Patents by Inventor Marvin L. Vestal

Marvin L. Vestal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7634364
    Abstract: The present teachings relate to a method of filtering mass spectrometer data using a variable filter window. The width of the window can depend on the mass itself and the mass defects for a family of compounds. The teachings can be used with a plurality of compounds including but not limited to peptides and can be utilized on a brood range of mass spectrometers.
    Type: Grant
    Filed: June 23, 2006
    Date of Patent: December 15, 2009
    Assignees: Life Technologies Corporation, MDS Inc.
    Inventors: Xunming Chen, Philip J. Savickas, Marvin L. Vestal
  • Publication number: 20090294658
    Abstract: A time-of-flight mass spectrometer includes a pulsed ion source that generates a pulse of ions from a sample to be analyzed. An ion lens focuses the pulse of ions into an ion beam. An ion deflector deflects the ion beam into a deflected ion beam path. An ion mirror is positioned in the deflected ion beam path so that a plane of constant ion flight time is parallel to an input surface of the ion mirror. The ion mirror decelerates and then accelerates ions so that ions of like mass and like charge exit the ion mirror in a reflected ion beam and reach an ion detector at substantially the same time. An ion detector is positioned in the path of the reflected ion beam so that a plane of constant ion flight time is substantially parallel to an input surface of the ion detector. The ion detector detects a time-of-flight of ions from the pulsed ion source to the ion detector that is substantially independent of a path traveled.
    Type: Application
    Filed: May 29, 2008
    Publication date: December 3, 2009
    Applicant: Virgin Instruments Corporation
    Inventors: Marvin L. Vestal, Kevin Hayden
  • Patent number: 7589319
    Abstract: Many applications in the study of metabolics and proteomics require measurements on peptides and small molecules with high resolving power and mass accuracy. These are often present in complex mixtures and sensitivity over a relatively broad mass range, speed of analysis, reliability, and ease of use are very important. The present invention is a time-of-flight mass spectrometer providing optimum performance for these and similar applications.
    Type: Grant
    Filed: May 1, 2007
    Date of Patent: September 15, 2009
    Assignee: Virgin Instruments Corporation
    Inventor: Marvin L. Vestal
  • Patent number: 7564026
    Abstract: The present invention provides a time-of-flight (TOF) mass analyzer. The system includes an analyzer vacuum housing isolated from the evacuated ion source vacuum housing by a gate valve maintained at ground potential. A pulsed ion source is located within the ion source housing, and the gate valve is located in a first field-free region at ground potential. A second field-free drift space within the analyzer housing is biased at high voltage with opposite polarity to the voltage applied to the pulsed ion source. Novel ion detectors are provided with input surfaces in electrical contact with the second field-free drift space with output connected to an external digitizer at ground potential.
    Type: Grant
    Filed: May 1, 2007
    Date of Patent: July 21, 2009
    Assignee: Virgin Instruments Corporation
    Inventor: Marvin L. Vestal
  • Patent number: 7564028
    Abstract: The present invention is directed to ion source and vacuum housings for use in MALDI-TOF mass spectrometry which operates with any type of mass analyzer including linear, reflector, or tandem TOF-TOF instruments. By removing the requirement for the vacuum lock, the present invention allows operation of the ion source vacuum chamber at a pressure at least two orders of magnitude higher than conventional instruments. The present invention also requires only a single valve that isolates the ion source vacuum housing from the TOF analyzer vacuum housing. This is a significant improvement over vacuum locks in the art where the valve opening must be sufficiently large to allow the sample plate to pass through.
    Type: Grant
    Filed: May 1, 2007
    Date of Patent: July 21, 2009
    Assignee: Virgin Instruments Corporation
    Inventor: Marvin L. Vestal
  • Publication number: 20090108196
    Abstract: In various embodiments, provided are ion optics systems comprising an even number of ion mirrors arranged in pairs such that a trajectory of an ion exiting the ion optics system can be provided that intersects a surface substantially parallel to an image focal surface of the ion optics system at a position that is substantially independent of the kinetic energy the ion had on entering the ion optics system. In various embodiments, provided are ion optics systems comprising an even number of ion mirrors arranged in pairs where the first member and second member of each pair are disposed on opposite sides of a first plane such that the first member of the pair has a position that is substantially mirror-symmetric about the first plane relative to the position of the second member of the pair.
    Type: Application
    Filed: September 26, 2007
    Publication date: April 30, 2009
    Applicants: APPLERA CORPORATION, MDS INC. (D/B/A MDS SCIEX DIVISION)
    Inventor: Marvin L. Vestal
  • Publication number: 20080272287
    Abstract: The invention comprises apparatus and methods for rapidly and accurately determining mass-to-charge ratios of molecular ions produced by a pulsed ionization source, and for fragmenting all of the molecular ions produced and rapidly and accurately determining the intensities and mass-to-charge ratios of the fragments produced from each molecular ion.
