Patents by Inventor Martin Pernull

Martin Pernull has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10707888
    Abstract: A method and an apparatus for determining the suitability of a test delay value between comparator decisions of a comparator circuit of an asynchronous successive approximation analog/digital converter and a method for determining an optimized delay value of a comparator of an asynchronous successive approximation analog/digital converter are provided.
    Type: Grant
    Filed: April 17, 2019
    Date of Patent: July 7, 2020
    Assignee: INFINEON TECHNOLOGIES AG
    Inventors: Martin Pernull, Peter Bogner
  • Patent number: 10666281
    Abstract: In accordance with an embodiment, a method for calibrating at least two analog-to-digital converters includes feeding an analog predefined signal to the at least two analog-to-digital converters; converting the analog predefined signal into at least two converter-associated digital values using the at least two analog-to-digital converters, wherein the converting is based on a received clock signal; and adapting a converter-specific time delay based on the at least two converter-associated digital values.
    Type: Grant
    Filed: April 17, 2019
    Date of Patent: May 26, 2020
    Assignee: INFINEON TECHNOLOGIES AG
    Inventors: Martin Pernull, Peter Bogner
  • Patent number: 10601439
    Abstract: Sigma-delta converters having a sampling circuit are provided. The sampling circuit is actuated such that sampling times are at least partially random.
    Type: Grant
    Filed: February 27, 2019
    Date of Patent: March 24, 2020
    Assignee: INFINEON TECHNOLOGIES AG
    Inventors: Martin Pernull, Massimo Rigo, Herwig Wappis
  • Publication number: 20190326919
    Abstract: A method and an apparatus for determining the suitability of a test delay value between comparator decisions of a comparator circuit of an asynchronous successive approximation analog/digital converter and a method for determining an optimized delay value of a comparator of an asynchronous successive approximation analog/digital converter are provided.
    Type: Application
    Filed: April 17, 2019
    Publication date: October 24, 2019
    Applicant: Infineon Technologies AG
    Inventors: Martin Pernull, Peter Bogner
  • Publication number: 20190326920
    Abstract: In accordance with an embodiment, a method for calibrating at least two analog-to-digital converters includes feeding an analog predefined signal to the at least two analog-to-digital converters; converting the analog predefined signal into at least two converter-associated digital values using the at least two analog-to-digital converters, wherein the converting is based on a received clock signal; and adapting a converter-specific time delay based on the at least two converter-associated digital values.
    Type: Application
    Filed: April 17, 2019
    Publication date: October 24, 2019
    Inventors: Martin Pernull, Peter Bogner
  • Patent number: 10411883
    Abstract: Devices for sampling a plurality of input signals are provided, wherein a sampling device is controlled to sample the input signals in a random order with additional delays. Other embodiments relate to voltage monitoring systems and corresponding methods.
    Type: Grant
    Filed: October 18, 2016
    Date of Patent: September 10, 2019
    Assignee: Infineon Technologies AG
    Inventors: Martin Pernull, Andreas Kalt, Gerhard Pichler, Franz Wachter, Bernhard Wotruba
  • Publication number: 20190268014
    Abstract: Sigma-delta converters having a sampling circuit are provided. The sampling circuit is actuated such that sampling times are at least partially random.
    Type: Application
    Filed: February 27, 2019
    Publication date: August 29, 2019
    Inventors: Martin Pernull, Massimo Rigo, Herwig Wappis
  • Patent number: 10079610
    Abstract: Representative implementations of devices and techniques provide a built-in self-test (BIST) for an analog-to-digital converter (ADC). Stimuli needed to test an ADC are generated within the chip containing the ADC. Evaluation circuitry is also available on-chip. Generation and evaluation circuits and systems are based on existing circuits and/or components of the chip.
    Type: Grant
    Filed: July 5, 2016
    Date of Patent: September 18, 2018
    Assignee: Infineon Technologies AG
    Inventors: Peter Bogner, Andreas Kalt, Jaafar Mejri, Martin Pernull
  • Patent number: 10056916
    Abstract: A circuit (100) comprises an input terminal (141) which is configured to receive an analog input signal (142). The circuit (100) also comprises a combination element (601) which is configured to combine a number of time-displaced signal values of the input signal (142) to form an analog combination signal (144). The circuit (100) also comprises a quantizer (131) having a converter core which is configured to receive the combination signal (144) via passive charge redistribution from the combination element (601) and to convert it into a digital output signal (145). Such techniques can thus provide for an analog/digital conversion with filtering in the analog domain.
    Type: Grant
    Filed: August 11, 2017
    Date of Patent: August 21, 2018
    Assignee: Infineon Technologies AG
    Inventors: Martin Pernull, Peter Bogner
  • Publication number: 20180198460
    Abstract: Representative implementations of devices and techniques provide a built-in self-test (BIST) for an analog-to-digital converter (ADC). Stimuli needed to test an ADC are generated within the chip containing the ADC. Evaluation circuitry is also available on-chip. Generation and evaluation circuits and systems are based on existing circuits and/or components of the chip.
    Type: Application
    Filed: July 5, 2016
    Publication date: July 12, 2018
    Inventors: Peter Bogner, Andreas Kalt, Jaafar Mejri, Martin Pernull
  • Publication number: 20180083649
    Abstract: A circuit (100) comprises an input terminal (141) which is configured to receive an analog input signal (142). The circuit (100) also comprises a combination element (601) which is configured to combine a number of time-displaced signal values of the input signal (142) to form an analog combination signal (144). The circuit (100) also comprises a quantizer (131) having a converter core which is configured to receive the combination signal (144) via passive charge redistribution from the combination element (601) and to convert it into a digital output signal (145). Such techniques can thus provide for an analog/digital conversion with filtering in the analog domain.
    Type: Application
    Filed: August 11, 2017
    Publication date: March 22, 2018
    Inventors: Martin Pernull, Peter Bogner
  • Patent number: 9853655
    Abstract: In some examples, a method includes controlling a first set of switches to deliver a first voltage signal through a first set of capacitors to a common node. The method also includes controlling a second set of switches to deliver a second voltage signal through a second set of capacitors to the common node, wherein the first set of capacitors is electrically connected to the second set of capacitors by the common node. The method further includes measuring a time duration to discharge the common node. The second voltage signal includes an opposing polarity to the first voltage signal.
    Type: Grant
    Filed: March 1, 2017
    Date of Patent: December 26, 2017
    Assignee: Infineon Technologies AG
    Inventors: Martin Pernull, Peter Bogner, Sven Derksen, Jaafar Mejri
  • Publication number: 20170118012
    Abstract: Devices for sampling a plurality of input signals are provided, wherein a sampling device is controlled to sample the input signals in a random order with additional delays. Other embodiments relate to voltage monitoring systems and corresponding methods.
    Type: Application
    Filed: October 18, 2016
    Publication date: April 27, 2017
    Inventors: Martin Pernull, Andreas Kalt, Gerhard Pichler, Franz Wachter, Bernhard Wotruba