Abstract: The method is for dividing dark objects, substructures and background of an image from an electron microscope into segments by analyzing pixel values. The segments are transformed and aligned so that the transformed objects, sub-structures and background are meaningfully comparable. The transformed segments are clustered into classes which are used for ontological investigation of samples that are visualized by using electron microscopy. A triangle inequality comparison can be used to further cluster groups of objects to transfer understanding from different interactions between objects and to associate interactions with each other.

Abstract: The method is for dividing dark objects, substructures and background of an image from an electron microscope into segments by analyzing pixel values. The segments are transformed and aligned so that the transformed objects, sub-structures and background are meaningfully comparable. The transformed segments are clustered into classes which are used for ontological investigation of samples that are visualized by using electron microscopy. A triangle inequality comparison can be used to further cluster groups of objects to transfer understanding from different interactions between objects and to associate interactions with each other.

Abstract: The method is for dividing dark objects, sub-structures and background of an image from an electron microscope into segments by analyzing pixel values. The segments are transformed and aligned so that the transformed objects, sub-structures and background are meaningfully comparable. The transformed segments are clustered into classes which are used for ontological investigation of samples that are visualized by using electron microscopy. A triangle inequality comparison can be used to further cluster groups of objects to transfer understanding from different interactions between objects and to associate interactions with each other.

Abstract: The method is for quantitative measurement of particle content using hydrated state imaging such as CryoTEM. A sample of virus-like particles (VLPs) or virus particles is provided. Preferably, the sample is rapidly frozen into a cryogenic liquid at a cryogenic temperature. While at the cryogenic temperature, the particle content of each VLP in the frozen sample is observed in the CryoTEM. An amount of the particle content of the VLPs is determined to assess whether the VLPs are empty or not.

Abstract: The method is for quantitative measurement of particle content using hydrated state imaging such as CryoTEM. A sample of virus-like particles (VLPs) or virus particles is provided. Preferably, the sample is rapidly frozen into a cryogenic liquid at a cryogenic temperature. While at the cryogenic temperature, the particle content of each VLP in the frozen sample is observed in the CryoTEM. An amount of the particle content of the VLPs is determined to assess whether the VLPs are empty or not.

Abstract: The method is for dividing dark objects, substructures and background of an image from an electron microscope into segments by analysing pixel values. The segments are transformed and aligned so that the transformed objects, sub-structures and background are meaningfully comparable. The transformed segments are clustered into classes which are used for ontological investigation of samples that are visualized by using electron microscopy. A triangle inequality comparison can be used to further cluster groups of objects to transfer understanding from different interactions between objects and to associate interactions with each other.

Abstract: The method is for quantification of purity of sub-visible particle samples. A sample to be analyzed is place in an electron microscope to obtain an electron microscopy image of the sample. The sample contains objects. The objects that have sizes being different from a size range of primary particles and sizes being within the size range of primary particles are enhanced. The objects are detected as being primary particles or debris. The detected primary particles are excluded from the objects so that the objects contain debris but no primary particles. A first total area (T1) of the detected debris is measured. A second total area (T2) of the detected primary particles is measured.

Abstract: The method is for quantification of purity of sub-visible particle samples. A sample to be analyzed is place in an electron microscope to obtain an electron microscopy image of the sample. The sample contains objects. The objects that have sizes being different from a size range of primary particles and sizes being within the size range of primary particles are enhanced. The objects are detected as being primary particles or debris. The detected primary particles are excluded from the objects so that the objects contain debris but no primary particles. A first total area (T1) of the detected debris is measured. A second total area (T2) of the detected primary particles is measured.

Abstract: The method is for quantitative measurement of particle content using hydrated state imaging such as CryoTEM. A sample of virus-like particles (VLPs) or virus particles is provided. Preferably, the sample is rapidly frozen into a cryogenic liquid at a cryogenic temperature. While at the cryogenic temperature, the particle content of each VLP in the frozen sample is observed in the CryoTEM. An amount of the particle content of the VLPs is determined to assess whether the VLPs are empty or not.

Abstract: The method is for quantification of purity of sub-visible particle samples. A sample to be analyzed is place in an electron microscope to obtain an electron microscopy image of the sample. The sample contains objects. The objects that have sizes being different from a size range of primary particles and sizes being within the size range of primary particles are enhanced. The objects are detected as being primary particles or debris. The detected primary particles are excluded from the objects so that the objects contain debris but no primary particles. A first total area (T1) of the detected debris is measured. A second total area (T2) of the detected primary particles is measured.

Abstract: The method is for quantification of purity of sub-visible particle samples. A sample to be analyzed is place in an electron microscope to obtain an electron microscopy image of the sample. The sample contains objects. The objects that have sizes being different from a size range of primary particles and sizes being within the size range of primary particles are enhanced. The objects are detected as being primary particles or debris. The detected primary particles are excluded from the objects so that the objects contain debris but no primary particles. A first total area (T1) of the detected debris is measured. A second total area (T2) of the detected primary particles is measured.

Abstract: The method is for the identification and characterization of structures in electron micrographs. Structures in a first image are selected. The structures have a first shape type deformed in a first direction. The selected structures are transformed to a second shape type different from the first shape type. The transformed structures of the second shape type are used to form a plurality of templates. A new structure in a second image is identified. The new structure has the first shape type. The second shape type structure of each template is deformed in the first direction. It is determined which template is a preferred template that best matches the new structure.

Abstract: The method is for the identification and characterization of structures in electron micrographs. Structures in a first image are selected. The structures have a first shape type deformed in a first direction. The selected structures are transformed to a second shape type different from the first shape type. The transformed structures of the second shape type are used to form a plurality of templates. A new structure in a second image is identified. The new structure has the first shape type. The second shape type structure of each template is deformed in the first direction. It is determined which template is a preferred template that best matches the new structure.

Abstract: The method is for the identification and characterization of structures in electron micrographs. Structures in a first image are selected. The structures have a first shape type deformed in a first direction. The selected structures are transformed to a second shape type different from the first shape type. The transformed structures of the second shape type are used to form a plurality of templates. A new structure in a second image is identified. The new structure has the first shape type. The second shape type structure of each template is deformed in the first direction. It is determined which template is a preferred template that best matches the new structure.

Abstract: The method is for the identification and characterization of structures in electron micrographs. Structures in a first image are selected. The structures have a first shape type deformed in a first direction. The selected structures are transformed to a second shape type different from the first shape type. The transformed structures of the second shape type are used to form a plurality of templates. A new structure in a second image is identified. The new structure has the first shape type. The second shape type structure of each template is deformed in the first direction. It is determined which template is a preferred template that best matches the new structure.