Abstract: A test burn-in board handler for inserting and pulling out ICs under test in and from a test burn-in board, the handler comprising: a test circuit; and a burn-in board checker. The test circuit performs a pretest of the ICs under test by a simplified function test before the ICs under test are burn-in tested. The burn-in board checker tests the test burn-in board. The handler further comprises an electronic switch. The electronic switch is electrically connected with the test burn-in board on which the ICs under test are mounted, and the electronic switch switches between the first test signals of the test circuit and the second test signals of the burn-in board checker. An alignment stage straightens attitudes of the ICs under test transferred from a tray on which the ICs under test are mounted. After the attitudes of the ICs under test are straightened at the alignment stage, the ICs under test are transferred to and mounted on normal IC sockets on the test burn-in board.