Abstract: In a holder and a structure for organizing excess length by winding cables and the like, an excess length organizing holder comprises a baseboard which has a rotation axis vertical to a fixed plane, and a spool which has a flange whose edge is provided with two incisions and a winding portion. The spool is rotated around the rotation axis in a state where a cable is folded by way of the winding portion and the two incisions, thereby winding the cable twofold around the winding portion. Also, an excess length organizing structure comprises a door detachable from a box-shaped rack, a mounting hardware connecting the door to the rack and pivoting on one side so as to make the door openable and closable, and at least one excess length organizing holder mentioned above whose baseboard is attached on a surface of the door when the door is attached to the mounting hardware.

Abstract: In a holder and a structure for organizing excess length by winding cables and the like, an excess length organizing holder comprises a baseboard which has a rotation axis vertical to a fixed plane, and a spool which has a flange whose edge is provided with two incisions and a winding portion. The spool is rotated around the rotation axis in a state where a cable is folded by way of the winding portion and the two incisions, thereby winding the cable twofold around the winding portion. Also, an excess length organizing structure comprises a door detachable from a box-shaped rack, a mounting hardware connecting the door to the rack and pivoting on one side so as to make the door openable and closable, and at least one excess length organizing holder mentioned above whose baseboard is attached on a surface of the door when the door is attached to the mounting hardware.

Abstract: The present invention is a self-test circuit (BIST) incorporated in the memory device, which is activated in response to a test activation signal from outside. When this self-test circuit is activated in response to a test activation signal (WBIZ) from outside, it generates a test operation command (WBI-CMD), generates a test address (WBI-ADD), and generates test data (WBI-DATA). Furthermore, after the self-test circuit writes the test data to a memory cell, it effects a comparison to establish whether or not the read data that is read from this memory cell is the same as the test data that was written thereto and stores information as to the result of this comparison. This comparison result information is then output to the outside.

Abstract: There is provided a semiconductor device having an output circuit for outputting a predetermined signal, and an output-level adjusting circuit for adjusting an output level of the output circuit in response to an adjustment start signal externally supplied and outputting an adjustment end signal upon completion of adjustment. A module in which a plurality of the semiconductor devices above are mounted. The module has an adjustment-start-signal terminal for receiving the adjustment start signal externally supplied and supplying the adjustment start signal to the semiconductor devices, and an adjustment-end-signal terminal for outputting a module adjustment end signal in response to adjustment end signals from the semiconductor devices. A plurality of such modules can be mounted in such a way that the adjustment-end-signal terminal of the (N−1)-th module is connected to the adjustment-start-signal terminal of the N-th module.