Patents by Inventor Marlon D. Bada

Marlon D. Bada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing of device sensors on a manufacturing line
    Patent number: 10677618
    Abstract: Embodiments of the present disclosure provide techniques for sensor testing for computing devices during initial movement of the device, such as movement on a manufacturing line. In one instance, a device with integral sensor testing during initial movement of the device may include a plurality of sensors and a sensor test block coupled with the plurality of sensors, to detect, collect and/or report readings provided by at least some of the sensors in response to movement of the device between at least a first test station and a second test station. Other embodiments may be described and/or claimed.
    Type: Grant
    Filed: March 4, 2016
    Date of Patent: June 9, 2020
    Assignee: Intel Corporation
    Inventors: Yael Yanai, Yehiel Shilo, Eli Kupermann, Chen-Hsun Wu, Elena Agranovsky, Marlon D. Bada
  • TESTING OF DEVICE SENSORS ON A MANUFACTURING LINE
    Publication number: 20170254683
    Abstract: Embodiments of the present disclosure provide techniques for sensor testing for computing devices during initial movement of the device, such as movement on a manufacturing line. In one instance, a device with integral sensor testing during initial movement of the device may include a plurality of sensors and a sensor test block coupled with the plurality of sensors, to detect, collect and/or report readings provided by at least some of the sensors in response to movement of the device between at least a first test station and a second test station. Other embodiments may be described and/or claimed.
    Type: Application
    Filed: March 4, 2016
    Publication date: September 7, 2017
    Inventors: Yael Yanai, Yehiel Shilo, Eli Kupermann, Chen-Hsun Wu, Elena Agranovsky, Marlon D. Bada