Patents by Inventor Masahiro Ikegami

Masahiro Ikegami has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210057200
    Abstract: A matrix-derived peak information acquisition unit (31) creates a peak list that summarizes various ions derived from a matrix and their theoretical m/z values based on a result of analysis of a sample of only a matrix, and stores the peak list in a matrix-derived peak information storage unit (32). When an actually-measured mass spectrum of a target sample is obtained, a mass calibration reference peak detection unit (33) uses a peak list corresponding to a matrix used for analysis to identify an ion peak derived from a matrix appearing in the actually-measured mass spectrum. A mass calibration information calculation unit (35) obtains mass calibration information from an actually-measured m/z value and a theoretical m/z value of the identified peak, and a mass calibration processing unit (37) uses the mass calibration information to correct an m/z value of a peak derived from a target compound on the actually-measured mass spectrum.
    Type: Application
    Filed: February 5, 2018
    Publication date: February 25, 2021
    Applicant: SHIMADZU CORPORATION
    Inventor: Masahiro IKEGAMI
  • Publication number: 20210035299
    Abstract: In a data processing unit, alignment is performed by appropriately deforming one image among MS imaging images acquired from different samples so that positions and sizes on the MS imaging image are matched (S1 to S5). When the aligned image is displayed on a screen of a display unit and a user sets a region of interest on the image serving as a reference (S6), a micro region including a center point within a range of the set region of interest is extracted in each of an image serving as the reference and an image not serving as the reference (S7).
    Type: Application
    Filed: March 30, 2018
    Publication date: February 4, 2021
    Inventor: Masahiro IKEGAMI
  • Patent number: 10896813
    Abstract: When conducting imaging mass analysis for a region to be measured on a sample, an individual reference value calculating part obtains a maximum value in Pi/Ii of respective measuring points, and stores the value together with measured data as an individual reference value. When performing comparison analysis for a plurality of the data obtained from different samples, a common reference value determining part reads out corresponding a plurality of the individual reference values and determines a minimum value as a common reference value Fmin. A normalization calculation processing part normalizes the respective intensity values by multiplying the intensity values read out from an external memory device by a normalization coefficient long_Max×(Fmin/Pi) obtained from the common reference value Fmin, TIC values Pi at the respective measuring points, and a maximum allowable value long_Max of a variable storing the intensity values at the time of operation.
    Type: Grant
    Filed: December 22, 2014
    Date of Patent: January 19, 2021
    Assignee: Shimadzu Corporation
    Inventors: Masahiro Ikegami, Shigeki Kajihara
  • Patent number: 10763094
    Abstract: For every acquisition of a set of mass spectrum data, a mass calibrator (determines the amount of mass discrepancy using the appearance position of a peak originating from an internal standard substance having a known m/z value, and performs a process for correcting the mass discrepancy. A mass calibration information collector (collects the amount of mass discrepancy or mass correction quantity for each set of mass spectrum data. After the completion of the measurement, a three-dimensional display information creator creates a three-dimensional graph showing the large number of collected mass correction quantities plotted in a three-dimensional space in which the retention time in a primary column and the retention time in a secondary column in a comprehensive two-dimensional LC unit are represented by two mutually orthogonal axes while the mass correction quantity is represented by the axis orthogonal to those two axes.
    Type: Grant
    Filed: December 25, 2014
    Date of Patent: September 1, 2020
    Assignee: SHIMADZU CORPORATION
    Inventors: Shinichi Yamaguchi, Yoshikatsu Umemura, Masahiro Ikegami, Koji Tanaka
  • Publication number: 20200185186
    Abstract: To provide a charged particle beam device capable of preventing generation of geometric aberration by aligning axes of electrostatic lenses with high accuracy even when center holes of respective electrodes which constitute the electrostatic lens are not disposed coaxially. The charged particle beam device according to the invention includes an electrostatic lens disposed between an acceleration electrode and an objective lens, wherein at least one of the electrodes which constitutes the electrostatic lens is formed of a magnetic body, and two or more magnetic field generating elements are disposed along an outer periphery of the electrode.
    Type: Application
    Filed: October 25, 2019
    Publication date: June 11, 2020
    Inventors: Yuta KAWAMOTO, Akira IKEGAMI, Masahiro FUKUTA
  • Publication number: 20190287774
    Abstract: An optical image formation unit forms an optical image of an interest region based on data obtained through image acquiring of the surface of a specimen. An intensity image production unit produces an intensity image illustrating ion spatial distribution at an m/z value specified based on mass spectrum data obtained for each measurement point in the interest region. An image superimposing processor produces an image by superimposing the optical image and the intensity image at a predetermined m/z value in accordance with an instruction from a user, and a display processor displays the image on a screen of a display unit. When the user performs a predetermined operation, the display processor displays a set screen for adjusting the brightness and contrast of the optical image, and an image parameter adjustment unit changes the brightness and contrast of the optical image in the superimposed image independently from the intensity image.
