Patents by Inventor Martin Sczyrba

Martin Sczyrba has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8257888
    Abstract: A first exposure dose for a shot area based upon layout data is determined. A correction dose compensating a dose deviation between a first point in time, at which a control unit configured to control a shot time period of a particle beam writing apparatus considers a charged particle beam as having reached a nominal current density, and a second point in time, at which the charged particle beam has actually reached a nominal current density, at a target substrate is determined.
    Type: Grant
    Filed: October 26, 2009
    Date of Patent: September 4, 2012
    Assignee: Advanced Mask Technology Center GmbH + Co. KG
    Inventors: Martin Sczyrba, Christian Buergel, Eugen Foca
  • Patent number: 7811727
    Abstract: A method of determining an exposure dose for writing a pattern using an electron beam writer determines a target dose in the exposure region to obtain a predetermined energy deposition in a specific position of the exposure region, the predetermined energy deposition being larger than a reference energy deposition in the non-exposure region. The target dose is locally increased in a marginal region of the exposure region (the marginal region being adjacent the exposure boundary) to a value that obtains an energy deposition in the marginal region higher than the predetermined energy deposition. Optionally, the target dose can be locally decreased in an intermediate region of the exposure region (the intermediate region being adjacent the marginal region) to a value that obtains an energy deposition in the intermediate region smaller than the predetermined energy deposition. Also provided is an exposure device for carrying out the method.
    Type: Grant
    Filed: November 17, 2006
    Date of Patent: October 12, 2010
    Assignee: Advanced Mask Technology Center GmbH & Co. KG
    Inventors: Martin Sczyrba, Markus Waiblinger, Axel Feicke, Karsten Bubke
  • Publication number: 20100104961
    Abstract: A first exposure dose for a shot area based upon layout data is determined. A correction dose compensating a dose deviation between a first point in time, at which a control unit configured to control a shot time period of a particle beam writing apparatus considers a charged particle beam as having reached a nominal current density, and a second point in time, at which the charged particle beam has actually reached a nominal current density, at a target substrate is determined.
    Type: Application
    Filed: October 26, 2009
    Publication date: April 29, 2010
    Applicant: Advanced Mask Technology Center GmbH Co. KG
    Inventors: Martin Sczyrba, Christian Buergel, Eugen Foca
  • Publication number: 20070263192
    Abstract: An illumination system includes a device for generating an illumination distribution, the illumination distribution having a center point and an outer edge. The illumination distribution includes a first opaque portion defined about the center point, a second opaque portion defined adjacent to the outer edge, and a radiation transmittant portion disposed between the first and the second opaque portions. The illumination system further includes a polarization device that generates a linearly polarized electromagnetic radiation having a locally varying polarization direction so that at least first and second polarization directions are generated. The first polarization direction is different from the second polarization direction and the polarization direction at at least two different points of the radiation transmittant portion of the illumination distribution is parallel to a line connecting that point and the center point of the illumination distribution.
    Type: Application
    Filed: May 14, 2007
    Publication date: November 15, 2007
    Inventors: Karsten Bubke, Martin Sczyrba
  • Publication number: 20070117032
    Abstract: A method of determining an exposure dose for writing a pattern using an electron beam writer determines a target dose in the exposure region to obtain a predetermined energy deposition in a specific position of the exposure region, the predetermined energy deposition being larger than a reference energy deposition in the non-exposure region. The target dose is locally increased in a marginal region of the exposure region (the marginal region being adjacent the exposure boundary) to a value that obtains an energy deposition in the marginal region higher than the predetermined energy deposition. Optionally, the target dose can be locally decreased in an intermediate region of the exposure region (the intermediate region being adjacent the marginal region) to a value that obtains an energy deposition in the intermediate region smaller than the predetermined energy deposition. Also provided is an exposure device for carrying out the method.
    Type: Application
    Filed: November 17, 2006
    Publication date: May 24, 2007
    Inventors: Martin Sczyrba, Markus Waiblinger, Axel Feicke, Karsten Bubke