Patents by Inventor Marty Cavegn

Marty Cavegn has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12123897
    Abstract: A test contactor is disclosed. The test contactor includes two or more dielectric layers and a test probe embedded in the one or more dielectric layers. The test contactor traverses the one or more dielectric layers. The test probe to include an input signal port and an output signal port and the test probe to transmit a test signal from the input signal port to the output signal port.
    Type: Grant
    Filed: December 18, 2020
    Date of Patent: October 22, 2024
    Assignee: Xcerra Corporation
    Inventors: James Hattis, Travis Evans, Waqas Muzammil, Yukang Feng, Jason Mroczkowski, Marty Cavegn
  • Patent number: 12111343
    Abstract: An apparatus and method for the manufacturing and use in a semiconductor test system is disclosed. The apparatus includes a signal probe and a dielectric sleeve surrounding the signal probe. A method includes forming a mold to receive a component of a contactor assembly, inserting the component into the mold, and forming a dielectric sleeve in at least one of the one or more signal probe holes through an injection molding process. The component includes one or more signal probe holes.
    Type: Grant
    Filed: August 10, 2020
    Date of Patent: October 8, 2024
    Assignee: Xcerra Corporation
    Inventors: Yukang Feng, Jason Mroczkowski, Marty Cavegn
  • Publication number: 20230024755
    Abstract: An apparatus including a contactor having a hole and including a radio frequency absorptive material and a probe inserted in the hole to couple a test signal to a device under test is disclosed. A test system for testing integrated circuits including a contactor including a radio frequency absorptive material is disclosed. A method for making the contactor is also disclosed.
    Type: Application
    Filed: July 23, 2021
    Publication date: January 26, 2023
    Inventors: Yukang Feng, Jason Mroczkowski, Nadia Steckler, Aaren Lonks, Marty Cavegn, James Hattis, Mike Hanks
  • Publication number: 20220043029
    Abstract: An apparatus and method for the manufacturing and use in a semiconductor test system is disclosed. The apparatus includes a signal probe and a dielectric sleeve surrounding the signal probe. A method includes forming a mold to receive a component of a contactor assembly, inserting the component into the mold, and forming a dielectric sleeve in at least one of the one or more signal probe holes through an injection molding process. The component includes one or more signal probe holes.
    Type: Application
    Filed: August 10, 2020
    Publication date: February 10, 2022
    Inventors: Yukang Feng, Jason Mroczkowski, Marty Cavegn
  • Publication number: 20210190821
    Abstract: A test contactor is disclosed. The test contactor includes two or more dielectric layers and a test probe embedded in the one or more dielectric layers. The test contactor traverses the one or more dielectric layers. The test probe to include an input signal port and an output signal port and the test probe to transmit a test signal from the input signal port to the output signal port.
    Type: Application
    Filed: December 18, 2020
    Publication date: June 24, 2021
    Applicant: XCERRA CORPORATION
    Inventors: James Hattis, Travis Evans, Waqas Muzammil, Yukang Feng, Jason Mroczkowski, Marty Cavegn