Patents by Inventor Martin Rickert

Martin Rickert has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10463265
    Abstract: An implantable electrode array is provided, the electrode array comprising a substrate, the substrate having a front side and a back side, and a first number of first electrodes. The first electrodes are formed as contact pads, and are arranged on the front side. The substrate comprises a second number of prefabricated holes at predetermined positions, the holes extending from the front side through the substrate towards the back side, and being arranged such the holes may be penetrated by elongated electrodes placed at the predetermined positions.
    Type: Grant
    Filed: May 15, 2017
    Date of Patent: November 5, 2019
    Assignee: CorTec GmbH
    Inventors: Tom Colin Bierbrauer, Joern Rickert, Christian Henle, Martin J. Bak, Nuri Firat Ince
  • Publication number: 20180154110
    Abstract: The current document is directed to length-adjustable catheters and methods that employ length-adjustable catheters to treat malformations, constrictions, obstructions, lesions, and blockages within patients' blood vessels. The length of the shaft of a length-adjustable catheter, to which the current application is directed, can be adjusted over a range of lengths prior to and during medical procedures. In many implementations, length adjustment is accompanied by indications, to the medical provider, of the extent of a length adjustment. The indications may include one or more of visual markings, haptic feedback, radio-opaque markings, and/or other types of indications. In many implementations, the variable-length mechanism of the length-adjustable catheter is mechanically lockable following length adjustment.
    Type: Application
    Filed: August 26, 2015
    Publication date: June 7, 2018
    Applicant: CTI Vascular AG
    Inventors: Marc Gianotti, Michael Jetter, Martin Rickert, Dragana Gajic, Sabina Silva, Andreas Bodmer, Valentin Nickel, Ulf Fritz
  • Publication number: 20160262847
    Abstract: The invention refers to a dental or surgical handpiece comprising a head, which serves to receive a tool, and a connector sleeve, which is intended for coupling the handpiece to a drive motor, wherein the head and the connector sleeve are connected by a connecting piece and the connecting piece accommodates a drivetrain which serves to transmit rotational energy from the connector sleeve into the head for driving the tool, characterized in that the handpiece has a RFID transponder and a plastic casing delimiting the handpiece, and the RFID transponder is protected by the plastic casing.
    Type: Application
    Filed: March 9, 2016
    Publication date: September 15, 2016
    Inventors: Martin Rickert, Karl Mack, Carolin Rickert
  • Patent number: 8361017
    Abstract: A balloon catheter comprising a catheter tube, an inflatable and deflatable balloon fixed to the catheter tube and a refolding device for folding the balloon onto the catheter tube during balloon deflation, wherein the refolding device includes at least one flap arrangement being fixed on the catheter tube and being disposed within the balloon.
    Type: Grant
    Filed: May 18, 2009
    Date of Patent: January 29, 2013
    Assignee: Abbott Laboratories Vascular Enterprises Limited
    Inventors: Martin Rickert, Boris Warnack
  • Patent number: 8296707
    Abstract: A method, system and computer program product are provided for implementing spare latch placement quality (SLPQ) determination in a floor plan design of an integrated circuit chip. A spare latch placement quality (SLPQ) metric data function is defined and compared to a spare latch placement input with a series of calculations performed. The spare latch placement quality (SLPQ) determination is made based upon the compared SLPQ metric data function and the spare latch placement input. Then associated reports including textual and visual reports are generated responsive to the SLPQ determination. In addition, a new spare latch placement can be constructed with an algorithm responsive to the SLPQ determination.
    Type: Grant
    Filed: November 17, 2010
    Date of Patent: October 23, 2012
    Assignee: International Business Machines Corporation
    Inventors: Michael David Amundson, Craig Marshall Darsow, Eldon Gale Nelson, Dennis Martin Rickert
  • Publication number: 20120124541
    Abstract: A method, system and computer program product are provided for implementing spare latch placement quality (SLPQ) determination in a floor plan design of an integrated circuit chip. A spare latch placement quality (SLPQ) metric data function is defined and compared to a spare latch placement input with a series of calculations performed. The spare latch placement quality (SLPQ) determination is made based upon the compared SLPQ metric data function and the spare latch placement input. Then associated reports including textual and visual reports are generated responsive to the SLPQ determination. In addition, a new spare latch placement can be constructed with an algorithm responsive to the SLPQ determination.
