Abstract: The invention relates to an x-ray source (100; 100a; 100b; 100c), comprising an electron source (110) for providing electrons (e) in the form of an electron beam (es) and a target element (120), on which the electrons (e) of the electron beam (es) of the electron source (110) are able to impinge, and at least one deflection device (140) enabling the electron beam (es) to be deflected from a propagation direction produced by the electron source (110), wherein the at least one deflection device (140) is configured to deflect the electron beam (es) at least intermittently with a trajectory (180) incident on the target element (120), but outside a center of the target element (120) or a region (150) of the target element (120) on which the electron beam (es) is incident in the case of a propagation direction without deflection, or wherein the at least one deflection device (140) is configured to deflect the electron beam (es) at least intermittently in such a way that the electron beam (es) is not incident on the

Abstract: A measurement object is placed on a region of a measuring table, and an overview image of the region of the measuring table is captured by an optical device. A type of the measurement object is determined from the overview image or from an identifier on the measurement object or an identifier positioned adjacently thereto. The position and/or the alignment of the measurement object on the measurement table is determined from the overview image. At least one measurement location of the measurement object is positioned in a measurement point of an X-ray fluorescence device and at least one measured value is determined from the at least one measurement location of the measurement object. The at least one measured value is compared with a setpoint value stored in a data processing device and a measurement result for the at least one measurement location of the measurement object is output.

Abstract: A method of measuring the AM/PM conversion of a device under test having a local oscillator is described. A device under test with an embedded local oscillator is provided. A signal source is connected to an input of the device under test. A receiver is connected to an output of the device under test. An input signal is provided by the signal source. The input signal has an initial power level. The input signal is input to the device under test. The power level of the input signal is changed. An output signal of the device under test is measured at different power levels of the input signal.

Abstract: A vector network analyzer for obtaining at least one wave frequency ratio with respect to a frequency-converting device under test is provided. The vector network analyzer comprises a transmitter side configured to be controlled by at least one transmitter side clock signal, a receiver side configured to be controlled by at least one receiver side clock signal, and a central clock configured to generate a central clock signal. The at least one transmitter side clock signal and the at least one receiver side clock signal are based on the central clock signal, the at least one transmitter side clock signal and the at least one receiver side clock signal are generated with a fixed phase relation to each other with the aid of a start pulse.

Abstract: A method of measuring the AM/PM conversion of a device under test having a local oscillator is described. A device under test with an embedded local oscillator is provided. A signal source is connected to an input of the device under test. A receiver is connected to an output of the device under test. An input signal is provided by the signal source. The input signal has an initial power level. The input signal is input to the device under test. The power level of the input signal is changed. An output signal of the device under test is measured at different power levels of the input signal.

Abstract: A measurement apparatus (1) comprising a high frequency measurement unit (2) adapted to measure high frequency parameters (HFP) of a device under test (DUT) connected to ports of said measurement apparatus (1) and a multimeter unit (3) adapted to measure DC characteristics parameters (DCP) of said device under test (DUT) connected via control signal lines (CL) to a control bus interface (6) of said measurement apparatus (1).

Abstract: A measuring device comprising a microwave transmitter, a microwave receiver, at least one antenna, and a control device. The control device controls the microwave transmitter and the microwave receiver.

Abstract: A test device for testing an electronic device under test comprises a remote measurement module configured to capture signals originating from the electronic device under test and output the captured signals, and an analysis device configured to receive the captured signals and to calibrate the test device based on test signals provided by the analysis device and the captured signals.

Abstract: A network analyzer system includes a network analyzer having at least two ports, a first operational device connected a first port of the at least two ports of the network analyzer and configured to perform a first task with the network analyzer, and a second operational device connected a second port of the at least two ports of the network analyzer and configured to perform a second task with the network analyzer. The second task is performed at least partially concurrently with the first task.

Abstract: A method for measuring group delay on a device under test is described, wherein a test signal with a carrier frequency is generated. An amplitude modulation is applied to said test signal in order to generate at least two group delay signals having frequencies that are symmetrical to the frequency of said test signal. At least said group delay signals are provided to said device under test. Further, a measurement device and a measurement system are described.

Abstract: A measuring device comprises a microwave transmitter, a microwave receiver, at least one antenna, a control device and a dielectric extension. The dielectric extension is disposed between the antenna and an object to be investigated. The control device controls the microwave transmitter and the microwave receiver. The microwave transmitter transmits a microwave signal by means of the antenna and the dielectric extension into the object to be investigated. The object to be investigated scatters the microwave signal. The microwave receiver receives the scattered microwave signal by means of the antenna and the dielectric extension. The length and the dielectric constant of the dielectric extension in this context are dimensioned in such a manner that the object to be investigated is disposed in the remote field of the antenna.

