Patents by Inventor Martin Tiberg

Martin Tiberg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8195412
    Abstract: A method and device characterize linear properties of an electrical component having n>1 ports. The linear properties of the component are described in a matrix relating a voltage applied to the ports to a current through the ports. A frequency dependence of the matrix is approximated to preserve eigenvalues of the matrix by a pole-residual model. The method includes: (a) obtaining a set of values of the matrix at discrete frequencies, and obtaining eigenvalues and eigenvectors for each value; (b) fitting a set of vector equations to the eigenvalues and eigenvectors with a first set of pole frequencies; and (c) calculating a second set of pole frequencies by a vector fitting process for all modes of an element of the matrix. Steps (b) and (c) are repeated using the second set of pole frequencies in step (c) in a subsequent step (b) until a stop condition is met.
    Type: Grant
    Filed: October 2, 2009
    Date of Patent: June 5, 2012
    Assignee: ABB Technology AG
    Inventors: Bjorn Gustavsen, Christoph Heitz, Martin Tiberg
  • Patent number: 8155934
    Abstract: Residue perturbation is used for enforcing passivity of a linear response model of an electrical component having n>1 ports. According to an exemplary embodiment, a modal perturbation approach can be used, which allows weighted perturbation of the individual modes by the inverse of the corresponding eigenvalues. This provides superior results if the admittance or impedance matrix of the device has a large eigenvalue spread.
    Type: Grant
    Filed: November 11, 2009
    Date of Patent: April 10, 2012
    Assignee: ABB Technology AG
    Inventors: Bjorn Gustavsen, Christoph Heitz, Martin Tiberg
  • Patent number: 8154311
    Abstract: A method and device for determining the linear response of an electrical multi-port component has an “estimation procedure” in which an estimated admittance matrix is determined by applying voltages to the ports of the component and measuring the response of the component. The estimation procedure can e.g. consist of a conventional measurement of the admittance matrix. The method further has a “measurement procedure” in which several voltage patterns are applied to the port. The voltage patterns correspond to the eigenvectors of the estimated admittance matrix. For each applied voltage pattern, the response of the component is measured. This allows to measure the linear response of the component accurately even if the eigenvalues of the admittance matrix differ by several orders of magnitude.
    Type: Grant
    Filed: July 18, 2007
    Date of Patent: April 10, 2012
    Assignee: ABB Research Ltd
    Inventors: Kaveh Niayesh, Matthias Berth, Andreas Dahlquist, Christoph Heitz, Martin Tiberg
  • Publication number: 20100106474
    Abstract: Residue perturbation is used for enforcing passivity of a linear response model of an electrical component having n>1 ports. According to an exemplary embodiment, a modal perturbation approach can be used, which allows weighted perturbation of the individual modes by the inverse of the corresponding eigenvalues. This provides superior results if the admittance or impedance matrix of the device has a large eigenvalue spread.
    Type: Application
    Filed: November 11, 2009
    Publication date: April 29, 2010
    Applicant: ABB TECHNOLOGY AG
    Inventors: Bjorn Gustavsen, Christoph Heitz, Martin Tiberg
  • Publication number: 20100023288
    Abstract: Rational macromodeling of multiport devices is disclosed that can ensure high accuracy with arbitrary terminal conditions. This can be achieved by reformulating a vector fitting technique to fit eigenpairs rather than matrix elements, and weighting can be chosen equal to an inverse of an eigenvalue magnitude in order to achieve a relative accuracy criterion for the eigenvalue fit. The procedure can improve accuracy for cases with a large eigenvalue spread. Impedance characteristics of an adjacent network can be used to lessen the complexity of the fitting and to improve accuracy.
    Type: Application
    Filed: October 2, 2009
    Publication date: January 28, 2010
    Applicant: ABB Technology AG
    Inventors: Bjorn GUSTAVSEN, Christoph Heitz, Martin Tiberg
  • Publication number: 20090088995
    Abstract: To characterize an electrical component, namely a medium or high voltage transformer, electrical motor or generator, a two-step procedure is carried out. In a first step, a set of terminal configurations are applied to the terminals (p1, . . . , pn) of the component in order to obtain data describing the linear electrical response of the component to any pattern of voltages uk or currents ik applied to the terminals (p1, . . . , pn). Typically, such data is e.g. expressed in terms of an admittance matrix Y or impedance matrix Z or, by the set of current and voltage vectors (ik, uk). Using this data, the linear electrical response of the component 1 under a test terminal configuration can now be calculated in a second step. This procedure allows to determine the response under any desired test terminal configuration without the need to carry out the measurement under the test terminal configuration.
    Type: Application
    Filed: December 4, 2008
    Publication date: April 2, 2009
    Applicant: ABB Technology AG
    Inventors: Martin TIBERG, Christoph Heitz, Olaf Hoenecke, Bjorn Gustavsen
  • Publication number: 20070285109
    Abstract: A method and device for determining the linear response of an electrical multi-port component has an “estimation procedure” in which an estimated admittance matrix is determined by applying voltages to the ports of the component and measuring the response of the component. The estimation procedure can e.g. consist of a conventional measurement of the admittance matrix. The method further has a “measurement procedure” in which several voltage patterns are applied to the port. The voltage patterns correspond to the eigenvectors of the estimated admittance matrix. For each applied voltage pattern, the response of the component is measured. This allows to measure the linear response of the component accurately even if the .eigenvalues of the admittance matrix differ by several orders of magnitude.
    Type: Application
    Filed: July 18, 2007
    Publication date: December 13, 2007
    Applicant: ABB Research Ltd
    Inventors: Kaveh Niayesh, Matthias Berth, Andreas Dahlquist, Christoph Heitz, Martin Tiberg
  • Publication number: 20050210269
    Abstract: A method for biometric identification or verification of an individual includes reading reference biometric information, representing a characteristic inherent to the individual, encrypting the biometric information by means of an encryption key, storing the encrypted reference biometric information as a reference in a database, reading current biometric information from an individual, encrypting the current biometric information by means of an encryption key, comparing the encrypted current biometric information with the encrypted reference biometric information, and deciding, based on said comparison, whether the current biometric information originate from the same individual as the reference biometric information.
    Type: Application
    Filed: December 30, 2004
    Publication date: September 22, 2005
    Inventor: Martin Tiberg