Abstract: A circuit arrangement with a diagnostic function, in particular for use in position-measuring devices, includes a higher-level application-specific integrated circuit (ASIC) having a diagnostic unit and an electronic circuit configured to perform a first intended function, and at least one lower-level ASIC having a parameter-measuring unit and an electronic circuit a second intended function. The parameter-measuring unit and the diagnostic unit are interconnected via a data channel. The parameter-measuring unit is configured to determine a plurality of functional parameters of the electronic circuit of the lower-level ASIC, and to transmit the functional parameters via the data channel to the diagnostic unit. The diagnostic unit is configured to establish operational readiness of the electronic circuit of the at least one lower-level ASIC by evaluating the functional parameters.