Patents by Inventor Martin D. Leibowitz

Martin D. Leibowitz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • PICA system detector calibration
    Patent number: 7113630
    Abstract: Methods, apparatus and data structures useful in correcting PICA image data are described. An exemplary method comprises acquiring optical image data of a target having identifiable optical-image features, acquiring PICA image data of the target having identifiable PICA-image features corresponding to the optical-image features, matching PICA-image features with corresponding optical-image features, and calculating from matched PICA-image features and optical-image features a set of coefficients defining relationships between observed positions of PICA-image features and optical-image features. Corrections are applied to the observed positions of detected photons based on the coefficients. The coefficients may provide a local correction using a bilinear relationship giving the transformation of a rectangle formed by four features of the PICA-image data to fit a corresponding rectangle in the optical-image data.
    Type: Grant
    Filed: February 19, 2002
    Date of Patent: September 26, 2006
    Assignee: Credence Systems Corporation
    Inventors: Girish Dajee, Patricia Le Coupanec, Martin D. Leibowitz
  • PICA system detector calibration
    Publication number: 20030156750
    Abstract: Methods, apparatus and data structures useful in correcting PICA image data are described. An exemplary method comprises acquiring optical image data of a target having identifiable optical-image features, acquiring PICA image data of the target having identifiable PICA-image features corresponding to the optical-image features, matching PICA-image features with corresponding optical-image features, and calculating from matched PICA-image features and optical-image features a set of coefficients defining relationships between observed positions of PICA-image features and optical-image features. Corrections are applied to the observed positions of detected photons based on the coefficients. The coefficients may provide a local correction using a bilinear relationship giving the transformation of a rectangle formed by four features of the PICA-image data to fit a corresponding rectangle in the optical-image data.
    Type: Application
    Filed: February 19, 2002
    Publication date: August 21, 2003
    Inventors: Girish Dajee, Patricia Le Coupanec, Martin D. Leibowitz