    Type: Application
    Filed: May 1, 2007
    Publication date: November 6, 2008
    Inventor: Marvin L. Vestal
  • Publication number: 20080272289
    Abstract: The present invention provides a time-of-flight (TOF) mass analyzer. The system includes an analyzer vacuum housing isolated from the evacuated ion source vacuum housing by a gate valve maintained at ground potential. A pulsed ion source is located within the ion source housing, and the gate valve is located in a first field-free region at ground potential. A second field-free drift space within the analyzer housing is biased at high voltage with opposite polarity to the voltage applied to the pulsed ion source. Novel ion detectors are provided with input surfaces in electrical contact with the second field-free drift space with output connected to an external digitizer at ground potential.
    Type: Application
    Filed: May 1, 2007
    Publication date: November 6, 2008
    Inventor: Marvin L. Vestal
  • Publication number: 20080272286
    Abstract: The present invention is directed to ion source and vacuum housings for use in MALDI-TOF mass spectrometry which operates with any type of mass analyzer including linear, reflector, or tandem TOF-TOF instruments. By removing the requirement for the vacuum lock, the present invention allows operation of the ion source vacuum chamber at a pressure at least two orders of magnitude higher than conventional instruments. The present invention also requires only a single valve that isolates the ion source vacuum housing from the TOF analyzer vacuum housing. This is a significant improvement over vacuum locks in the art where the valve opening must be sufficiently large to allow the sample plate to pass through.
    Type: Application
    Filed: May 1, 2007
    Publication date: November 6, 2008
    Inventor: Marvin L. Vestal
  • Publication number: 20080272293
    Abstract: The TOF mass spectrometer disclosed places an even number of ion mirrors in close proximity to a MALDI ion source and a field-free drift space between the exit from the mirrors and an ion detector. This “reversed geometry” configuration may be distinguished from a conventional reflecting TOF analyzer employing a single ion mirror where a large fraction of the total drift space is located between the ion source and the mirror.
    Type: Application
    Filed: May 1, 2007
    Publication date: November 6, 2008
    Inventor: Marvin L. Vestal
  • Publication number: 20080272291
    Abstract: The present invention comprises apparatus and methods for rapidly and accurately determining mass-to-charge ratios of molecular ions produced by a pulsed ionization source, and for fragmenting substantially all of the molecular ions produced while rapidly and accurately determining the intensities and mass-to-charge ratios of the fragments produced from each molecular ion.
    Type: Application
    Filed: May 1, 2007
    Publication date: November 6, 2008
    Inventor: Marvin L. Vestal
  • Publication number: 20080272290
    Abstract: Many applications in the study of metabolics and proteomics require measurements on peptides and small molecules with high resolving power and mass accuracy. These are often present in complex mixtures and sensitivity over a relatively broad mass range, speed of analysis, reliability, and ease of use are very important. The present invention is a time-of-flight mass spectrometer providing optimum performance for these and similar applications.
    Type: Application
    Filed: May 1, 2007
    Publication date: November 6, 2008
    Inventor: Marvin L. Vestal
  • Patent number: 7439520
    Abstract: In various embodiments, provided are ion optics systems comprising two or more pairs of ion condensers arranged where the first member and second member of each pair are disposed on opposite sides of a first plane such that the first member of the pair has a position that is substantially mirror-symmetric about the first plane relative to the position of the second member of the pair and wherein the deflection angle of each of the ion condensers is less than or equal to about ? radians.
    Type: Grant
    Filed: January 24, 2005
    Date of Patent: October 21, 2008
    Assignee: Applied Biosystems Inc.
    Inventor: Marvin L. Vestal
  • Patent number: 7385186
    Abstract: In various embodiments, provided are methods for focusing ions for an ion fragmentor, and methods for operating an ion optics assembly. In various embodiments, the present teachings provide methods that substantially maintain the position of the focal point of the an incoming ion beam over a wide range of collision energies, and thereby provide a collimated ion beam for a collision cell over a wide range of energies. In various embodiments, the present teachings provide methods that facilitate decreasing ion transmission losses over a wide range of collision energies.
    Type: Grant
    Filed: May 13, 2005
    Date of Patent: June 10, 2008
    Assignees: Applera Corporation, MDS Inc.
    Inventors: Kevin M. Hayden, Marvin L. Vestal
  • Publication number: 20080078931
    Abstract: The present invention is directed to improved systems and components for coupling separations technology with MALDI-TOF mass spectroscopy. Specifically, this invention provides new apparatus configurations and methods for interfacing liquid-phase separations with MALDI mass spectrometry. The present invention exploits and expands the use of the collimated hole structure (CHS) sample plate as an integral component of the interface.
