Abstract: A classifier network has at least two distinct sets of refined data, wherein the first two sets of refined data are sets of numbers representing the features values data received from sensors or a manufactured part. Performing, via at least two distinct types of support vector machines using an associated feature selection process for each classifier independently in a first layer, anomaly detection on the manufactured part. Then, using the stored data including refined data of at least two different types of data transforms and performing, via at least a two distinct types of support vector machines in a second layer, an associated feature selection process for each classifier independently. Forming at least four distinct compound classifier types for anomaly detection on the part using the stored data or coefficients. The ensemble of second layer support vector machine outputs compare the results to determine the presence of an anomaly.

Abstract: A classifier network has at least two distinct sets of refined data, wherein the first two sets of refined data are sets of numbers representing the features values data received from sensors or a manufactured part. Performing, via at least two distinct types of support vector machines using an associated feature selection process for each classifier independently in a first layer, anomaly detection on the manufactured part. Then, using the stored data including refined data of at least two different types of data transforms and performing, via at least a two distinct types of support vector machines in a second layer, an associated feature selection process for each classifier independently. Forming at least four distinct compound classifier types for anomaly detection on the part using the stored data or coefficients. The ensemble of second layer support vector machine outputs compare the results to determine the presence of an anomaly.

Abstract: A classifier network has at least two distinct sets of refined data, wherein the first two sets of refined data are sets of numbers representing the features values data received from sensors or a manufactured part. Performing, via at least two distinct types of support vector machines using an associated feature selection process for each classifier independently in a first layer, anomaly detection on the manufactured part. Then, using the stored data including refined data of at least two different types of data transforms and performing, via at least a two distinct types of support vector machines in a second layer, an associated feature selection process for each classifier independently. Forming at least four distinct compound classifier types for anomaly detection on the part using the stored data or coefficients. The ensemble of second layer support vector machine outputs compare the results to determine the presence of an anomaly.

Abstract: A reflective rotund lens is positioned for projecting a panoramic picture of its horizontal surroundings at a given elevation onto a CCD array, for converting the picture into “pixel form” or an image signal. The image signal is digitized via an A/D converter circuit. A digital signal processor system is programmed for extracting a strip of pixel locations representative of an image ring mapped to pixel locations via superimposition upon the image, whereby all pixel locations outside of the image ring are eliminated by passing the pixels thereof through said A/D converter circuit at a rate higher than the conversion rate of said A/D converter circuit.

Abstract: A reflective rotund lens is positioned for projecting a panoramic picture of its horizontal surroundings at a given elevation onto a CCD array, for converting the picture into "pixel form" or an image signal. The image signal is digitized via an A/D converter circuit. A digital signal processor system is programmed for extracting a strip of pixel locations representative of an image ring mapped to pixel locations via superimposition upon the image, whereby all pixel locations outside of the image ring are eliminated by passing the pixels thereof through said A/D converter circuit at a rate higher than the conversion rate of the A/D converter circuit.