Patents by Inventor Masaaki Kurokawa

Masaaki Kurokawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12077111
    Abstract: An in-vehicle power supply structure, in which a vehicle is divided into a plurality of zones and a power supply hub for connecting an electronic device is provided in each of the zones, includes a break detection wire routed along a power supply wire, for detecting damage to the power supply wire caused by an external force acting on the vehicle by its own damage. Both ends of the break detection wire are connected to power supply hubs placed adjacent to each other.
    Type: Grant
    Filed: July 8, 2020
    Date of Patent: September 3, 2024
    Assignee: MAZDA MOTOR CORPORATION
    Inventors: Sadahisa Yamada, Yoshimasa Kurokawa, Tetsuhiro Yamashita, Masaaki Shimizu
  • Publication number: 20240255268
    Abstract: We disclose a scale thickness measuring method of measuring a thickness of scale attached to an outer peripheral surface of a heat transfer pipe having a cylindrical shape centered on an axis by using an eddy-current probe, which is provided with an excitation coil generating an eddy current, and a pair of detection coils detecting axial and circumferential components of a magnetic field formed by the eddy current, the scale thickness measuring method including: obtaining a reference point in a region to which the scale is not attached by calculating a difference between the axial and circumferential components of the magnetic field detected by the pair of detection coils; moving the eddy-current probe inside the heat transfer pipe in the direction of the axis while inserting the eddy-current probe into the heat transfer pipe; calculating the difference between the axial and circumferential components of the magnetic field; obtaining a drift amount by comparing the difference with the reference point; and cal
    Type: Application
    Filed: May 19, 2022
    Publication date: August 1, 2024
    Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Kentaro Jinno, Masaaki Kurokawa, Hajime Kumatani, Yuji Kohashi
  • Patent number: 11366080
    Abstract: An eddy current flaw detection probe includes first coils, second coils, and a switching circuit configured to cause the first or the second coils in each unit U, the unit U being composed of adjacent four coils, to serve as excitation coils that generate eddy currents in an inspection target and cause the other coils in the unit U to serve as detection coils that detect a change in the eddy currents. The first coils each have one end thereof connected to a first common wiring, and the second coils each have one end thereof connected to a second common wiring. The switching circuit includes a first switching circuit connected to the other ends of the first coils and the second coils arranged in a first row, and a second switching circuit connected to the other ends of the first coils and the second coils arranged in a second row.
    Type: Grant
    Filed: February 22, 2019
    Date of Patent: June 21, 2022
    Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Kentaro Jinno, Masaaki Kurokawa
  • Patent number: 11105773
    Abstract: An eddy current flaw detecting probe includes a plurality of excitation coils (3) which is configured to generate an eddy current in an inspection target and a plurality of detection coils (4) which are differentially connected to each other. The plurality of detection coils (4) includes a first detection coil (41) which is disposed on a second center line (4a) intersecting a first center line (3a) which connects a center of a first excitation coil (31) and a center of a second excitation coil (32) to each other and a second detection coil (42) which is disposed on a side opposite to the first detection coil (41) on the second center line (4a). The excitation coil (3) and the detection coil (4) are disposed to be inclined toward an inspection target surface as approaching each other.
    Type: Grant
    Filed: March 1, 2018
    Date of Patent: August 31, 2021
    Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Kentaro Jinno, Masaaki Kurokawa
  • Publication number: 20210010974
    Abstract: An eddy current flaw detection probe includes first coils, second coils, and a switching circuit configured to cause the first or the second coils in each unit U, the unit U being composed of adjacent four coils, to serve as excitation coils that generate eddy currents in an inspection target and cause the other coils in the unit U to serve as detection coils that detect a change in the eddy currents. The first coils each have one end thereof connected to a first common wiring, and the second coils each have one end thereof connected to a second common wiring. The switching circuit includes a first switching circuit connected to the other ends of the first coils and the second coils arranged in a first row, and a second switching circuit connected to the other ends of the first coils and the second coils arranged in a second row.
    Type: Application
    Filed: February 22, 2019
    Publication date: January 14, 2021
    Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Kentaro Jinno, Masaaki Kurokawa
  • Publication number: 20190353618
    Abstract: An eddy current flaw detecting probe includes a plurality of excitation coils (3) which is configured to generate an eddy current in an inspection target and a plurality of detection coils (4) which are differentially connected to each other. The plurality of detection coils (4) includes a first detection coil (41) which is disposed on a second center line (4a) intersecting a first center line (3a) which connects a center of a first excitation coil (31) and a center of a second excitation coil (32) to each other and a second detection coil (42) which is disposed on a side opposite to the first detection coil (41) on the second center line (4a). The excitation coil (3) and the detection coil (4) are disposed to be inclined toward an inspection target surface as approaching each other.
