Abstract: Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.

Abstract: A method includes determining an angle of a major axis of an imaged distant sub-diffraction object by obtaining a ratio of measured power of two different optical modes, obtaining power measurements at the angle for three different optical modes, and comparing the power measurements to a catalog of power measurements from one or more known reference objects of known dimensions to determine values for the major axis, a minor axis, and a convexity.

Abstract: A method includes receiving a first modal image based on radiation collected from an object via an aperture, wherein the radiation is separated into the first modal image having an original origin, receiving a second modal image based on radiation collected from the object via the aperture, wherein the radiation is separated into the second modal image having a shifted origin, translating the second modal image to the original origin, and deriving an image of the object as a function of the collective overlap between the first modal image and the translated second modal image. Repeating the process with additional shift images improves the resolution of the final digitally generated image.