Abstract: A movable-side magnet is provided to a movable portion in a vacuum chamber. A drive unit is provided outside the vacuum chamber, and drives the movable portion by exerting magnetic force on the movable-side magnet. The drive unit has a first magnet, a second magnet, and a moving mechanism (moving member). The first magnet exerts magnetic force of attracting the movable-side magnet. The second magnet is provided to be adjacent to the first magnet, and exerts magnetic force of repelling the movable-side magnet. The moving mechanism integrally moves the first magnet and the second magnet.

Abstract: Provided is an ion analysis device (10) that irradiates sample component-derived precursor ions with radicals so as to generate product ions and analyzes the product ions, said device comprising: a reaction chamber (142) into which the precursor ions are introduced; a radical generation unit (151) which generates radicals; and a radical transport pipe (152) which connects the radical generation unit (151) and the reaction chamber (142), wherein at least part of the inner wall surface of the radical transport pipe (152) is made of a material having a lesser amount of or lower strength of radical adherence to the inner wall surface of the radical transport pipe (152) in comparison with alumina or quartz. One end (1523) of the radical transport pipe (152) is disposed inside the reaction chamber (142) and preferably faces toward a prescribed region (1424) where ions are localized in the reaction chamber (142).

Abstract: A radical generation device includes: a cylindrical tube; an antenna; an outer conductor part; and a connection part which has a double cylindrical tube structure including an inner cylindrical body and an outer cylindrical body, end portions of the inner cylindrical body and the outer cylindrical body on the same side are divided in a circumferential direction notches extending in an axial direction to form divided pieces, and tapered portions swelling outward toward a tip end are formed on an outer side of the divided pieces or tapered portions swelling inward toward a tip end are formed on an inner side of the divided pieces.

Abstract: An ion spectrometer includes: a reaction chamber to dissociate ions derived from a sample component by causing the ions to react with radical species; a cylindrical part constituting a part of the reaction chamber and having openings at both ends; a plurality of electrodes disposed inside the cylindrical part to surround an axis that is linear along an extending direction of the cylindrical part, the electrodes extending in a direction along the axis; a heating part to heat the plurality of electrodes; a pair of electrode holding parts respectively provided in openings at both ends of the cylindrical part and having holes into which electrode support pins described later are respectively inserted; and the electrode support pins of a rod shape each provided on a surface facing the pair of electrode holding parts in each of the plurality of electrodes and extending parallel to the axis.

Abstract: A mass spectrometer provided with an ionization chamber (10) in which ionization is performed on a sample by laser ionization, includes an opening part (12) that is provided on a side wall of the ionization chamber (10), and includes a door (13); a ventilation port (14) provided in a wall of the ionization chamber (10), which is opposite to the opening port (12); and a gas supplier (64), (67) for supplying high-pressure cleaning gas to the ionization chamber (10) through the ventilation port (14). In this configuration, the high-pressure cleaning gas flows into the ionization chamber (10) from the gas supplier (64), (67) while the door (13) is opened, thereby blowing up particles including fragments of bacterial cells, which are piled up on a floor of the ionization chamber (10), and/or sweeping particles floating near the floor, so as to discharge the particles to the outside.

Abstract: An ion analyzer 1 includes: an ionization chamber 10; an ionization unit 3 configured to generate ions from a sample 11 in the ionization chamber 10; an analysis chamber 20 separated from the ionization chamber 10 by a partition wall 21 in which an opening 211 is formed; an ion transport unit 22, 23, and 24 provided in the analysis chamber 20 and configured to transport the ions generated in the ionization unit; an ion trapping unit 25 provided in the analysis chamber 20 and configured to trap the ions transported by the ion transport unit 22, 23, and 24; an ion detection unit 26 provided in the analysis chamber 20 and configured to detect the ions released from the ion trapping unit 25; and a single evacuation mechanism 28 connected only to the analysis chamber 20 and configured to evacuate the analysis chamber 20 to a pressure of 103 Pa or less.

Abstract: A mass spectrometer provided with an ionization chamber (10) in which ionization is performed on a sample by laser ionization, includes an opening part (12) that is provided on a side wall of the ionization chamber (10), and includes a door (13); a ventilation port (14) provided in a wall of the ionization chamber (10), which is opposite to the opening port (12); and a gas supplier (64), (67) for supplying high-pressure cleaning gas to the ionization chamber (10) through the ventilation port (14). In this configuration, the high-pressure cleaning gas flows into the ionization chamber (10) from the gas supplier (64), (67) while the door (13) is opened, thereby blowing up particles including fragments of bacterial cells, which are piled up on a floor of the ionization chamber (10), and/or sweeping particles floating near the floor, so as to discharge the particles to the outside.

