Patents by Inventor Martin Leibowitz

Martin Leibowitz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Spatial and temporal selective laser assisted fault localization
    Patent number: 6967491
    Abstract: A method and apparatus for laser-assisted fault mapping which synchronizes the laser control with the tester unit. The inventive method provides for laser-assisted pseudo-static fault mapping to localize defects in a device whose inputs are being stimulated dynamically by a tester. It further provides for laser-assisted dynamic soft error mapping, to localize in terms of location and to correlate with respect to a specific test vector, sensitive areas in a device by utilizing device performance criteria such as pass-fail status outputs. The apparatus includes a fully controllable dynamic laser stimulation apparatus connected to a control unit that provides complete synchronization with a tester unit.
    Type: Grant
    Filed: July 9, 2004
    Date of Patent: November 22, 2005
    Assignee: Credence Systems Corporation
    Inventors: Philippe Perdu, Romain Desplats, Felix Beaudoin, Praveen Vedagarbha, Martin Leibowitz, Kenneth R. Wilsher
  • Methods of using measured time resolved photon emission data and simulated time resolved photon emission data for fault localization
    Publication number: 20050024057
    Abstract: Methods for using measured time resolved photon emission data and simulated time resolved photon emission data for fault localization are provided and described. In one embodiment, a method of localizing a fault in a circuit includes generating simulation photon emission data for the circuit. Moreover, measured photon emission data for the circuit is generated. The simulation photon emission data is compared with the measured photon emission data to generate a comparison result. Further, the comparison result is classified according to predetermined criteria. The classified comparison result is used in a fault localization technique to determine next action in localizing the fault.
    Type: Application
    Filed: June 17, 2004
    Publication date: February 3, 2005
    Inventors: Romain Desplats, Philippe Perdu, Ketan Shah, Martin Leibowitz, Theodore R. Lundquist
  • Spatial and temporal selective laser assisted fault localization
    Publication number: 20050006602
    Abstract: A method and apparatus for laser-assisted fault mapping which synchronizes the laser control with the tester unit. The inventive method provides for laser-assisted pseudo-static fault mapping to localize defects in a device whose inputs are being stimulated dynamically by a tester. It further provides for laser-assisted dynamic soft error mapping, to localize in terms of location and to correlate with respect to a specific test vector, sensitive areas in a device by utilizing device performance criteria such as pass-fail status outputs. The apparatus includes a fully controllable dynamic laser stimulation apparatus connected to a control unit that provides complete synchronization with a tester unit.
    Type: Application
    Filed: July 9, 2004
    Publication date: January 13, 2005
    Inventors: Philippe Perdu, Romain Desplats, Felix Beaudoin, Praveen Vedagarbha, Martin Leibowitz, Kenneth Wilsher