Abstract: A display device includes a resin substrate, a thin film transistor layer, and a light-emitting element layer. A frame region is provided surrounding a display region. A terminal portion is provided at an end portion of the frame region. A bending portion is provided between the display region and the terminal portion. A slit is provided at the bending portion in an inorganic insulating film. A resin filling film is provided at the bending portion. A plurality of lead wiring lines are provided on the resin filling film. Protrusions and recesses, each extending in a direction intersecting an extending direction of the bending portion, are alternately disposed in the extending direction of the bending portion on a surface of the resin filling film. At least one of the plurality of lead wiring lines is provided on a protrusion of the protrusions.

Abstract: According to one embodiment, a semiconductor device includes a first electrode, a second electrode, a third electrode, a first semiconductor region, a second semiconductor region, a first nitride region, and a first insulating member. The first semiconductor region includes Alx1Ga1-x1N (0?x1<1). The second semiconductor region including Alx2Ga1-x2N (0<x2<1, x1<x2). The first nitride region includes Alz1Ga1-z1N (0<z1?1, x2<z1). The first nitride region includes a first nitride portion. The first nitride portion includes a first position. The first position is a center of the first nitride portion. The third partial region of the first semiconductor region includes a first face facing the first nitride portion. A chlorine concentration at the first position is lower than a chlorine concentration at the first face.

Abstract: A second TFT includes: a second semiconductor layer of an oxide semiconductor; a second interlayer insulating film covering the second semiconductor layer; a terminal electrode; and a contact hole exposing at least a part of the second semiconductor layer. A metal layer is provided covering an exposed surface of the second semiconductor layer exposed inside the contact hole. The terminal electrode is electrically connected to the second semiconductor layer via the contact hole and the metal layer.

Abstract: According to one embodiment, a semiconductor device includes a first electrode, a second electrode, a third electrode, a first semiconductor region, a second semiconductor region, a first nitride region, a first insulating member, and a second insulating member. The third electrode includes a first electrode portion and a second electrode portion. The first semiconductor region includes Alx1Ga1?x1N (0?x1<1). The second semiconductor region includes Alx2Ga1?x2N (0<x2<1, x1<x2). The first nitride region includes Alz1Ga1?z1N (0<z1?1, x2<z1). The second insulating member includes a first insulating region. A part of the first insulating region is located between the fifth partial region of the first semiconductor region and the second electrode portion of the third electrode in the second direction.

Abstract: A particulate collection system, including a particulate matter analyzer and collecting filter, provides a method of analyzing and collecting samples from fluids, such as collecting particulate matter from air. A mass measuring unit and composition analyzing unit can be provided for either simultaneous or immediately consecutive measurements within a single instrument. The filter material can have an antistatic electricity characteristic and can be impregnated with reference material to enable calibration of the composition analyzing unit.

Abstract: A particulate collection system, including a particulate matter analyzer and collecting filter, provides a method of analyzing and collecting samples from fluids, such as collecting particulate matter from air. A mass measuring unit and composition analyzing unit can be provided for either simultaneous or immediately consecutive measurements within a single instrument. The filter material can have an antistatic electricity characteristic and can be impregnated with reference material to enable calibration of the composition analyzing unit.

Abstract: A system, including a particulate matter analyzer and collecting filter, provides a method of analyzing and collecting samples from fluids, such as collecting particulate matter from air. A mass measuring unit and composition analyzing unit can be provided for either simultaneous or immediately consecutive measurements within a single instrument. The filter material can have an antistatic electricity characteristic and can be impregnated with reference material to enable calibration of the composition analyzing unit.

Abstract: This invention relates to a multi-component absorbance monitor, and the object is to provide a general-purpose and highly accurate compact absorbance monitor. Disclosed is an absorbance monitor including a light source, a sample cell and a plurality of detectors as elements, wherein a light collecting member is arranged between the light source and one detector, and an inside wall of the light collecting member has a site for guiding a part of light from the light source, that is, a light guiding opening, and light from the light guiding opening enters another detector. Preferably, the light collecting member lies between the light source and the sample cell. Preferably, an optical element used for another detector described above is arranged in the light guiding opening and adjacently to a light path formed by the light collecting member.

Abstract: This invention relates to a multi-component absorbance monitor, and the object is to provide a general-purpose and highly accurate compact absorbance monitor. Disclosed is an absorbance monitor including a light source, a sample cell and a plurality of detectors as elements, wherein a light collecting member is arranged between the light source and one detector, and an inside wall of the light collecting member has a site for guiding a part of light from the light source, that is, a light guiding opening, and light from the light guiding opening enters another detector. Preferably, the light collecting member lies between the light source and the sample cell. Preferably, an optical element used for another detector described above is arranged in the light guiding opening and adjacently to a light path formed by the light collecting member.

Abstract: The present invention provides a NOx-concentration measuring apparatus D for quantitatively analyzing the concentration of NOx contained in a sample gas. The measuring apparatus D comprises a sampling probe for obtaining the sample gas, a drain separator 2 for condensing moisture contained in the sample gas as a condensed water and separating the condensed water from the sample gas, an NO2 converter 3 for converting NO2 contained in the sample gas into NO, a secondary cooling device 7 for additionally cooling the sample gas, and an NO analyzer 1, arranged in this order with respect to a sample-gas line of the NOx-concentration measuring apparatus. The drain separator is a high-flow-velocity cooling type drain separator. Further, the sample-gas line between the sampling probe and the drain separator is heated and/or thermally insulated over the entire length thereof. The measuring apparatus can provide a high-precision measurement while suppressing NO2 loss.