    Type: Application
    Filed: August 26, 2016
    Publication date: September 19, 2019
    Applicant: SHIMADZU CORPORATION
    Inventors: Koretsugu OGATA, Masahiro IKEGAMI
  • Patent number: 10405435
    Abstract: An electronic component is able to be mounted on a mounting substrate on which a first electronic component and a second electronic component are able to be mounted. When dimensions of the first electronic component and the second electronic component in a width direction is designated as W1 and W2, respectively, and dimensions of the first electronic component and the second electronic component in a length direction are designated as L1 and L2, respectively, dimensions of the electronic component in the width direction and the length direction are any one of combinations of W1 and L2, and of W2 and L1. The electronic component includes a third laminate and a pair of third external electrodes. Each of the pair of third external electrodes includes a fired layer, and a resin layer provided on an external surface of the fired layer.
    Type: Grant
    Filed: August 4, 2017
    Date of Patent: September 3, 2019
    Assignee: MURATA MANUFACTURING CO., LTD.
    Inventors: Masahiro Wakashima, Yuta Saito, Kohei Shimada, Naobumi Ikegami
  • Patent number: 10340083
    Abstract: An electronic component is able to be mounted on a mounting substrate including a pair of first edge portions that faces each other, and a pair of second edge portions that is perpendicular or substantially perpendicular to the pair of first edge portions and faces each other. The mounting substrate has a structure that allows at least any one of the electronic component, a first electronic component, and a second electronic component, to be mounted thereon. When a dimension of the first electronic component in a length direction is designated as L1, a dimension of the first electronic component in a width direction is designated as W1, a dimension of the second electronic component in the length direction is designated as L2, and a dimension of the second electronic component in the width direction is designated as W2, a dimension of the electronic component in the width direction is any one of W1 and W2.
    Type: Grant
    Filed: August 4, 2017
    Date of Patent: July 2, 2019
    Assignee: MURATA MANUFACTURING CO., LTD.
    Inventors: Masahiro Wakashima, Yuta Saito, Kohei Shimada, Naobumi Ikegami
  • Publication number: 20190198304
    Abstract: The compound list stored in identification information memory is populated with theoretical masses associated with a variety of compounds, as well as information such as the type of matrix capable of detecting said compound, potential neutral loss, etc. The adduct ion list, meanwhile, is populated with theoretical masses associated with a variety of adduct ions, as well as other information such as types of matrices capable of producing adducts, etc. When a user specifies a peak on the mass spectrum for a compound search, compound candidate search portion extracts combination candidates based on how well the measured m/z value of the specified peak matches the m/z value for combinations of compounds in the compound list and adduct ions in the adduct ion list, while the type of matrix used during measurement serves as a condition to narrow down the combinations. Display processing portion displays a list of the search results.
    Type: Application
    Filed: September 1, 2016
    Publication date: June 27, 2019
    Applicant: SHIMADZU CORPORATION
    Inventors: Masahiro IKEGAMI, Koretsugu OGATA
  • Publication number: 20190189414
    Abstract: The user specifies regions of interest (ROIs) such as a region where a large amount of compound to be identified is estimated to be included and a region where the compound is overlapped with another compound on one or more specific MS images, and specifies addition or subtraction of the ROIs. For each of the specified ROIs, an average MS/MS spectrum is calculated from MS/MS spectrum data at measurement points in the regions, and the average MS/MS spectra at the ROIs are subjected to addition or subtraction, to obtain an MS/MS spectrum. By addition between the ROIs, the intensity of peak derived from the target compound can be increased. By subtraction between the ROIs, a peak derived from the other compound overlapped with the target compound can be removed. When the MS/MS spectrum after addition or subtraction is subjected to library search for identification, a score indicating the similarity of the spectrum is higher than the conventional score, and the identification accuracy can be improved.
