Abstract: [Problem] To provide an abnormality detection data recording device capable of detecting an abnormality and leaving its history. [Solution] An abnormality detection data recording device includes a first semiconductor integrated circuit device and a second semiconductor integrated circuit device. The first semiconductor integrated circuit device includes an abnormality detection part configured to detect an abnormality of an electronic device in which the abnormality detection data recording device is installed, and a transmission part configured to transmit abnormality detection data indicative of the abnormality detected by the abnormality detection part. The second semiconductor integrated circuit device includes a reception part configured to receive the abnormality detection data by wired communication with the transmission part, and a storage part configured to nonvolatilely store the abnormality detection data received by the reception part.

Abstract: There is provided an abnormality detection data recording device including a first semiconductor integrated circuit device and a second semiconductor integrated circuit device. The first semiconductor integrated circuit device includes an abnormality detection part configured to detect an abnormality of an electronic device in which the abnormality detection data recording device is installed, and a transmission part configured to transmit abnormality detection data indicative of the abnormality detected by the abnormality detection part. The second semiconductor integrated circuit device includes a reception part configured to receive the abnormality detection data by wired communication with the transmission part, and a storage part configured to nonvolatilely store the abnormality detection data received by the reception part.