Abstract: A movable-side magnet is provided to a movable portion in a vacuum chamber. A drive unit is provided outside the vacuum chamber, and drives the movable portion by exerting magnetic force on the movable-side magnet. The drive unit has a first magnet, a second magnet, and a moving mechanism (moving member). The first magnet exerts magnetic force of attracting the movable-side magnet. The second magnet is provided to be adjacent to the first magnet, and exerts magnetic force of repelling the movable-side magnet. The moving mechanism integrally moves the first magnet and the second magnet.

Abstract: A metallic plate holder 3 is directly placed on a flat bottom plate 1a of a sample chamber. A linear guide 21 extending in x-direction is located below the bottom plate. Another linear guide 22 extending in y-direction is fixed to a movable part 21a of the linear guide 21. A magnet 23, fixed to a movable part 22a of the linear guide 22, magnetically attracts the plate holder across the bottom plate. When the magnet is two-dimensionally driven by the linear guides, the plate holder follows it and moves two-dimensionally. The flat bottom plate limits the z-position of the plate holder, thereby reducing the fluctuation in the level of the sample on a sample plate 2 due to the movement. Thus, the variation in the level at different positions on the sample plate is reduced, so that the number of times of a calibrant measurement can be decreased.

Abstract: A metallic plate holder 3 is directly placed on a flat bottom plate 1a of a sample chamber. A linear guide 21 extending in x-direction is located below the bottom plate. Another linear guide 22 extending in y-direction is fixed to a movable part 21a of the linear guide 21. A magnet 23, fixed to a movable part 22a of the linear guide 22, magnetically attracts the plate holder across the bottom plate. When the magnet is two-dimensionally driven by the linear guides, the plate holder follows it and moves two-dimensionally. The flat bottom plate limits the z-position of the plate holder, thereby reducing the fluctuation in the level of the sample on a sample plate 2 due to the movement. Thus, the variation in the level at different positions on the sample plate is reduced, so that the number of times of a calibrant measurement can be decreased.

Abstract: A platform for testing electronic parts and electrode used in the same for easy and accurate testing of a three-terminal device. The platform for testing electronic parts of the present invention comprises pressing means, DUT guide means, and electrode board. The pressing means presses DUT to the electrode board and maintains electrical and mechanical contact between the DUT terminals and the electrode groups. The DUT guide means hold the DUT while moving so that the relative position of the DUT to the electrode board is changed and the DUT moves between a plurality of specific positions. The electrode board has multiple electrode groups arranged corresponding to terminals of the DUT. The DUT is connected to test circuits corresponding to each of these electrode groups so that terminals of the DUT are connected to the corresponding test circuit when the DUT is placed at multiple specific positions on the above-mentioned electrode board.

Abstract: A platform for testing electronic parts and electrode used in the same for easy and accurate testing of a three-terminal device. The platform for testing electronic parts of the present invention comprises pressing means, DUT guide means, and electrode board. The pressing means presses DUT to the electrode board and maintains electrical and mechanical contact between the DUT terminals and the electrode groups. The DUT guide means hold the DUT while moving so that the relative position of the DUT to the electrode board is changed and the DUT moves between a plurality of specific positions. The electrode board has multiple electrode groups arranged corresponding to terminals of the DUT. The DUT is connected to test circuits corresponding to each of these electrode groups so that terminals of the DUT are connected to the corresponding test circuit when the DUT is placed at multiple specific positions on the above-mentioned electrode board.

Abstract: A platform for testing electronic parts and electrode used in the same for easy and accurate testing of a three-terminal device. The platform for testing electronic parts of the present invention includes a press, a DUT (Device Under Test) guide, and an electrode board. The press presses the DUT to the electrode board, maintaining electrical and mechanical contact between the DUT terminals and the electrode groups. The DUT guide holds the DUT as the relative position of the DUT to the electrode board is changed. The electrode board has multiple electrode groups arranged corresponding to terminals of the DUT. The DUT is connected to a test circuit corresponding to each of the electrode groups so that DUT terminals are connected to the corresponding test circuit when the DUT is placed at multiple specific positions on the electrode board.

Abstract: A probe for measuring signals with a narrow contact pitch comprises an end section having a main tip member and a sub-tip member, each of which passes through one of two holes in a housing. The sub-tip member is electrically connected to the housing and the main-tip member is insulated from the housing by an insulation member. The sub-tip member is pivotally connected to the housing. The subtip member is asymmetric with respect to the pivot and therefore, its sharpened end can trace a circular orbit when the sub-tip member turns on its pivot. The distance between the two end sections of these tip members (that is, the contact pitch) can be set to a desired length by positioning sub-tip sharpened end section to any point on this orbit.