    Type: Application
    Filed: March 1, 2018
    Publication date: November 21, 2019
    Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Kentaro Jinno, Masaaki Kurokawa
  • Patent number: 9903838
    Abstract: An eddy current testing probe includes: exciter coils 2 including a first exciter coil 2a and a second exciter coil 2b identical with each other and arranged in point symmetry, and each of which generates an alternating magnetic field to generate an eddy current in a test object; and detector coils 1 including a first detector coil 1a and a second detector coil 1b identical with each other, arranged in point symmetry, arranged in phase, and differentially connected to each other. The exciter coils 2 and the detector coils 1 are arranged on a single plane. A center of symmetry O on a center line of symmetry CL2 of the coils 2a, 2b, is identical with a center of symmetry O on a center line of symmetry CL1 of the coils 1a, 1b, and the CL1 intersects with the CL2 at a right angle.
    Type: Grant
    Filed: February 12, 2014
    Date of Patent: February 27, 2018
    Assignee: MITSUBiSHI HEAVY INDUSTRIES, LTD.
    Inventors: Masaaki Kurokawa, Tomonori Shichida
  • Patent number: 9494558
    Abstract: Noise included in detection signals is distinguished with a simple configuration. Provided is a flaw-detection apparatus (1) including a flaw-detection sensor group (11) in which two flaw-detection sensors (11a and 11b) are arranged substantially in one row in a scanning direction with a distance therebetween and a processing device (15) that detects a defect in an inspection object on the basis of detection signals detected by the individual flaw-detection sensors (11a and 11b), wherein, with regard to the detection signals detected by the flaw-detection sensors (11a and 11b), when signal values detected at substantially a same positional coordinate in the scanning direction are not similar to each other, and, additionally, when signal values measured at a same time are similar to each other, the processing device (15) determines that the detection signals are not defect signals.
    Type: Grant
    Filed: October 25, 2010
    Date of Patent: November 15, 2016
    Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Kayoko Kawata, Masaaki Kurokawa, Masayoshi Higashi, Masaya Takatsugu, Yoshihiro Asada
  • Patent number: 9207211
    Abstract: An object is to improve the precision of estimating a blockage ratio or a deposited-scale thickness. In a deposit measurement apparatus that estimates a blockage ratio of a gap between a wall surface of a through-hole and an outer surface of a heat-conducting pipe or the thickness of a deposit deposited at the gap, an eddy-current flaw detection probe (61) acquires an eddy-current flaw detection signal by scanning inside the heat-conducting pipe with a sensor; and a processing device (62) estimates the blockage ratio at the gap or the thickness of the deposit deposited at the gap by using the eddy-current flaw detection signal for the gap of the pipe-supporting-plate protrusion in the through-hole.
    Type: Grant
    Filed: November 10, 2011
    Date of Patent: December 8, 2015
    Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Kayoko Kawata, Yuko Yamamoto, Masaaki Kurokawa, Masaharu Michihashi, Naoto Kawase
  • Publication number: 20150108970
    Abstract: An eddy current testing probe includes: exciter coils 2 including a first exciter coil 2a and a second exciter coil 2b identical with each other and arranged in point symmetry, and each of which generates an alternating magnetic field to generate an eddy current in a test object; and detector coils 1 including a first detector coil 1a and a second detector coil 1b identical with each other, arranged in point symmetry, arranged in phase, and differentially connected to each other. The exciter coils 2 and the detector coils 1 are arranged on a single plane. A center of symmetry O on a center line of symmetry CL2 of the coils 2a, 2b, is identical with a center of symmetry O on a center line of symmetry CL1 of the coils 1a, 1b, and the CL1 intersects with the CL2 at a right angle.
    Type: Application
    Filed: February 12, 2014
    Publication date: April 23, 2015
    Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Masaaki Kurokawa, Tomonori Shichida
  • Patent number: 8988668
    Abstract: A film thickness measurement apparatus includes: an ECT sensor for measuring a film thickness of a thermal barrier coating formed on a turbine blade; a storage unit for storing a measurement point on the turbine blade which is a point where the film thickness of the thermal barrier coating is measured; a laser displacement meter for measuring a shape of the turbine blade; a measurement position calculation unit for calculating an actual measurement point suitable for actual film thickness measurement using the ECT sensor, based on the shape of the turbine blade measured by the laser displacement meter and the measurement point on the turbine blade stored in the storage unit; and an arm drive unit for driving the ECT sensor to adjust a measurement position of the ECT sensor based on the actual measurement point calculated by the measurement position calculation unit.