Abstract: A measurement device comprising a measurement unit adapted to measure a transmission characteristic for providing an eye pattern; and a conversion unit adapted to convert automatically the eye pattern into a character separated values, CSV, file.

Abstract: A measurement accessory device connectable to a measurement apparatus or to a device under test wherein the measurement accessory device comprises means for providing characteristic data of said measurement accessory device in machine readable form used by said measurement apparatus during measurement of said device under test.

Abstract: A method and a system for determining system errors and power values for the calibration of a network analyzer (2) containing several test ports (11, . . . , 1i, 1j, . . . , 1n) connects the individual test ports (11, . . . , 1i, 1j, . . . , 1n) in each case sequentially to a short calibration standard (3), to an open calibration standard (4) and to a power detector (5), and measures a signal reflected from the short calibration standard (3), from the open calibration standard (4) and from the power detector (5) in the case of an excitation of the respective test port with a measured excitation signal. Following this, system errors for every test port (11, . . . , 1i, 1j, . . . , 1n) are determined from the respectively measured excitation signal and the respectively measured reflected signals, and, finally, the power value of the excitation signal is measured at least at one test port (11, . . . , 1i, 1j, . . . , 1n) by the power detector (5) connected in each case to this test port (11, . . . , 1i, 1j, . .

Abstract: A comb signal generator is provided. The comb signal generator includes a signal generator, which is adapted to successively generate a plurality of continuous wave signals. The comb signal generator is adapted to successively generate a comb signal from each continuous wave signal of the plurality of continuous wave signals, wherein each of the comb signals has a comb signal bandwidth. The comb signal generator is further adapted to successively generate the comb signals so as to cover a comb signal bandwidth range.

Abstract: A vector network analyzer for obtaining at least one wave frequency ratio with respect to a frequency-converting device under test is provided. The vector network analyzer comprises a transmitter side configured to be controlled by at least one transmitter side clock signal, a receiver side configured to be controlled by at least one receiver side clock signal, and a central clock configured to generate a central clock signal. The at least one transmitter side clock signal and the at least one receiver side clock signal are based on the central clock signal, the at least one transmitter side clock signal and the at least one receiver side clock signal are generated with a fixed phase relation to each other with the aid of a start pulse.

Abstract: A vector network analyzer for obtaining at least one wave frequency ratio with respect to a frequency-converting device under test is provided. The vector network analyzer comprises a transmitter side configured to be controlled by at least one transmitter side clock signal, a receiver side configured to be controlled by at least one receiver side clock signal, and a central clock configured to generate a central clock signal. The at least one transmitter side clock signal and the at least one receiver side clock signal are based on the central clock signal, the at least one transmitter side clock signal and the at least one receiver side clock signal are generated with a fixed phase relation to each other with the aid of a start pulse.

Abstract: A comb signal generator is provided. The comb signal generator includes a signal generator, which is adapted to successively generate a plurality of continuous wave signals. The comb signal generator is adapted to successively generate a comb signal from each continuous wave signal of the plurality of continuous wave signals, wherein each of the comb signals has a comb signal bandwidth. The comb signal generator is further adapted to successively generate the comb signals so as to cover a comb signal bandwidth range.

Abstract: A test and measurement device for a device under test is described, the test and measurement device comprising a processing unit for providing data of a graphical user interface with several user interface screen portions and a display for displaying these screen portions generated by the processing unit. The processing unit is configured to provide a first user interface screen portion, a second user interface screen portion, and a third user interface screen portion. The test and measurement device further comprises a controller, the controller being configured to perform a completely automated configuration of the test and measurement device in response to the inputs and selections of the user via the user interface screen portions. The controller is further configured to provide a proposed setup for interfacing the device under test with the test and measurement device. In addition, a test and measurement system and a method for testing a device under test are described.

Abstract: A method according to the present disclosure for the controlled connection of a calibration standard in an associated calibration module to a port to be calibrated of a network analyzer connects the port to be calibrated of the network analyzer to a high-frequency port of the calibration module. It transmits a high-frequency signal generated in the network analyzer with an information signalling the calibration standard to be used to the high-frequency port of the calibration module. Within the calibration module, the information signalling the calibration standard to be used is detected from the high-frequency signal received in the calibration module, and the calibration standard to be used is connected to the high-frequency port of the calibration module by a control unit integrated in the calibration module.