Patents by Inventor Masahiro Matsuzawa

Masahiro Matsuzawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240134280
    Abstract: A polymer containing a structural unit including an aromatic hydroxy group bonded to a main chain, where the aromatic hydroxy group is protected by an acid-labile group represented by the following formula (ALU-1) and is deprotected by action of an acid to become alkali-soluble. This provides: a polymer that makes it possible to form a resist film with which it is possible to form a pattern having extremely high isolated space resolution, small LER, and excellent rectangularity, effects of development loading and residue defects being suppressed, and the pattern having etching resistance and suppressed pattern collapse in the produced resist pattern; a chemically amplified positive resist composition containing the polymer; a resist patterning process using the chemically amplified positive resist composition; and a mask blank including the chemically amplified positive resist composition.
    Type: Application
    Filed: September 20, 2023
    Publication date: April 25, 2024
    Applicant: SHIN-ETSU CHEMICAL CO., LTD.
    Inventors: Masahiro FUKUSHIMA, Satoshi WATANABE, Kenji FUNATSU, Keiichi MASUNAGA, Masaaki KOTAKE, Yuta MATSUZAWA
  • Publication number: 20240118613
    Abstract: A chemically amplified positive resist composition is provided comprising a polymer comprising units containing a phenolic hydroxy group and units containing a phenolic hydroxy group protected with an acid labile group, in which a carbon atom neighboring the carbon atom to which the phenolic hydroxy group protected with an acid labile group is attached is substituted with a specific group. A resist pattern with a high resolution, reduced LER, rectangularity, minimized influence of develop loading, and few development residue defects can be formed.
    Type: Application
    Filed: August 29, 2023
    Publication date: April 11, 2024
    Applicant: Shin-Etsu Chemical Co., Ltd.
    Inventors: Keiichi Masunaga, Satoshi Watanabe, Masaaki Kotake, Kenji Funatsu, Masahiro Fukushima, Yuta Matsuzawa
  • Publication number: 20240094635
    Abstract: A chemically amplified positive resist composition comprising (A) a base polymer, (B) a photoacid generator, and (C) a quencher is provided. The base polymer (A) contains a polymer comprising phenolic hydroxy group-containing units, aromatic ring-containing units, and units containing a phenolic hydroxy group protected with an acid labile group. The photoacid generator (B) and the quencher (C) are present in a weight ratio (B)/(C) of less than 3/1. The resist composition exhibits a very high isolated-space resolution and forms a pattern with reduced LER, rectangularity, minimized influences of develop loading and residue defects.
    Type: Application
    Filed: August 2, 2023
    Publication date: March 21, 2024
    Applicant: Shin-Etsu Chemical Co., Ltd.
    Inventors: Keiichi Masunaga, Satoshi Watanabe, Kenji Funatsu, Masahiro Fukushima, Masaaki Kotake, Yuta Matsuzawa
  • Patent number: 5378968
    Abstract: A manipulator whose economic efficiency and reliability are raised by reducing the size and weight of the system through the backup by a common specification drive circuit and actuator when a fault occurs is provided. Thus, the actuator of the end effector is made so as to have the common structure as the actuators of the multiple joints, so that they are driven by a common specification drive unit. Two systems which can be switched are provided in the actuator of the end effector and additionally, a spare drive unit is provided.
    Type: Grant
    Filed: October 25, 1993
    Date of Patent: January 3, 1995
    Assignee: Hitachi, Ltd.
    Inventors: Naoya Ezawa, Naoki Noguchi, Shinichi Takarada, Masahiro Matsuzawa