    Type: Grant
    Filed: August 21, 2012
    Date of Patent: March 24, 2015
    Assignee: Mitsubishi Hitachi Power Systems, Ltd.
    Inventors: Masaaki Kurokawa, Jun Yasui, Keiichi Kenmotsu, Shigetoshi Shiotani
  • Publication number: 20150078136
    Abstract: Embodiments are directed to a diaphragm-based flexible array comprising a plurality of piezoelectric elements, wherein the array is configured to conform to a surface of a structure under evaluation and emit acoustic waves in two directions in sequence, a source configured to apply a voltage pulse to each element of the array, and a sensor configured to receive an acoustic pulse from each element of the array in response to application of the voltage pulse to each element of the array.
    Type: Application
    Filed: September 13, 2013
    Publication date: March 19, 2015
    Applicants: Mitsubishi Heavy Industries, Ltd., Sikorsky Aircraft Corporation
    Inventors: Fanping Sun, Zaffir A. Chaudhry, Masaaki Kurokawa
  • Patent number: 8970212
    Abstract: An eddy current probe 1 in accordance with the present invention has a structure in which a cross coil 7 is placed in a predetermined direction relative to permanent magnets 3 and 5 in the following manner. When the probe 1 is erected, the coil 7 is placed between the magnets 3 and 5 so that a direction CD in which the opposing portion 9a (9c) of the first coil 9 is extended intersects with a direction MD in which the magnets 3 and 5 are extended. In the same manner, when the probe 1 is erected, the coil 7 is placed between the magnets 3 and 5 so that a direction CD in which the opposing portion 11a (11c) of the second coil 11 is extended intersects with the direction MD in which the magnets 3 and 5 are extended.
    Type: Grant
    Filed: September 24, 2012
    Date of Patent: March 3, 2015
    Assignee: Mitsubishi Heavy Industries, Ltd.
    Inventor: Masaaki Kurokawa
  • Patent number: 8779762
    Abstract: An inspection device that is capable of inspecting all heat-transfer-tube sealing portions in a steam generator and that is also capable of analyzing a defect shape is provided. An inspection device that employs the eddy-current flaw detection method to inspect the presence/absence of a defect in a welded portion (103) between a tube (101) and a tube plate (102) is provided with a main unit (41) that has a circular-column portion (41A), which is inserted into the tube (101), and a flange portion (41B), which is pressed against the tube plate (102), and that is rotatable with respect to the welded portion (103); a probe (42) that is disposed inside the main unit (41), that can be moved close to and away from the welded portion (103), and that detects a defect in the welded portion (103); and a pressing portion (44) that presses the probe (42) toward the welded portion.
    Type: Grant
    Filed: September 2, 2010
    Date of Patent: July 15, 2014
    Assignee: Mitsubishi Heavy Industries, Ltd.
    Inventors: Masayoshi Higashi, Masaaki Kurokawa, Kayoko Kawata
  • Publication number: 20140192349
    Abstract: A film thickness measurement apparatus includes: an ECT sensor for measuring a film thickness of a thermal barrier coating formed on a turbine blade; a storage unit for storing a measurement point on the turbine blade which is a point where the film thickness of the thermal barrier coating is measured; a laser displacement meter for measuring a shape of the turbine blade; a measurement position calculation unit for calculating an actual measurement point suitable for actual film thickness measurement using the ECT sensor, based on the shape of the turbine blade measured by the laser displacement meter and the measurement point on the turbine blade stored in the storage unit; and an arm drive unit for driving the ECT sensor to adjust a measurement position of the ECT sensor based on the actual measurement point calculated by the measurement position calculation unit.
    Type: Application
    Filed: August 21, 2012
    Publication date: July 10, 2014
    Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Masaaki Kurokawa, Jun Yasui, Keiichi Kenmotsu, Shigetoshi Shiotani
  • Publication number: 20120179402
    Abstract: An object is to improve the precision of estimating a blockage ratio or a deposited-scale thickness. In a deposit measurement apparatus that estimates a blockage ratio of a gap between a wall surface of a through-hole and an outer surface of a heat-conducting pipe or the thickness of a deposit deposited at the gap, an eddy-current flaw detection probe (61) acquires an eddy-current flaw detection signal by scanning inside the heat-conducting pipe with a sensor; and a processing device (62) estimates the blockage ratio at the gap or the thickness of the deposit deposited at the gap by using the eddy-current flaw detection signal for the gap of the pipe-supporting-plate protrusion in the through-hole.
