Patents by Inventor Masakazu NISHIKI

Masakazu NISHIKI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11054249
    Abstract: A displacement measuring apparatus acquires, based on a principle of triangulation and corresponding to an incident position of the reflected light in the light receiving section, a profile that is an aggregate of heights of reflection positions of the planar measurement light in the measurement object. The displacement measuring apparatus drives the light guiding optical system such that a plurality of reflection positions arranged in a line along a first direction on a surface of the measurement object are minutely displaced in a second direction different from the first direction by reflecting the planar measurement light on the surface of the measurement object. The displacement measuring apparatus acquires one profile by statistically processing a plurality of sub-profiles acquired by minutely displacing the light guiding optical system.
    Type: Grant
    Filed: October 15, 2019
    Date of Patent: July 6, 2021
    Assignee: KEYENCE CORPORATION
    Inventor: Masakazu Nishiki
  • Patent number: 10724849
    Abstract: To enable measuring a displacement at a predetermined position of a measurement object for a short time at a high accuracy. While a scanning mirror is moved in a first scanning range to cause measurement light to irradiate a measurement position, a first irradiation angle of the scanning mirror at the time the measurement light is emitted to the measurement position is obtained. While a scanning mirror is moved in a second scanning range that covers the first irradiation angle and that is narrower than the first scanning range, and a second irradiation angle at the time the measurement light is emitted to the measurement position is obtained. A light receiver outputs a received-light quantity distribution, and a displacement at the measurement position is measured on the basis of the second irradiation angle and the position in a second direction of the measurement position.
    Type: Grant
    Filed: October 15, 2019
    Date of Patent: July 28, 2020
    Assignee: Keyence Corporation
    Inventor: Masakazu Nishiki
  • Publication number: 20200149880
    Abstract: A displacement measuring apparatus acquires, based on a principle of triangulation and corresponding to an incident position of the reflected light in the light receiving section, a profile that is an aggregate of heights of reflection positions of the planar measurement light in the measurement object. The displacement measuring apparatus drives the light guiding optical system such that a plurality of reflection positions arranged in a line along a first direction on a surface of the measurement object are minutely displaced in a second direction different from the first direction by reflecting the planar measurement light on the surface of the measurement object. The displacement measuring apparatus acquires one profile by statistically processing a plurality of sub-profiles acquired by minutely displacing the light guiding optical system.
    Type: Application
    Filed: October 15, 2019
    Publication date: May 14, 2020
    Applicant: Keyence Corporation
    Inventor: Masakazu NISHIKI
  • Publication number: 20200149873
    Abstract: To enable measuring a displacement at a predetermined position of a measurement object for a short time at a high accuracy. While a scanning mirror is moved in a first scanning range to cause measurement light to irradiate a measurement position, a first irradiation angle of the scanning mirror at the time the measurement light is emitted to the measurement position is obtained. While a scanning mirror is moved in a second scanning range that covers the first irradiation angle and that is narrower than the first scanning range, and a second irradiation angle at the time the measurement light is emitted to the measurement position is obtained. A light receiver outputs a received-light quantity distribution, and a displacement at the measurement position is measured on the basis of the second irradiation angle and the position in a second direction of the measurement position.
    Type: Application
    Filed: October 15, 2019
    Publication date: May 14, 2020
    Applicant: Keyence Corporation
    Inventor: Masakazu NISHIKI