Patents by Inventor Martin St-Laurent
Martin St-Laurent has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 10156548Abstract: Disclosed is an inspection device and method of guiding an inspection probe according to a predetermined inspection plan. The device is couple with a probe which is to be moved according to the inspection plan on the test object, the device including an inspection guide unit having a guide control unit, a position encoding such as a 3-D camera and visual feedback eyewear. The method including facilitating a virtual display of the inspection plan onto the visual feedback eyewear, moving the probe following the virtual display of the inspection plan, sensing sensed probe positions in real time of the inspection using the 3-D camera and validating the sensed probe position against the inspection plan using the control module. Then the information of the step of validating, such as those spots at which the probe is moved out of the tolerance of the inspection plan, is displayed on the feedback eyewear.Type: GrantFiled: July 31, 2013Date of Patent: December 18, 2018Inventors: Pierre Langlois, Benoit Lepage, Martin St-Laurent, Jason Habermehl
-
Publication number: 20180113100Abstract: Disclosed is an assisted analysis unit for facilitating phased array defect inspection. The analysis unit comprises an identification & merging module, and a sizing module. The modules are capable of displaying defect contours from multiple groups of indications, and of recommending defect merging candidates and defect sizing methods. However both modules also accept user input so that the final decisions rest with the operator.Type: ApplicationFiled: October 25, 2016Publication date: April 26, 2018Applicant: Olympus Scientific Solutions Americas Inc.Inventors: Martin St-Laurent, Jason Habermehl, Pierre Langlois, Benoit Lepage
-
Patent number: 9759692Abstract: A phased array ultrasonic inspection system configured for weld inspection includes a data analysis process with automated and optimized gating to take into account the actual distance between a phased array probe and a weld line. The system embodies a weld tracking module and a dynamic gating module. The tracking module produces dynamically corrected overlays of the weld line based on the echo signals, the dynamically corrected overlays having a series of offsets from the corresponding initial overlays. The dynamic gating module purposefully positions a plurality of data analysis gates to filter out noise signals caused by sources unrelated to the weld, and to provide dynamic target gating adjusted by at least part of the offset.Type: GrantFiled: May 27, 2015Date of Patent: September 12, 2017Assignee: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.Inventors: Martin St-Laurent, Benoit Lepage
-
Patent number: 9726641Abstract: Disclosed is an ultrasonic IRIS inspection system and a method of providing automatically compensated concentric B-scans by means of curve-fitting the unadjusted tube boundaries from inspection data, and from the curve fitted theoretical circle, using non-linear regression analysis to determine an adjusted center. The off-center distance between the adjust center and the misaligned center is then used to produce concentric inspection result by compensating the unadjusted inspection result with the off-center distance.Type: GrantFiled: September 5, 2014Date of Patent: August 8, 2017Assignee: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.Inventors: Tommy Bourgelas, Martin St-Laurent, Guillaume Painchaud-April
-
Patent number: 9625424Abstract: Disclosed is phased array inspection system with automatically generated PAUT scan plan based on a set of configurable probe operation parameters and a combination of preferred code requirement and rules given by PAUT expertise. The complex code requirements and PAUT expertise are pre-assembled into a plurality of templates applicable to categories of inspection tasks by PAUT experts. Requirements and optimization scoring schemes are then used to automatically score each of specifically proposed scan plan setup, including the selection of probe operation parameters against the corresponding template for a specific task. This allows less skilled field inspector to operate with the correct interpretation of the complex code and accurate evaluation of the scan plan.Type: GrantFiled: February 13, 2015Date of Patent: April 18, 2017Assignee: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.Inventors: Benoit LePage, Martin St-Laurent
-
Publication number: 20160238566Abstract: Disclosed is phased array inspection system with automatically generated PAUT scan plan based on a set of configurable probe operation parameters and a combination of preferred code requirement and rules given by PAUT expertise. The complex code requirements and PAUT expertise are pre-assembled into a plurality of templates applicable to categories of inspection tasks by PAUT experts. Requirements and optimization scoring schemes are then used to automatically score each of specifically proposed scan plan setup, including the selection of probe operation parameters against the corresponding template for a specific task. This allows less skilled field inspector to operate with the correct interpretation of the complex code and accurate evaluation of the scan plan.Type: ApplicationFiled: February 13, 2015Publication date: August 18, 2016Applicant: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.Inventors: Benoit LePage, Martin St-Laurent