    Type: Application
    Filed: November 10, 2011
    Publication date: July 12, 2012
    Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Kayoko Kawata, Yuko Yamamoto, Masaaki Kurokawa, Masaharu Michihashi, Naoto Kawase
  • Publication number: 20120119733
    Abstract: An inspection device that is capable of inspecting all heat-transfer-tube sealing portions in a steam generator and that is also capable of analyzing a defect shape is provided. An inspection device that employs the eddy-current flaw detection method to inspect the presence/absence of a defect in a welded portion (103) between a tube (101) and a tube plate (102) is provided with a main unit (41) that has a circular-column portion (41A), which is inserted into the tube (101), and a flange portion (41B), which is pressed against the tube plate (102), and that is rotatable with respect to the welded portion (103); a probe (42) that is disposed inside the main unit (41), that can be moved close to and away from the welded portion (103), and that detects a defect in the welded portion (103); and a pressing portion (44) that presses the probe (42) toward the welded portion.
    Type: Application
    Filed: September 2, 2010
    Publication date: May 17, 2012
    Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Masayoshi Higashi, Masaaki Kurokawa, Kayoko Kawata
  • Publication number: 20120123699
    Abstract: Noise included in detection signals is distinguished with a simple configuration. Provided is a flaw-detection apparatus (1) including a flaw-detection sensor group (11) in which two flaw-detection sensors (11a and 11b) are arranged substantially in one row in a scanning direction with a distance therebetween and a processing device (15) that detects a defect in an inspection object on the basis of detection signals detected by the individual flaw-detection sensors (11a and 11b), wherein, with regard to the detection signals detected by the flaw-detection sensors (11a and 11b), when signal values detected at substantially a same positional coordinate in the scanning direction are not similar to each other, and, additionally, when signal values measured at a same time are similar to each other, the processing device (15) determines that the detection signals are not defect signals.
    Type: Application
    Filed: October 25, 2010
    Publication date: May 17, 2012
    Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Kayoko Kawata, Masaaki Kurokawa, Masayoshi Higashi, Masaya Takatsugu, Yoshihiro Asada
  • Patent number: 6677547
    Abstract: A method and an apparatus for classifying and recovering the main components of used batteries, particularly, a method and an apparatus by which the batteries are conveyed on a conveyor while an alternating magnetic field of a plurality of frequencies is applied to each and a detection means detects what sort of induced magnetic field has resulted from the eddy current induced in the battery. The orthogonal components in the change of the induced magnetic field are detected; the relationship between these orthogonal components and the frequencies are compared with the database of the same which is previously obtained, and the batteries are sorted according to their classification and size. This method can sort large amounts of used batteries continuously. In this invention, the battery will be drawn down into the detection region either magnetically or mechanically while the stable transport of the battery is achieved.
    Type: Grant
    Filed: November 9, 2001
    Date of Patent: January 13, 2004
    Assignee: Mitsubishi Heavy Industries, Ltd.
    Inventors: Tadaaki Tanii, Satoshi Tsuzuki, Shiro Honnmura, Takeo Kamimura, Takahiko Hirai, Masaaki Kurokawa, Reizou Miyauchi
  • Patent number: 6501267
    Abstract: The present invention relates to an eddy current testing probe, which is suitable for used in a nondestructive test. The eddy current testing probe is provided with an excitation coil (2, 2a, 2b) which generates an alternating magnetic field to generate an eddy current (12) in a specimen (10), and a pair of detection coils (1a, 1b) differentially connected and arranged in phase. A central portion (C1) of the pair of detection coils and a central portion (C2) of the excitation coil (2, 2a, 2b) are arranged to be located at an identical or an almost identical position in a plan view taken in the direction toward the specimen (10), and a flaw (11) on the specimen (10) is detected based on a difference between voltages generated in the pair of detection coils (1a, 1b) due to the eddy current (12).
    Type: Grant
    Filed: February 29, 2000
    Date of Patent: December 31, 2002
    Assignee: Mitsubishi Heavy Industries, Ltd.
    Inventors: Masaaki Kurokawa, Mitsuyoshi Matsumoto