    Type: Application
    Filed: August 26, 2016
    Publication date: June 20, 2019
    Applicant: SHIMADZU CORPORATION
    Inventors: Masahiro IKEGAMI, Koretsugu OGATA
  • Patent number: 10312067
    Abstract: If spatial measurement point intervals in imaging mass analysis data of two samples to be compared are different and the degrees of spatial distribution spreading of substances are compared, one of the data is defined as a reference, the measurement point intervals in the other of the data are redefined so as to be equalized to the reference, and a mass spectrum at each virtual measurement point set as a result of the redefinition is obtained through interpolation or extrapolation based on a mass spectrum at an actual measurement points. If the arrays of the m/z values of mass spectra are different for each sample, the m/z value positions of the mass spectrum in one of the data are defined as a reference, and the intensity values corresponding to the reference m/z values are obtained through interpolation or extrapolation for the mass spectrum of the other of the data.
    Type: Grant
    Filed: April 21, 2014
    Date of Patent: June 4, 2019
    Assignee: SHIMADZU CORPORATION
    Inventors: Masahiro Ikegami, Shigeki Kajihara
  • Publication number: 20180218892
    Abstract: For every acquisition of a set of mass spectrum data, a mass calibrator (determines the amount of mass discrepancy using the appearance position of a peak originating from an internal standard substance having a known m/z value, and performs a process for correcting the mass discrepancy. A mass calibration information collector (collects the amount of mass discrepancy or mass correction quantity for each set of mass spectrum data. After the completion of the measurement, a three-dimensional display information creator creates a three-dimensional graph showing the large number of collected mass correction quantities plotted in a three-dimensional space in which the retention time in a primary column and the retention time in a secondary column in a comprehensive two-dimensional LC unit are represented by two mutually orthogonal axes while the mass correction quantity is represented by the axis orthogonal to those two axes.
    Type: Application
    Filed: December 25, 2014
    Publication date: August 2, 2018
    Applicant: SHIMADZU CORPORATION
    Inventors: Shinichi YAMAGUCHI, Yoshikatsu UMEMURA, Masahiro IKEGAMI, Koji TANAKA
  • Publication number: 20170352525
    Abstract: When conducting imaging mass analysis for a region to be measured on a sample, an individual reference value calculating part obtains a maximum value in Pi/Ii of respective measuring points, and stores the value together with measured data as an individual reference value. When performing comparison analysis for a plurality of the data obtained from different samples, a common reference value determining part reads out corresponding a plurality of the individual reference values and determines a minimum value as a common reference value Fmin. A normalization calculation processing part normalizes the respective intensity values by multiplying the intensity values read out from an external memory device by a normalization coefficient long_Max×(Fmin/Pi) obtained from the common reference value Fmin, TIC values Pi at the respective measuring points, and a maximum allowable value long_Max of a variable storing the intensity values at the time of operation.
    Type: Application
    Filed: December 22, 2014
    Publication date: December 7, 2017
    Applicant: Shimadzu Corporation
    Inventors: Masahiro IKEGAMI, Shigeki KAJIHARA
  • Patent number: 9589174
    Abstract: Specific-site extraction unit 24 extracts specific sites from microscopy images that are obtained by staining or fluorescence labeling of specific sites in a specimen 4. Based on the similarity between MS imaging data and the spatial distribution of the specific sites, cluster analysis unit 25 and division count determination processing unit 26 evaluate the similarity with the spatial distribution of all pixels that belong to one cluster when each of the pixels are categorized into a plurality of clusters. Since the specific sites are sites that include the same characteristic substance, clustering is judged to be appropriate if the similarity in spatial distribution is high. Hence, based on the correlation between spatial distributions, an appropriate division count for the cluster analysis is determined, and the result of the cluster analysis using the division count is output on a display unit 31.
    Type: Grant
    Filed: August 2, 2012
    Date of Patent: March 7, 2017
    Assignee: Shimadzu Corporation
    Inventor: Masahiro Ikegami
  • Patent number: 9536716
    Abstract: When a sample plate 3 is set on a sample stage 2, an irradiation trace formation controller 22 appropriately moves the sample stage 2 and throws a short pulse of high-power laser beam to create an irradiation trace at a predetermined position on the sample plate 3. The irradiation trace has a unique shape. A microscopic image of the irradiation trace is captured and saved in an image storage section 32. After the sample plate 3 is temporarily removed from the stage 2 to apply a matrix to a sample, the sample plate 3 is re-set on the same stage 2. Then, the displacement of the sample plate 3 from its original position is calculated from the difference in the position of the irradiation trace between an image taken at that point in time and the image previously stored in the image storage section 32. Based on the calculated result, an analysis position corrector 24 modifies the position information of an area selected by an operator. Thus, the displacement of the re-set sample plate can be accurately detected.
