Patents by Inventor Mary B. Stevens

Mary B. Stevens has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Focused ion beam microlathe
    Patent number: 6838683
    Abstract: An apparatus for customizing focused ion beam (FIB) probes is described. Prior to taking probe measurements, the probe tips are milled with a beam of gallium ions on a microlathe platform. A motor rotates the probes such that the probe tips are uniformly milled.
    Type: Grant
    Filed: June 18, 2003
    Date of Patent: January 4, 2005
    Assignee: Intel Corporation
    Inventors: Mary B. Stevens, Peter Zwigl
  • FOCUSED ION BEAM MICROLATHE
    Publication number: 20040256577
    Abstract: An apparatus for customizing focused ion beam (FIB) probes is described. Prior to taking probe measurements, the probe tips are milled with a beam of gallium ions on a microlathe platform. A motor rotates the probes such that the probe tips are uniformly milled.
    Type: Application
    Filed: June 18, 2003
    Publication date: December 23, 2004
    Inventors: Mary B. Stevens, Peter Zwigl