Patents by Inventor Masahiko Ebisawa

Masahiko Ebisawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6884862
    Abstract: a composition for film formation which can be cured in a short time period and give a film having a low dielectric constant and excellent in heat resistance, adhesion and cracking resistance, a polymer for use in the composition and a process for producing the polymer. The composition prepared by dissolving the polymer having specific repeating units in a solvent has excellent film-forming properties. The polymer has repeating units represented by the following general formula (1): wherein Z and Y are as defined hereinabove.
    Type: Grant
    Filed: April 24, 2002
    Date of Patent: April 26, 2005
    Assignee: JSR Corporation
    Inventors: Takashi Okada, Noriyasu Sinohara, Kaori Shirato, Masahiko Ebisawa, Michinori Nishikawa, Kinji Yamada
  • Publication number: 20020161173
    Abstract: a composition for film formation which can be cured in a short time period and give a film having a low dielectric constant and excellent in heat resistance, adhesion and cracking resistance, a polymer for use in the composition and a process for producing the polymer. The composition prepared by dissolving the polymer having specific repeating units in a solvent has excellent film-forming properties.
    Type: Application
    Filed: April 24, 2002
    Publication date: October 31, 2002
    Applicant: JSR CORPORATION
    Inventors: Takashi Okada, Noriyasu Sinohara, Kaori Shirato, Masahiko Ebisawa, Michinori Nishikawa, Kinji Yamada
  • Patent number: 6376634
    Abstract: A composition for film formation which is useful as an interlayer insulating film material in the production of semiconductor devices and the like, and gives a coating film having excellent uniformity, low dielectric constant, low leakage current and excellent storage stability; and a material for insulating film formation using the composition. The composition comprises (A) a product of hydrolysis and condensation obtained by hydrolyzing and condensing at least one compound selected from the group consisting of (A-1) compounds represented by the formula (1): R1aSi(OR2)4−a, and (A-2) compounds represented by the formula (2): R3b(R4O)3−bSi—(R7)d—Si(OR5)3−cR6c; and (B) a compound represented by the formula (3): R8O (CHCH3CH2O)eR9.
    Type: Grant
    Filed: June 2, 2000
    Date of Patent: April 23, 2002
    Assignee: JSR Corporation
    Inventors: Michinori Nishikawa, Kinji Yamada, Mayumi Kakuta, Yasutake Inoue, Masahiko Ebisawa, Satoko Hakamatsuka, Kentarou Tamaki