried oxide/substrate devices isolated by selective etching and analyzing the current-voltage behavior in terms of short circuit defect densities, low voltage breakdown defects, and excess current leakage defects. An additional method for detecting the low voltage breakdown defects is to monitor light flashes which accompany the breakdown.
    Type: Application
    Filed: February 14, 2001
    Publication date: August 15, 2002
    Applicant: International Business Machines Corporation
    Inventors: Marlene Isabel Almonte, Harold John Hovel, Richard Leo Kleinhenz