    Type: Application
    Filed: September 29, 2006
    Publication date: April 3, 2008
    Inventors: Marvin L. Vestal, Stephen J. Hattan
  • Patent number: 7351959
    Abstract: The present teachings relate to MALDI-TOF instruments, instrument components, and methods of operation thereof. In various aspects, the MALDI-TOF instrument can serve and be operated as a MS/MS instrument. In various embodiments, provided are MALDI-TOF instruments, and methods of operating one or more components of a MALDI-TOF instrument, that facilitate one or more of increasing sensitivity, increasing resolution, increasing dynamic mass range, increasing sample support throughput, and decreasing operational downtime.
    Type: Grant
    Filed: May 13, 2005
    Date of Patent: April 1, 2008
    Assignees: Applera Corporation, MDS Inc.
    Inventors: Kevin M. Hayden, Marvin L. Vestal, Jennifer M. Campbell
  • Patent number: 7351958
    Abstract: In various embodiments, provided are ion optics systems comprising an even number of ion mirrors arranged in pairs such that a trajectory of an ion exiting the ion optics system can be provided that intersects a surface substantially parallel to an image focal surface of the ion optics system at a position that is substantially independent of the kinetic energy the ion had on entering the ion optics system. In various embodiments, provided are ion optics systems comprising an even number of ion mirrors arranged in pairs where the first member and second member of each pair are disposed on opposite sides of a first plane such that the first member of the pair has a position that is substantially mirror-symmetric about the first plane relative to the position of the second member of the pair.
    Type: Grant
    Filed: January 24, 2005
    Date of Patent: April 1, 2008
    Assignees: Applera Corporation, MDS Inc.
    Inventor: Marvin L. Vestal
  • Patent number: 7109480
    Abstract: Provided are MALDI ion sources, methods of forming ions and mass analyzer systems. In various embodiments, provided are MALDI ion sources configured to irradiate a sample on a sample surface with a pulse of laser energy at angle within 10 degrees or less of the surface normal, and a first ion optics system configured to extract sample ions in a direction within 5 degrees or less of the surface normal. In various embodiments, MALDI ion sources having substantially coaxial sample irradiation and ion extraction are provided. In various embodiments, methods are provided, which produce sample ions by MALDI and extract sample ions using an accelerating electrical field to form an ion beam, such that, the angle of the trajectory at the exit from the accelerating electrical field of sample ions substantially at the center of the ion beam is substantially independent of sample ion mass.
    Type: Grant
    Filed: February 23, 2005
    Date of Patent: September 19, 2006
    Assignees: Applera Corporation, MDS Inc.
    Inventors: Marvin L. Vestal, Kevin M. Hayden, Philip J. Savickas
  • Patent number: 7064319
    Abstract: A mass spectrometer according to the present invention has an ionization source for generating ions; an ion trap for accumulating the ions; a time-of-flight mass spectrometer for performing mass spectrometry analysis on the ions by use of a flight time; a collision damping chamber disposed between the ion trap and the time-of-flight mass spectrometer and having a plurality of electrodes therein, which produce a multi-pole electric field, wherein a gas is introduced into the collision damping chamber to reduce kinetic energy of the ions ejected from the ion trap; and an ion transmission adjusting mechanism disposed between the ion trap and the collision damping chamber to allow or prevent injection of the ions from the ion trap to the collision damping chamber. The mass spectrometer provides greatly enhanced qualitative and quantitative analysis capabilities, as compared with conventional techniques.
    Type: Grant
    Filed: March 31, 2003
    Date of Patent: June 20, 2006
    Assignees: Hitachi High-Technologies Corporation, Applera Corporation
    Inventors: Yuichiro Hashimoto, Izumi Waki, Kiyomi Yoshinari, Yasushi Terui, Tsukasa Shishika, Marvin L. Vestal
  • Patent number: RE39353
    Abstract: The system for analyzing multiple samples includes a plurality of portable of sample supports each for accommodating a plurality of samples thereon, and an identification mechanism for identifying each sample location on each of the plurality of sample supports. The mass spectrometer is provided for analyzing each of the plurality of samples when positioned within a sample receiving chamber, and a laser source strikes each sample with a laser pulse to desorb and ionize sample molecules. The support transport mechanism provided provides for automatically inputting and outputting each of the sample supports from the sample receiving chamber of the mass spectrometer. A vacuum lock chamber receives the sample supports and maintains at least one of the sample supports within a controlled environment while samples on another of the plurality of sample supports are being struck with laser pulses.
    Type: Grant
    Filed: January 4, 2001
    Date of Patent: October 17, 2006
    Assignees: Applera Corporation, MDS, Inc.
    Inventor: Marvin L. Vestal