Abstract: An optical member driving device is provided that includes a fixed portion with an accommodation space for a lens device, and a movable portion, which has a holding portion for holding an image sensor, and is rockably supported at a position on a rear side of the lens device. The movable portion includes an FPC having a main body portion connected to the image sensor and a connecting portion for connecting the main body portion and an external device and a coil substrate which is fixed on a front surface of the main body portion of the FPC and on which a coil is formed. The connecting portion has a base end portion which rises from a predetermined position on an edge of the main body portion to a front side. The base end portion is opposed to a side surface of the coil substrate with an adhesive interposed.

Abstract: A piezoelectric driving device includes: a driving portion to be brought into frictional contact with an object to be driven, which is moved with respect to a fixed body; and at least two piezoelectric portions, which are formed integrally with the driving portion, are arranged on a predetermined plane with the driving portion being sandwiched between the at least two piezoelectric portions, and are configured to be bent with respect to the predetermined plane when voltages are applied to the at least two piezoelectric portions, wherein outer edges of entirety of the at least two piezoelectric portions are fixed to the fixed body.

Abstract: An optical member driving device is provided. The device includes a movable portion and a fixed portion with an accommodation space for accommodating a lens device. The movable portion includes a holding portion for holding an image sensor and is supported by a suspension wire at a position on a rear side of the lens device. The fixed portion is located on a front side of the movable portion comprises two opposing surfaces that extend in a front-rear direction, face a top of a corner portion, and are opposed to each other at a right angle at each of predetermined diagonal corners. Each of the opposing surfaces and a surface of the movable portion facing a front side are bridged by a resin with viscoelasticity.

Abstract: An optical member driving device is provided that includes a fixed portion with an accommodation space for a lens device, and a movable portion, which has a holding portion for holding an image sensor, and is rockably supported at a position on a rear side of the lens device. The movable portion includes an FPC having a main body portion connected to the image sensor and a connecting portion for connecting the main body portion and an external device and a coil substrate which is fixed on a front surface of the main body portion of the FPC and on which a coil is formed. The connecting portion has a base end portion which rises from a predetermined position on an edge of the main body portion to a front side. The base end portion is opposed to a side surface of the coil substrate with an adhesive interposed.

Abstract: Provided are a piezoelectric driving device, an optical member driving device, a camera device, and an electronic apparatus, which are capable of performing driving only by one-direction oscillation modes, and capable of combining the oscillation modes to enable driving in two directions. A piezoelectric driving device (10) includes: a driving portion (12) to be brought into frictional contact with an object to be driven; and two piezoelectric portions (14a, 14b) (14c, 14d), which are provided to the driving portion (12), are arranged on a plane with the driving portion (12) being sandwiched between the two piezoelectric portions, and are configured to be bent with respect to the plane when voltages are applied thereto.

Abstract: Provided are a piezoelectric driving device, an optical member driving device, a camera device, and an electronic apparatus, which are capable of driving an object to be driven in one direction by oscillation in the one direction, and of driving the object to be driven in two directions by combining the driving in one direction.

Abstract: Provided are a piezoelectric driving device, an optical member driving device, a camera device, and an electronic apparatus, which are capable of performing driving only by one-direction oscillation modes, and capable of combining the oscillation modes to enable driving in two directions. A piezoelectric driving device (10) includes: a driving portion (12) to be brought into frictional contact with an object to be driven; and two piezoelectric portions (14a, 14b) (14c, 14d), which are provided to the driving portion (12), are arranged on a plane with the driving portion (12) being sandwiched between the two piezoelectric portions, and are configured to be bent with respect to the plane when voltages are applied thereto.

Abstract: A sample holder is provided allowing for favorable observation of a cross-sectional sample using a retarding method. The sample holder includes: a sample placement member on which a first fixing member, a cross-sectional sample as an observation sample, and a second fixing member are placed in contact with each other, and inserted inside the electronic optical lens barrel of an electron microscope; and a voltage introduction means for introducing a voltage to the sample placement member. The sample placement member has a positioning section for positioning the first fixing member, the cross-sectional sample, and the second fixing member onto a placement position. A positioning section positions the first planar surface of the first fixing member and the second planar surface of the second fixing member which are disposed respectively adjacent to the observation surface of the cross-sectional sample, parallel to the observation surface at locations equidistant from the observation surface.

Abstract: A sample holder is provided allowing for favorable observation of a cross-sectional sample using a retarding method. The sample holder includes: a sample placement member on which a first fixing member, a cross-sectional sample as an observation sample, and a second fixing member are placed in contact with each other, and inserted inside the electronic optical lens barrel of an electron microscope; and a voltage introduction means for introducing a voltage to the sample placement member. The sample placement member has a positioning section for positioning the first fixing member, the cross-sectional sample, and the second fixing member onto a placement position. A positioning section positions the first planar surface of the first fixing member and the second planar surface of the second fixing member which are disposed respectively adjacent to the observation surface of the cross-sectional sample, parallel to the observation surface at locations equidistant from the observation surface.

