Patents by Inventor Masaaki Aoyama

Masaaki Aoyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4956208
    Abstract: A quartz glass crucible adapted for use in a process for pulling a single crystal semiconductor material having an opaque outer substrate of a quartz glass with a relatively high bubble content and an inner transparent glass layer which is substantially free from bubbles. The crucible is produced while the substrate is supported by a rotating mould by forming an atmosphere of high temperature gas and supplying a metered quantity of powders of quartz to the high temperature gas atmosphere to have the quartz powders molten at least partly and directed toward an inner surface of the substrate to be adhered thereon.
    Type: Grant
    Filed: July 6, 1989
    Date of Patent: September 11, 1990
    Assignees: Shin-Etsu Handotai Co., Ltd., Shin-Etsu Quartz Products Co., Ltd.
    Inventors: Akira Uchikawa, Atsushi Iwasaki, Toshio Fukuoka, Mitsuo Matsumura, Hiroshi Matsui, Yasuhiko Sato, Masaaki Aoyama, Eiichi Shinomiya, Akira Fujinoki, Nobuyoshi Ogino
  • Patent number: 4935046
    Abstract: A quartz glass crucible adapted for use in a process for pulling a single crystal semiconductor material having an opaque outer substrate of a quartz glass with a relatively high bubble content and an inner transparent glass layer which is substantially free from bubbles. The crucible is produced while the substrate is supported by a rotating mould by forming an atmosphere of high temperature gas and supplying a metered quantity of powders of quartz to the high temperature gas atmosphere to have the quartz powders molten at least partly and directed toward an inner surface of the substrate to be adhered thereon.
    Type: Grant
    Filed: December 1, 1988
    Date of Patent: June 19, 1990
    Assignees: Shin-Etsu Handotai Company, Limited, Shin-Etsu Quartz Products Co., Ltd.
    Inventors: Akira Uchikawa, Atsushi Iwasaki, Toshio Fukuoka, Mitsuo Matsumura, Hiroshi Matsui, Yasuhiko Sato, Masaaki Aoyama, Eiichi Shinomiya, Akira Fujinoki, Nobuyoshi Ogino
  • Patent number: 4900939
    Abstract: A substrate processing system basically comprises a coater-developer apparatus, an exposure processing apparatus and a conveyance controlling apparatus. The coater-developer apparatus comprises a coater unit including a coater for applying photo-resist on the substrate, and a developer unit for developing the substrate. The exposure processing apparatus includes an exposing means, and an inspection means for inspecting the photo-resist pattern on the substrate. The conveyance controlling apparatus conveys or feeds the substrate through the coater unit, exposure processing apparatus and developer unit in order.
    Type: Grant
    Filed: December 27, 1988
    Date of Patent: February 13, 1990
    Assignee: Nikon Corporation
    Inventor: Masaaki Aoyama
  • Patent number: 4696905
    Abstract: A method for diagnosis of cancer utilizing an ESR spectrometer comprised a first step for mixing cells from a patient with a solution of hematoporphyrin or hematoporphyrin derivative, a second step for isolating said cells from unreacted reagent and obtaining ESR spectral signal on said cells, a third step for finding quantity S.sub.x of the radicals contained in said cells on the basis of the ESR signal, and a fourth step for comparing value S.sub.x at a predetermined level.
    Type: Grant
    Filed: May 10, 1984
    Date of Patent: September 29, 1987
    Assignees: Special Reference Laboratories, Inc., JEOL Ltd.
    Inventors: Masaaki Aoyama, Mitsuharu Itabashi, Mariko Miura, Masahiro Kohno
  • Patent number: 4650335
    Abstract: A comparison-type dimension measurement system in which a laser 1 provides linearly polarized light that is directed by a polarization beam splitter 5 into a microscope system in which a specimen 13 is mounted. The reflected polarized light is rotated 90.degree. by a quarter wave plate 9 and passes through the beam splitter to a multi-element line sensor 19. The laser light is scanned by a rotatable mirror 3 over the specimen. Threshold intensities are determined on indicia of known separation on a reference specimen and used to calibrate the distance measured by the line sensor.
    Type: Grant
    Filed: November 30, 1983
    Date of Patent: March 17, 1987
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Tokuhisa Ito, Goro Kitamura, Hidenori Horiuchi, Masaaki Aoyama
  • Patent number: 4625103
    Abstract: An automatic focusing device for vertical focusing of a specimen 23 in which an enlarging condenser lens 11 is placed between a light source 12 and a half mirror 7 in an automatic focus detecting system so that an enlarged image 24 of the light source is presented to an objective 1 of the focusing microscope M.
    Type: Grant
    Filed: November 30, 1983
    Date of Patent: November 25, 1986
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Goro Kitamura, Hidenori Horiuchi, Masaaki Aoyama, Tokuhisa Ito