Patents by Inventor Martin C. Shipley

Martin C. Shipley has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Regression test modules for detecting and reporting changes in process design kits
    Patent number: 8271232
    Abstract: A method for detecting and reporting changes in functional features of a simulation model caused by a software revision is disclosed. In one aspect, the method is independent of simulation model architecture. One performs regression testing with a plurality of feature-specific modules. The feature-specific modules are configured to generate a first set of information with the simulation model and compare the first set of information to a second set of corresponding information from the simulation model. In the above-described testing, the first set of information postdates the software revision and the second set of information predates the software revision.
    Type: Grant
    Filed: August 18, 2010
    Date of Patent: September 18, 2012
    Assignees: Cadence Design Systems, Inc., Avago Technologies General IP (Singapore) Pte. Ltd.
    Inventors: James M. Roucis, Robert Chizmadia, Douglas L. Anneser, Martin C. Shipley, Thomas E. Mitchell, Martha Johnson, Andrew M. Weilert
  • Regression test modules for detecting and reporting changes in process design kits
    Patent number: 7801699
    Abstract: A method for detecting and reporting changes in functional features of a simulation model caused by a software revision is disclosed. In one aspect, the method is independent of simulation model architecture. One performs regression testing with a plurality of feature-specific modules. The feature-specific modules are configured to generate a first set of information with the simulation model and compare the first set of information to a second set of corresponding information from the simulation model. In the above-described testing, the first set of information postdates the software revision and the second set of information predates the software revision.
    Type: Grant
    Filed: April 10, 2006
    Date of Patent: September 21, 2010
    Assignees: Cadence Design Systems, Inc., Avago Technologies General IP (Singapore) Pte. Ltd.
    Inventors: James M. Roucis, Robert Chizmadia, Douglas L. Anneser, Martin C. Shipley, Thomas E. Mitchell, Martha Johnson, Andrew M. Weilert
  • Image-based inspection system including positioning compensation for non-planar targets
    Patent number: 6628746
    Abstract: A image-based system for inspecting objects utilizes an imaging chain that defines a focal plane, a manipulator for translating and rotating either the object under inspection or the imaging chain, a surface mapping system that generates a representation of the surface of the object under inspection, and a controller that uses the representation of the surface of the object to control the manipulator so that a portion of the object under inspection lies within the focal plane of the imaging chain.
    Type: Grant
    Filed: October 30, 2001
    Date of Patent: September 30, 2003
    Assignee: Agilent Technologies, Inc.
    Inventors: Barry Eppler, Ronald K Kerschner, Martin C. Shipley
  • Image-based inspection system including positioning compensation for non-planar targets
    Publication number: 20030081717
    Abstract: A image-based system for inspecting objects utilizes an imaging chain that defines a focal plane, a manipulator for translating and rotating either the object under inspection or the imaging chain, a surface mapping system that generates a representation of the surface of the object under inspection, and a controller that uses the representation of the surface of the object to control the manipulator so that a portion of the object under inspection lies within the focal plane of the imaging chain.
    Type: Application
    Filed: October 30, 2001
    Publication date: May 1, 2003
    Inventors: Barry Eppler, Ronald K. Kerschner, Martin C. Shipley