    Type: Grant
    Filed: February 16, 2011
    Date of Patent: January 3, 2017
    Assignee: SHIMADZU CORPORATION
    Inventors: Masahiro Ikegami, Takahiro Harada
  • Patent number: 9412571
    Abstract: Compressed data of mass spectra obtained at respective measurement points and normalization coefficients for XIC normalization or the like are stored in a memory (21). When a normalized imaging graphic at a specific m/z value is to be displayed, a data decompression processor (23) reads the minimally required set of compressed data from the memory (21) and restores the intensity value corresponding to the m/z value at each measurement point. A normalizing calculation processor (29) reads an XIC normalization coefficient corresponding to the m/z value from the memory (21) and corrects the intensity values at each measurement point by multiplying those values by the coefficient. An imaging graphic creation processor (27) assigns a display color to each of the corrected intensity values to create an imaging graphic, and displays the imaging graphic on the screen of a display unit (6).
    Type: Grant
    Filed: April 21, 2014
    Date of Patent: August 9, 2016
    Assignee: SHIMADZU CORPORATION
    Inventor: Masahiro Ikegami
  • Publication number: 20160071711
    Abstract: Compressed data of mass spectra obtained at respective measurement points and normalization coefficients for XIC normalization or the like are stored in a memory (21). When a normalized imaging graphic at a specific m/z value is to be displayed, a data decompression processor (23) reads the minimally required set of compressed data from the memory (21) and restores the intensity value corresponding to the m/z value at each measurement point. A normalizing calculation processor (29) reads an XIC normalization coefficient corresponding to the m/z value from the memory (21) and corrects the intensity values at each measurement point by multiplying those values by the coefficient. An imaging graphic creation processor (27) assigns a display color to each of the corrected intensity values to create an imaging graphic, and displays the imaging graphic on the screen of a display unit (6).
    Type: Application
    Filed: April 21, 2014
    Publication date: March 10, 2016
    Applicant: SHIMADZU CORPORATION
    Inventor: Masahiro IKEGAMI
  • Patent number: 8873796
    Abstract: The present invention provides a method and apparatus for efficiently handling a large amount of data collected by an imaging mass analysis to present significant information for the analysis of the tissue structure of a biological sample or other objects in an intuitively understandable form for analysis operators. For each pixel 8b on a sample 8, a mass-to-charge ratio m/z(i) corresponding to the maximum intensity MI(i) in a mass spectrum is listed, and the largest value MII of the maximum intensities of all the pixels are extracted. A color scale corresponding to the intensity values within a range of 0 to MII is defined. For each pixel, the maximum intensity MI is compared with the color scale to assign a color to that pixel. A mapping image with the pixels shown in the respective colors is created and displayed.
    Type: Grant
    Filed: March 15, 2011
    Date of Patent: October 28, 2014
    Assignee: Shimadzu Corporation
    Inventors: Shigeki Kajihara, Masahiro Ikegami, Hiroko Morinaga
  • Publication number: 20140316717
    Abstract: If spatial measurement point intervals in imaging mass analysis data of two samples to be compared are different and the degrees of spatial distribution spreading of substances are compared, one of the data is defined as a reference, the measurement point intervals in the other of the data are redefined so as to be equalized to the reference, and a mass spectrum at each virtual measurement point set as a result of the redefinition is obtained through interpolation or extrapolation based on a mass spectrum at an actual measurement points. If the arrays of the m/z values of mass spectra are different for each sample, the m/z value positions of the mass spectrum in one of the data are defined as a reference, and the intensity values corresponding to the reference m/z values are obtained through interpolation or extrapolation for the mass spectrum of the other of the data.
    Type: Application
    Filed: April 21, 2014
    Publication date: October 23, 2014
    Applicant: SHIMADZU CORPORATION
    Inventors: Masahiro IKEGAMI, Shigeki KAJIHARA
  • Patent number: 8498989
    Abstract: Provided is a method for quickly obtaining an intensity value at a desired m/z value in a compressed data obtained by run-length encoding of a mass analysis data. An index is created by pairing either the start position of a section where zero-intensity consecutively occurs two or more times in an array of an original spectrum data, or the start position of a sequence of data having significant intensity values in an array of the original spectrum data, with the corresponding position in an array of a compressed data. This index is stored separate from the compressed data. The creation of the index does not affect the array of the compressed data. Therefore, the data can be decompressed even by a data processing system that does not use the index. The index helps to quickly locate a compressed data corresponding to the desired m/z and obtain the necessary intensity value.
    Type: Grant
    Filed: February 14, 2012
    Date of Patent: July 30, 2013
    Assignee: Shimadzu Corporation
    Inventor: Masahiro Ikegami