Patents by Inventor Martin A. Josefowicz

Martin A. Josefowicz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11776109
    Abstract: A layer thickness measurement system includes a support to hold a substrate, an optical sensor to capture a color image of at least a portion of the substrate, and a controller. The controller is configured to receive the color image from the optical sensor, perform a color correction on the color image to generate an adjusted color image having increased color contrast, determine a coordinate of the pixel in a coordinate space of at least two dimensions including a first color channel and a second color channel from color data in the adjusted color image for each of the adjusted color image, and calculate a value representative of a thickness based on the coordinate of the pixel of the adjusted color image in the coordinate space.
    Type: Grant
    Filed: July 29, 2021
    Date of Patent: October 3, 2023
    Assignee: Applied Materials, Inc.
    Inventors: Nojan Motamedi, Dominic J. Benvegnu, Boguslaw A. Swedek, Martin A. Josefowicz
  • Publication number: 20210358113
    Abstract: A layer thickness measurement system includes a support to hold a substrate, an optical sensor to capture a color image of at least a portion of the substrate, and a controller. The controller is configured to receive the color image from the optical sensor, perform a color correction on the color image to generate an adjusted color image having increased color contrast, determine a coordinate of the pixel in a coordinate space of at least two dimensions including a first color channel and a second color channel from color data in the adjusted color image for each of the adjusted color image, and calculate a value representative of a thickness based on the coordinate of the pixel of the adjusted color image in the coordinate space.
    Type: Application
    Filed: July 29, 2021
    Publication date: November 18, 2021
    Inventors: Nojan Motamedi, Dominic J. Benvegnu, Boguslaw A. Swedek, Martin A. Josefowicz
  • Patent number: 11100628
    Abstract: A layer thickness measurement system includes a support to hold a substrate, an optical sensor to capture a color image of at least a portion of the substrate, and a controller. The controller is configured to receive the color image from the optical sensor, store a function that provides a value representative of a thickness as a function of position along a predetermined path in a coordinate space of at least two dimensions including a first color channel and a second color channel, for a pixel of the color image determine a coordinate of the pixel in the coordinate space from color data in the color image, determine a position of a point on the predetermined path that is closest to the coordinate, and calculate a value representative of a thickness from the function and the position of the point on the predetermined path.
    Type: Grant
    Filed: May 16, 2019
    Date of Patent: August 24, 2021
    Assignee: Applied Materials, Inc.
    Inventors: Nojan Motamedi, Dominic J. Benvegnu, Boguslaw A. Swedek, Martin A. Josefowicz
  • Publication number: 20200258214
    Abstract: A layer thickness measurement system includes a support to hold a substrate, an optical sensor to capture a color image of at least a portion of the substrate, and a controller. The controller is configured to receive the color image from the optical sensor, store a function that provides a value representative of a thickness as a function of position along a predetermined path in a coordinate space of at least two dimensions including a first color channel and a second color channel, for a pixel of the color image determine a coordinate of the pixel in the coordinate space from color data in the color image, determine a position of a point on the predetermined path that is closest to the coordinate, and calculate a value representative of a thickness from the function and the position of the point on the predetermined path.
    Type: Application
    Filed: May 16, 2019
    Publication date: August 13, 2020
    Inventors: Nojan Motamedi, Dominic J. Benvegnu, Boguslaw A. Swedek, Martin A. Josefowicz