Patents by Inventor Martin W. Studer

Martin W. Studer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10585137
    Abstract: A method for testing the quality of a galvanic connection between a first terminal and a conductive layer of a high-voltage condenser bushing assembly is provided. The method includes providing a capacitive test circuit. The capacitive test circuit comprises the first terminal, an AC power source and a measurement unit. The method further includes providing, by the AC power source, a first test current in the capacitive test circuit. The first test current is an AC current at a first test frequency of 10 kHz or higher. The method further includes measuring, by the measurement unit, a test parameter indicative of a resistance of the galvanic connection. The method further includes determining the quality of the galvanic connection from the measured test parameter.
    Type: Grant
    Filed: October 18, 2017
    Date of Patent: March 10, 2020
    Assignee: ABB Schweiz AG
    Inventors: Martin W. Studer, Thomas Schuette
  • Publication number: 20180106856
    Abstract: A method for testing the quality of a galvanic connection between a first terminal and a conductive layer of a high-voltage condenser bushing assembly is provided. The method includes providing a capacitive test circuit. The capacitive test circuit comprises the first terminal, an AC power source and a measurement unit. The method further includes providing, by the AC power source, a first test current in the capacitive test circuit. The first test current is an AC current at a first test frequency of 10 kHz or higher. The method further includes measuring, by the measurement unit, a test parameter indicative of a resistance of the galvanic connection. The method further includes determining the quality of the galvanic connection from the measured test parameter.
    Type: Application
    Filed: October 18, 2017
    Publication date: April 19, 2018
    Inventors: Martin W. Studer, Thomas Schuette