    Type: Application
    Filed: November 17, 2010
    Publication date: May 17, 2012
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Michael David Amundson, Craig Marshall Darsow, Eldon Gale Nelson, Dennis Martin Rickert
  • Patent number: 8166357
    Abstract: A method and apparatus for implementing integrated circuit security features are provided to selectively disable testability features on an integrated circuit chip. A test disable logic circuit receives a test enable signal and responsive to the test enable signal set for a test mode, establishes a test mode and disables ASIC signals. Responsive to the test enable signal not being set, the ASIC signals are enabled for a functional mode and the testability features on the integrated circuit chip are disabled. When the functional mode is enabled, the test disable logic circuit prevents the test mode from being established while the integrated circuit chip is powered up.
    Type: Grant
    Filed: December 26, 2007
    Date of Patent: April 24, 2012
    Assignee: International Business Machines Corporation
    Inventors: David Warren Pruden, Dennis Martin Rickert, Brian Andrew Schuelke
  • Publication number: 20110196296
    Abstract: A balloon catheter comprising a catheter tube, an inflatable and deflatable balloon fixed to the catheter tube and a refolding device for folding the balloon onto the catheter tube during balloon deflation, wherein the refolding device includes at least one flap arrangement being fixed on the catheter tube and being disposed within the balloon.
    Type: Application
    Filed: May 18, 2009
    Publication date: August 11, 2011
    Inventors: Martin Rickert, Boris Warnack
  • Patent number: 7852103
    Abstract: A method, an apparatus and a computer program product are provided for implementing At-Speed Wafer Final Test (WFT) with total integrated circuit chip coverage including high speed off-chip receiver and driver input/output (I/O) circuits. An integrated circuit (IC) chip includes off-chip Controlled Collapse Chip Connection (C4) nodes and a driver and a receiver of the off-chip receiver and driver input/output (I/O) circuits connected to respective off-chip C4 nodes. Through Silicon Vias (TSVs) are added to the connections of the driver and the receiver and the respective off-chip C4 nodes to a backside of the IC chip. A metal wire is added to the IC chip backside connecting the TSVs and creating a connection path between the driver and the receiver that is used for the at-speed WFT testing of the I/O circuits.
    Type: Grant
    Filed: April 24, 2009
    Date of Patent: December 14, 2010
    Assignee: International Business Machines Corporation
    Inventors: Gerald Keith Bartley, Darryl John Becker, Paul Eric Dahlen, Philip Raymond Germann, Andrew Benson Maki, Mark Owen Maxson, Dennis Martin Rickert
  • Publication number: 20100271046
    Abstract: A method, an apparatus and a computer program product are provided for implementing At-Speed Wafer Final Test (WFT) with total integrated circuit chip coverage including high speed off-chip receiver and driver input/output (I/O) circuits. An integrated circuit (IC) chip includes off-chip Controlled Collapse Chip Connection (C4) nodes and a driver and a receiver of the off-chip receiver and driver input/output (I/O) circuits connected to respective off-chip C4 nodes. Through Silicon Vias (TSVs) are added to the connections of the driver and the receiver and the respective off-chip C4 nodes to a backside of the IC chip. A metal wire is added to the IC chip backside connecting the TSVs and creating a connection path between the driver and the receiver that is used for the at-speed WFT testing of the I/O circuits.
    Type: Application
    Filed: April 24, 2009
    Publication date: October 28, 2010
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Gerald Keith Bartley, Darryl John Becker, Paul Eric Dahlen, Philip Raymond Germann, Andrew Benson Maki, Mark Owen Maxson, Dennis Martin Rickert
  • Patent number: 7661047
    Abstract: A method and Dual Interlocked Storage Cell (DICE) latch for implementing enhanced testability, and a design structure on which the subject DICE latch circuit resides are provided. DICE latch includes an L1 latch and an L2 latch are coupled to the L1 latch. Each L1 latch and each L2 latch includes redundant latch structures. A separate output is provided with the redundant L2 latch. The DICE latch includes a Redundant Test Latch Enable (RTLE) input. Each L1 latch and each L2 latch includes a path selector control in the redundant latch structures controlled by the RTLE input providing each of the redundant latch structures in a scan path during a test mode.
