Patents by Inventor Masahiko Uno
Masahiko Uno has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20200191592Abstract: A search information acquiring unit acquires visual information about a destination. A search condition generating unit generates a search condition by using visual information about the destination, the visual information being acquired by the search information acquiring unit. An image information database has stored therein pieces of image information each about a neighborhood of a road and pieces of position information. A destination searching unit refers to the image information database, to search for image information satisfying the search condition generated by the search condition generating unit and set, as the destination, position information corresponding to the image information.Type: ApplicationFiled: June 26, 2017Publication date: June 18, 2020Applicant: MITSUBISHI ELECTRIC CORPORATIONInventor: Masahiko UNO
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Publication number: 20190096359Abstract: Included are: a gaze determining unit (102) for detecting the line of sight of an occupant on the basis of information acquired by a detected information acquiring unit (101) and, in a case where the detected line of sight of the occupant is located within a preset range, determining that the occupant is gazing ahead of the vehicle; and a display control unit (104) for performing display control of image information by using a display setting which suppresses the image information to be displayed for the occupant from being reflected on a preset area in a case where it is determined that the occupant is gazing ahead of the vehicle.Type: ApplicationFiled: June 9, 2016Publication date: March 28, 2019Applicant: MITSUBISHI ELECTRIC CORPORATIONInventor: Masahiko UNO
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Patent number: 10191569Abstract: In a rotary switch (1), a rotation unit (2) is rotatably supported by a holder unit (3). The holder unit (3) is fixed onto a detection surface of a touch panel (7). Contact points (4) make contact with the detection surface of the touch panel (7) with their positional relationship corresponding to a function of the rotary switch (1). A contact point (5) rotates while making contact with the detection surface of the touch panel (7), as the rotation unit (2) rotates.Type: GrantFiled: April 13, 2015Date of Patent: January 29, 2019Assignee: MITSUBISHI ELECTRIC CORPORATIONInventor: Masahiko Uno
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Publication number: 20180024649Abstract: In a rotary switch (1), a rotation unit (2) is rotatably supported by a holder unit (3). The holder unit (3) is fixed onto a detection surface of a touch panel (7). Contact points (4) make contact with the detection surface of the touch panel (7) with their positional relationship corresponding to a function of the rotary switch (1). A contact point (5) rotates while making contact with the detection surface of the touch panel (7), as the rotation unit (2) rotates.Type: ApplicationFiled: April 13, 2015Publication date: January 25, 2018Applicant: MITSUBISHI ELECTRIC CORPORATIONInventor: Masahiko UNO
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Patent number: 7965883Abstract: The method comprises a first step (S1 in FIG. 1) of obtaining a transmission image, a second step (S2) of applying a quadratic differential filter to the transmission image, thereby to emphasize a part of large luminance change as a quadratic differential filter image, a third step (S3) of binarizing the quadratic differential filter image with a predetermined threshold value, and then storing the resulting binarized image, a fourth step (S4) of binarizing the transmission image with another predetermined threshold value, and then storing the resulting binarized image, a fifth step (S5) of performing the measurement of binary feature quantities for the binarized image stored at the third step (S3) and the binarized image stored at the fourth step (S4), and a sixth step (S6) of deciding the quality of the object to-be-inspected from the binary feature quantities.Type: GrantFiled: May 14, 2007Date of Patent: June 21, 2011Assignee: Mitsubishi Electric CorporationInventors: Hirohisa Nishino, Masahiko Uno
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Patent number: 7920224Abstract: A display device includes a display panel having a display plane, a frame having an opening formed at an area corresponding to the display plane, for holding the periphery of the display panel, a protecting cover for protecting the display plane, and two transparent adhesive sheets arranged in the gap between the display plane and the protecting cover.Type: GrantFiled: October 14, 2008Date of Patent: April 5, 2011Assignee: Mitsubishi Electric CorporationInventors: Takuya Monden, Kenji Teramoto, Masahiko Uno
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Patent number: 7569822Abstract: In an inspection of a semiconductor wafer for a defect, when infrared light passing through a semiconductor wafer is imaged by a camera and an inspection is conducted using the image, a problem that halation occurs in the camera due to light leaking from the side of the inspection object, which makes it impossible to conduct an inspection at the periphery portion occurs. An inspection object is irradiated by an infrared light source, and transmitted light is imaged by an infrared camera to be conducted. With the use of mask means that secures a clearance from the end portion on the outer side, it is possible to inspect on the peripheral portion. Also, as means for supporting the object, plural sets of those configured to be capable of evacuating are used, and by allowing the plural sets to evacuate alternately, it is possible to inspect across the entire surface.Type: GrantFiled: April 17, 2007Date of Patent: August 4, 2009Assignee: Mitsubishi Electric CorporationInventors: Hirohisa Nishino, Takao Ohara, Masahiko Uno
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Publication number: 20090103000Abstract: A display device includes a display panel having a display plane, a frame having an opening formed at an area corresponding to the display plane, for holding the periphery of the display panel, a protecting cover for protecting the display plane, and two transparent adhesive sheets arranged in the gap between the display plane and the protecting cover.Type: ApplicationFiled: October 14, 2008Publication date: April 23, 2009Applicant: MITSUBISHI ELECTRIC CORPORATIONInventors: Takuya Monden, Kenji Teramoto, Masahiko Uno
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Publication number: 20070269099Abstract: The method comprises a first step (S1 in FIG. 1) of obtaining a transmission image, a second step (S2) of applying a quadratic differential filter to the transmission image, thereby to emphasize a part of large luminance change as a quadratic differential filter image, a third step (S3) of binarizing the quadratic differential filter image with a predetermined threshold value, and then storing the resulting binarized image, a fourth step (S4) of binarizing the transmission image with another predetermined threshold value, and then storing the resulting binarized image, a fifth step (S5) of performing the measurement of binary feature quantities for the binarized image stored at the third step (S3) and the binarized image stored at the fourth step (S4), and a sixth step (S6) of deciding the quality of the object to-be-inspected from the binary feature quantities.Type: ApplicationFiled: May 14, 2007Publication date: November 22, 2007Applicant: Mitsubishi Electric CorporationInventors: Hirohisa Nishino, Masahiko Uno
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Publication number: 20070257192Abstract: In an inspection of a semiconductor wafer for a defect, when infrared light passing through a semiconductor wafer is imaged by a camera and an inspection is conducted using the image, a problem that halation occurs in the camera due to light leaking from the side of the inspection object, which makes it impossible to conduct an inspection at the periphery portion occurs. An inspection object is irradiated by an infrared light source, and transmitted light is imaged by an infrared camera to be conducted. With the use of mask means that secures a clearance from the end portion on the outer side, it is possible to inspect on the peripheral portion. Also, as means for supporting the object, plural sets of those configured to be capable of evacuating are used, and by allowing the plural sets to evacuate alternately, it is possible to inspect across the entire surface.Type: ApplicationFiled: April 17, 2007Publication date: November 8, 2007Applicant: Mitsubishi Electric CorporationInventors: Hirohisa Nishino, Takao Ohara, Masahiko Uno