Abstract: A method is provided that includes the steps of i) providing a specimen in the form of a wafer having a measurement area and a reference area, assumed to be without deformations and coplanar with the measurement area; ii) illuminating one face of the specimen with an electron beam (Fin); iii) superposing a beam (F1B) of radiation diffracted by the measurement area (B) with a beam (F1A) of the radiation diffracted by the reference so as to cause these two beams to interfere; iv) measuring the spatial periodicity and the orientation of the fringes of the interference pattern (FI); and v) deducing from this a difference in the lattice parameter and/or the orientation between the reference and measurement areas, which is indicative of a state of deformation of the latter at the nanoscale. A device and system for implementing the method is also provided.

Abstract: A hydridable alloy of formula R1-x-yMgxMyNis-aBa wherein R is selected from the group consisting in rare earths, yttrium and a mixture thereof; M represents Zr and/or Ti; B is selected from the group consisting in Mn, Al, Co, Fe and a mixture thereof; 0.1<x<0.4; 0?y<0.1; 3<s<4.5 and 0?a<1; at least 5% of the volume of which consists of a stack of sequences of a pattern of the A2B4 type and of n patterns of the CaCu5 type randomly distributed along one direction, n being an integer comprised between 1 and 10 and representing the number of patterns of the CaCu5 type per pattern of the A2B4 type. A method for making a hydridable alloy comprising steps for compression and applying a current through a mixture comprising Mg2Ni and a compound comprising nickel and one or several elements selected from the group consisting in rare earths and yttrium.

Abstract: A method for measuring nanoscale deformations in a portion (B) of a crystal specimen, comprising steps consisting in: i) preparing a specimen in the form of a wafer comprising a measurement area (B) and a reference area (A), assumed to be without deformations and coplanar with the measurement area; ii) illuminating one face of said specimen with an electron beam (Fin); iii) superposing a beam (F1B) of radiation diffracted by the measurement area (B) with a beam (F1A) of the radiation diffracted by the reference area (A) so as to cause these two beams to interfere; iv) measuring the spatial periodicity and the orientation of the fringes of the interference pattern (FI); and v) deducing from this a difference in the lattice parameter and/or the orientation between said reference and measurement areas, which is indicative of a state of deformation of the latter at the nanoscale. A device and system for implementing such a method.