Abstract: Provided is an electron microscope on which a specimen holder to have high voltage applied is mountable. The specimen holder has safety (electric shock prevention) features, and attention is paid to the specimen holder in terms of operability. The microscope includes a specimen holder having a function of applying a voltage to a specimen mount disposed to load a specimen, a voltage source that supplies the voltage to be applied to the specimen mount, a voltage cable connected at one end thereof to the specimen holder, and a relay unit to which the other end of the voltage cable is connected, the relay unit being placed on a supporting base that supports a lens barrel of the electron microscope.

Abstract: Charged particle beam apparatus arrangements in which either a first noise absorber which provides noise absorbing performance specialized for a first frequency range including the natural frequency of the charged particle beam apparatus as reference, or a second noise absorber which provides noise absorbing performance specialized for a second frequency range including the frequency of acoustic standing waves generated within the cover as reference, or both of the first and second noise absorbers is/are disposed within a cover of the charged particle beam apparatus.

Abstract: Provided is an electron microscope on which a specimen holder with high voltage applied is mountable. The specimen holder has safety (electric shock prevention means), and attention is paid to the specimen holder in terms of operability. The present invention includes a specimen holder having a function of applying a voltage to a specimen mount, disposed to load a specimen, a voltage source that supplies the voltage to be applied to the specimen mount, a voltage cable connected at one end thereof to the specimen holder, and a relay unit to which the other end of the voltage cable is connected, the relay unit being placed on a supporting base that supports a lens barrel of the electron microscope.

Abstract: Currently, there is no noise-proof cover, particularly noise-proof cover used in a clean room, which absorbs noise by a structure specialized for an estimated frequency of noise produced by environmental noise. Therefore, efficient noise absorption is still difficult. Accordingly, the invention provides a charged particle beam apparatus in which either a first noise absorber which provides noise absorbing performance specialized for a first frequency range including the natural frequency of the charged particle beam apparatus as reference, or a second noise absorber which provides noise absorbing performance specialized for a second frequency range including the frequency of acoustic standing waves generated within the cover as reference, or both of the first and second noise absorbers is/are disposed within a cover of the charged particle beam apparatus.

Abstract: Disclosed here is a high resolution scanning electron microscope having an in-lens type objective lens. The microscope is structured so as to detect transmission electrons scattering at wide angles to observe high contrast STEM images according to each sample and purpose. A dark-field detector is disposed closely to the objective lens magnetic pole. The microscope is provided with means for moving the dark-field detector along a light axis so as to control the scattering angle of each detected dark-field signal.

Abstract: Disclosed here is a high resolution scanning electron microscope having an in-lens type objective lens. The microscope is structured so as to detect transmission electrons scattering at wide angles to observe high contrast STEM images according to each sample and purpose. A dark-field detector is disposed closely to the objective lens magnetic pole. The microscope is provided with means for moving the dark-field detector along a light axis so as to control the scattering angle of each detected dark-field signal.

Abstract: Disclosed here is a high resolution scanning electron microscope having an in-lens type objective lens. The microscope is structured so as to detect transmission electrons scattering at wide angles to observe high contrast STEM images according to each sample and purpose. A dark-field detector is disposed closely to the objective lens magnetic pole. The microscope is provided with means for moving the dark-field detector along a light axis so as to control the scattering angle of each detected dark-field signal.

Abstract: Disclosed here is a high resolution scanning electron microscope having an in-lens type objective lens. The microscope is structured so as to detect transmission electrons scattering at wide angles to observe high contrast STEM images according to each sample and purpose. A dark-field detector is disposed closely to the objective lens magnetic pole. The microscope is provided with means for moving the dark-field detector along a light axis so as to control the scattering angle of each detected dark-field signal.

Abstract: Disclosed here is a high resolution scanning electron microscope having an in-lens type objective lens. The microscope is structured so as to detect transmission electrons scattering at wide angles to observe high contrast STEM images according to each sample and purpose. A dark-field detector is disposed closely to the objective lens magnetic pole. The microscope is provided with means for moving the dark-field detector along a light axis so as to control the scattering angle of each detected dark-field signal.

Abstract: Disclosed here is a high resolution scanning electron microscope having an in-lens type objective lens. The microscope is structured so as to detect transmission electrons scattering at wide angles to observe high contrast STEM images according to each sample and purpose.

Abstract: A method and apparatus for generation of high frequency pulses and for excitation of nuclear magnetic resonance of a sample generates a plurality of modurated high frequency waves having different frequencies from each other, and combines the generated these high frequency waves so as to generate high frequency pulses which provide a frequency spectrum having a predetermined band, thereby a shortening of the high frequency pulse width as well as a narrowing of the frequency band is achieved.