Patents by Inventor Marvin G. Payne

Marvin G. Payne has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4694167
    Abstract: An improved method of operating a time-of-flight mass spectrometer. This method, which involves double pulsing, achieves an increase in the resolution of TOF mass spectrometers by compensating for the energy spread of the species extracted from the source and thus the time spread of ions of a specific mass arriving at a detector. According to this improved method, atoms (or molecules) for analysis are rapidly removed from a surface at a first well defined time. These atoms or molecules are then rapidly ionized at a location or region a distance, R, from the surface at a second well defined time after a selected time delay, T.sub.o. The resultant ions first move through a region of uniform electric field of a distance, S.sub.1, and then into a field-free region having a length, S.sub.2, Lastly, ions leaving the field-free region enter a short high energy accelerating region so as to impinge upon an ion detector.
    Type: Grant
    Filed: November 27, 1985
    Date of Patent: September 15, 1987
    Assignee: Atom Sciences, Inc.
    Inventors: Marvin G. Payne, Norbert Thonnard, George S. Hurst
  • Patent number: 4426576
    Abstract: Apparatus and methods of operation are described for determining, with isotopic selectivity, the number of noble gas atoms in a sample. The analysis is conducted within an evacuated chamber which can be isolated by a valve from a vacuum pumping system capable of producing a pressure of 10.sup.-8 Torr. Provision is made to pass pulses of laser beams through the chamber, these pulses having wavelengths appropriate for the resonance ionization of atoms of the noble gas under analysis. A mass filter within the chamber selects ions of a specific isotope of the noble gas, and means are provided to accelerate these selected ions sufficiently for implantation into a target. Specific types of targets are discussed. An electron measuring device produces a signal relatable to the number of ions implanted into the target and thus to the number of atoms of the selected isotope of the noble gas removed from the gas sample.
    Type: Grant
    Filed: September 8, 1981
    Date of Patent: January 17, 1984
    Assignee: Atom Sciences, Inc.
    Inventors: G. Samuel Hurst, Marvin G. Payne, Chung-Hsuan Chen, James E. Parks
  • Patent number: 3987302
    Abstract: This invention relates to a method for the sensitive and selective analysis of an atomic or molecular component of a gas. According to this method, the desired neutral component is ionized by one or more resonance photon absorptions, and the resultant ions are measured in a sensitive counter. Numerous energy pathways are described for accomplishing the ionization including the use of one or two tunable pulsed dye lasers.
    Type: Grant
    Filed: August 27, 1975
    Date of Patent: October 19, 1976
    Assignee: The United States of America as represented by the United States Energy Research and Development Administration
    Inventors: George S. Hurst, Marvin G. Payne, Edward B. Wagner