Abstract: A system, including a particulate matter analyzer and collecting filter, provides a method of analyzing and collecting samples from fluids, such as collecting particulate matter from air. A mass measuring unit and composition analyzing unit can be provided for either simultaneous or immediately consecutive measurements within a single instrument. The filter material can have an antistatic electricity characteristic and can be impregnated with reference material to enable calibration of the composition analyzing unit.

Abstract: The present invention provides a NOx-concentration measuring apparatus D for quantitatively analyzing the concentration of NOx contained in a sample gas. The measuring apparatus D comprises a sampling probe for obtaining the sample gas, a drain separator 2 for condensing moisture contained in the sample gas as a condensed water and separating the condensed water from the sample gas, an NO2 converter 3 for converting NO2 contained in the sample gas into NO, a secondary cooling device 7 for additionally cooling the sample gas, and an NO analyzer 1, arranged in this order with respect to a sample-gas line of the NOx-concentration measuring apparatus. The drain separator is a high-flow-velocity cooling type drain separator.

Abstract: The present invention provides a photo-electric combined substrate comprising an electric interconnection part having an electric interconnection layer and an electric insulating layer as well as an optical waveguide part consisting of a core and a clad, where the electric insulating layer in the electric interconnection part and the optical waveguide part are made of the same material; a ceramic substrate comprising an optical device and an electric device where a ceramic substrate has a concave where the concave is filled with a resin, and where at least an optical device is mounted on the ceramic substrate while an electric device on the resin in the substrate concave; and an optical waveguide comprising a core and a clad having a refractive index lower than that of the core, where the core is made of a fluorene-unit-containing epoxy acrylate resin.

Abstract: The present invention provides a photo-electric combined substrate comprising an electric interconnection part having an electric interconnection layer and an electric insulating layer as well as an optical waveguide part consisting of a core and a clad, where the electric insulating layer in the electric interconnection part and the optical waveguide part are made of the same material; a ceramic substrate comprising an optical device and an electric device where a ceramic substrate has a concave where the concave is filled with a resin, and where at least an optical device is mounted on the ceramic substrate while an electric device on the resin in the substrate concave; and an optical waveguide comprising a core and a clad having a refractive index lower than that of the core, where the core is made of a fluorene-unit-containing epoxy acrylate resin.

Abstract: After an optical element 6, and more preferably both an optical element 6 and an electrical element 7, are mounted on a substrate 1, an upper clad 5 of optical waveguide is formed, covering these elements, and thereby a structure of hermetic seal is achieved through the use of the upper clad 5.

Abstract: A calibration-inability warning method in an analyzing apparatus determines in advance when the analyzing apparatus approaches a calibration-inability condition prior to entering calibration inability condition. To do so, coefficient ranges are set, and a calibration coefficient is computed. It is then determined whether the calibration coefficient is within a normal calibration range, a calibration-inability range, or a normal calibration range with no allowance. Signals are generated indicating that the calibration-inability condition is approaching when the calibration coefficient becomes a certain value in the vicinity of the calibration-inability range.

Abstract: A golf club shaft comprises three interconnected tubular members whose diameters, flexional rigidities, lengths, materials, etc. are selected to make the golf club shaft more flexible near a club head or a club grip or at a middle portion.

Abstract: A gas analyzing apparatus includes a sample gas line with a sample line valve for providing a sample gas, and a reference gas line with a reference line valve for providing a reference gas. A first gas analyzer is connected to the sample line downstream of the sample line valve, and a second gas analyzer is connected to both the sample and reference gas lines downstream of the valves. The lines are configured such that sample gas and reference gas may be alternately provided to the second gas analyzer either directly or indirectly via the first gas analyzer.

Abstract: A gas analyzer has a simple composition and can measure multi-components at a high accuracy. A plurality of measuring cells, including a case where the cells are different in length from each other, communicate sequentially with each other through a communication part to form a single gas path. A cut-on filter as an infrared penetration/reflection means for diffracting spectrally an infrared wavelength is provided on a light source side. A NO.sub.X measuring cell 3 having a cell length of about 60 mm and a CO.sub.2 measuring cell 7 having a cell length of about 1 mm which communicate through the communication part with each other, and a capacitor microphone (an infrared-ray detector for NO.sub.X) and a pyroelectric detector (an infrared-ray detector for CO.sub.2) are provided on the infrared penetration and reflection sides of the optical filter.

Abstract: An ultraviolet light source is provided on one end of a cell into which a sample gas is introduced. A beam splitter for dividing beams which have been transmitted through the cell into two optical paths is provided on the other end of the cell. A first detector is provided in one optical path, and a second detector is provided in the other optical path. A gas filter filled with a component to be measured is positioned between the detectors and beam splitter so that a concentration of the component to be measured may be obtained on the basis of a difference between the output of the first detector and the product of the output of the second detector and an appointed constant. Influences resulting from components coexisting in the sample gas are reduced. Alternatively, an infrared light source may be provided on one end of a sample cell. A gas filter filled with a gas the same as the gas to be measured is provided at the other end of the sample cell.