-
Publication number: 20160069995Abstract: Disclosed is an ultrasonic IRIS inspection system and a method of providing automatically compensated concentric B-scans by means of curve-fitting the unadjusted tube boundaries from inspection data, and from the curve fitted theoretical circle, using non-linear regression analysis to determine an adjusted center. The off-center distance between the adjust center and the misaligned center is then used to produce concentric inspection result by compensating the unadjusted inspection result with the off-center distance.Type: ApplicationFiled: September 5, 2014Publication date: March 10, 2016Applicant: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS, INC.Inventors: Tommy Bourgelas, Martin St-Laurent, Guillaume Painchaud-April
-
Patent number: 9222918Abstract: Disclosed is an improved method of sizing a defect using a phased array system with a single probe orientation requiring only a simple one-pass scan. It is an improvement of the ADDT standard which is adapted to phased array systems with fixed probe orientations. Based on pre-configured parameters obtained from C-scans, the method as presently disclosed provides novel analysis on C-scans and more complete information on defects, including the orientation and sizes in length and depth or thickness of the defects. Phased array systems devised with the presently disclosed method can perform such inspection and complete sizing automatically for longitudinal, transverse and oblique defects in one pass of scan.Type: GrantFiled: February 15, 2013Date of Patent: December 29, 2015Assignee: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.Inventors: Martin St-Laurent, Jinchi Zhang
-
Publication number: 20150346164Abstract: A phased array ultrasonic inspection system configured for weld inspection includes a data analysis process with automated and optimized gating to take into account the actual distance between a phased array probe and a weld line. The system embodies a weld tracking module and a dynamic gating module. The tracking module produces dynamically corrected overlays of the weld line based on the echo signals, the dynamically corrected overlays having a series of offsets from the corresponding initial overlays. The dynamic gating module purposefully positions a plurality of data analysis gates to filter out noise signals caused by sources unrelated to the weld, and to provide dynamic target gating adjusted by at least part of the offset.Type: ApplicationFiled: May 27, 2015Publication date: December 3, 2015Applicant: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS INC.Inventors: Martin St-Laurent, Benoit Lepage
-
Publication number: 20150039245Abstract: Disclosed is an inspection device and method of guiding an inspection probe according to a predetermined inspection plan. The device is couple with a probe which is to be moved according to the inspection plan on the test object, the device including an inspection guide unit having a guide control unit, a position encoding such as a 3-D camera and visual feedback eyewear. The method including facilitating a virtual display of the inspection plan onto the visual feedback eyewear, moving the probe following the virtual display of the inspection plan, sensing sensed probe positions in real time of the inspection using the 3-D camera and validating the sensed probe position against the inspection plan using the control module. Then the information of the step of validating, such as those spots at which the probe is moved out of the tolerance of the inspection plan, is displayed on the feedback eyewear.Type: ApplicationFiled: July 31, 2013Publication date: February 5, 2015Applicant: OLYMPUS NDT INC.Inventors: Pierre Langlois, Benoit Lepage, Martin St-Laurent, Jason Habermehl
-
Publication number: 20140236499Abstract: Disclosed is an improved method of sizing a defect using a phased array system with a single probe orientation requiring only a simple one-pass scan. It is an improvement of the ADDT standard which is adapted to phased array systems with fixed probe orientations. Based on pre-configured parameters obtained from C-scans, the method as presently disclosed provides novel analysis on C-scans and more complete information on defects, including the orientation and sizes in length and depth or thickness of the defects. Phased array systems devised with the presently disclosed method can perform such inspection and complete sizing automatically for longitudinal, transverse and oblique defects in one pass of scan.Type: ApplicationFiled: February 15, 2013Publication date: August 21, 2014Applicant: OLYMPUS NDT, INC.Inventors: Martin St-Laurent, Jinchi Zhang