    Type: Grant
    Filed: October 10, 2007
    Date of Patent: February 9, 2010
    Assignee: International Business Machines Corporation
    Inventors: Dennis Martin Rickert, Byron D. Scott
  • Patent number: 7661046
    Abstract: A method and a Dual Interlocked Storage Cell (DICE) latch implementing enhanced testability includes an L1 latch and an L2 latch coupled to the L1 latch. Each L1 latch and each L2 latch includes redundant latch structures. A separate output is provided with the redundant L2 latch. The DICE latch includes a Redundant Test Latch Enable (RTLE) input. Each L1 latch and each L2 latch includes a path selector control in the redundant latch structures controlled by the RTLE input providing each of the redundant latch structures in a scan path during a test mode.
    Type: Grant
    Filed: March 5, 2007
    Date of Patent: February 9, 2010
    Assignee: International Business Machines Corporation
    Inventors: Dennis Martin Rickert, Byron D. Scott
  • Publication number: 20090172819
    Abstract: A method and apparatus for implementing integrated circuit security features are provided to selectively disable testability features on an integrated circuit chip. A test disable logic circuit receives a test enable signal and responsive to the test enable signal set for a test mode, establishes a test mode and disables ASIC signals. Responsive to the test enable signal not being set, the ASIC signals are enabled for a functional mode and the testability features on the integrated circuit chip are disabled. When the functional mode is enabled, the test disable logic circuit prevents the test mode from being established while the integrated circuit chip is powered up.
    Type: Application
    Filed: December 26, 2007
    Publication date: July 2, 2009
    Inventors: David Warren Pruden, Dennis Martin Rickert, Brian Andrew Schuelke
  • Publication number: 20080222468
    Abstract: A method and a Dual Interlocked Storage Cell (DICE) latch implementing enhanced testability includes an L1 latch and an L2 latch coupled to the L1 latch. Each L1 latch and each L2 latch includes redundant latch structures. A separate output is provided with the redundant L2 latch. The DICE latch includes a Redundant Test Latch Enable (RTLE) input. Each L1 latch and each L2 latch includes a path selector control in the redundant latch structures controlled by the RTLE input providing each of the redundant latch structures in a scan path during a test mode.
    Type: Application
    Filed: March 5, 2007
    Publication date: September 11, 2008
    Inventors: Dennis Martin Rickert, Byron D. Scott
  • Publication number: 20080222469
    Abstract: A method and Dual Interlocked Storage Cell (DICE) latch for implementing enhanced testability, and a design structure on which the subject DICE latch circuit resides are provided. DICE latch includes an L1 latch and an L2 latch are coupled to the L1 latch. Each L1 latch and each L2 latch includes redundant latch structures. A separate output is provided with the redundant L2 latch. The DICE latch includes a Redundant Test Latch Enable (RTLE) input. Each L1 latch and each L2 latch includes a path selector control in the redundant latch structures controlled by the RTLE input providing each of the redundant latch structures in a scan path during a test mode.
    Type: Application
    Filed: October 10, 2007
    Publication date: September 11, 2008
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Dennis Martin Rickert, Byron D. Scott
  • Patent number: 7278787
    Abstract: An X-ray apparatus, in particular a dental X-ray apparatus, includes an X-ray radiation source for generating X-ray radiation to be directed at an object to be investigated, for example, a patient's tooth or jaw. The apparatus has an optical device through which an aiming device, for example, an additional visible pilot radiation generated by a further light source, is directed substantially parallel to the X-ray radiation at the object to be investigated to facilitate the positioning of the X-ray head.
    Type: Grant
    Filed: September 26, 2005
    Date of Patent: October 9, 2007
    Assignee: Kaltenbach + Voigt GmbH
    Inventors: Alexander Hack, Uwe Zeller, Klaus Weber, Martin Rickert
  • Publication number: 20060067483
    Abstract: An X-ray apparatus, in particular a dental X-ray apparatus, includes an X-ray radiation source for generating X-ray radiation to be directed at an object to be investigated, for example, a patient's tooth or jaw. The apparatus has an optical device through which an aiming device, for example, an additional visible pilot radiation generated by a further light source, is directed substantially parallel to the X-ray radiation at the object to be investigated to facilitate the positioning of the X-ray head.
    Type: Application
    Filed: September 26, 2005
    Publication date: March 30, 2006
    Inventors: Alexander Hack, Uwe Zeller, Klaus Weber, Martin Rickert