Abstract: This invention relates to a method of dispersing magnetic particles, said method comprising or consisting of: (a) in a vessel, combining at least one permanent magnet and said magnetic particles in a liquid phase; and (b) triggering a fluctuating or oscillating motion of said permanent magnet using a magnetic field; thereby dispersing said particles.

Abstract: This invention provides a method of cleaving at least one covalent bond in at least one molecule, wherein said method comprises (a) colliding at least one magnetic body with said at least one molecule; and/or (b) triggering collision of at least one nonmagnetic particle with said at least one molecule by moving said at least one magnetic body.

Abstract: The present invention provides a method of preparing a sample for an analytic procedure, said sample comprising at least one protein, polypeptide or peptide molecule, and said method comprising fragmenting said molecule using at least one moving magnetic body.

Abstract: A measuring method and device for characterizing a semiconductor component (1) having a pn junction and a measuring surface, which has a contacting subarea, covered by a metallization. The method including: A. Planar application of electromagnetic excitation radiation onto the measuring area of the semiconductor component (1) for separating charge carrier pairs in the semiconductor component (1), and B. spatially resolved measurement of electromagnetic radiation originating from the semiconductor component (1) using a detection unit. In one step A, a predetermined excitation subarea of the measuring surface has a predetermined intensity of the excitation radiation and at least one sink subarea of the measuring surface has an intensity of the excitation radiation which is less than the intensity applied to the excitation subarea. The excitation and sink subareas are disposed on opposite sides of said contacting subarea and adjoin it and/or entirely or partially overlap it.

Abstract: A method for monitoring a production line, in which objects are conveyed over conveyance paths between machines, whereby digital images of the production line are created, is characterized by the steps of (a) generating a reference image sequence, such that it images at least one area of a conveyance path to be monitored between machines, (b) determining the speed or acceleration of an object or a quantity derived therefrom for the reference image sequence, (c) generating a test image sequence, which images the same area of a conveyance path between the machines, (d) determining the speed or acceleration of an object or a quantity derived therefrom for the test image sequence, and (e) comparing the speed or acceleration determined for the test image sequence or a quantity derived therefrom with the corresponding quantity determined for the reference image sequence.

Abstract: A measuring method for characterizing a semiconductor component (1) having at least one pn junction and a measuring surface, which is the front and/or rear of the semiconductor component and which has at least one contacting subarea, which is covered by a metallization or is intended for coverage by a metallization, The method includes the following steps: A. Planar application of electromagnetic excitation radiation onto the measuring area of the semiconductor component (1) for separating charge carrier pairs in the semiconductor component (1), and B. spatially resolved measurement of electromagnetic radiation originating from the semiconductor component (1) using at least one detection unit.