Patents by Inventor Martin J. Walter

Martin J. Walter has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Reflection technique for thermal mapping of semiconductors
    Patent number: 4841150
    Abstract: Semiconductors may be optically tested for their temperatures by illuminating them with tunable monochromatic electromagnetic radiation and observing the light reflected off of them. A transition point will occur when the wavelength of the light corresponds with the actual band gap energy of the semiconductor. At the transition point, the image of the semiconductor will appreciably darken as the light is transmitted through it, rather than being reflected off of it. The wavelength of the light at the transition point corresponds to the actual band gap energy and the actual temperature of the semiconductor.
    Type: Grant
    Filed: December 28, 1987
    Date of Patent: June 20, 1989
    Assignee: The United States of America as represented by the Secretary of the Air Force
    Inventor: Martin J. Walter