Patents by Inventor Masakazu Uchino

Masakazu Uchino has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130013224
    Abstract: A strain measuring device is provided which is not affected by a change in the intensity and irradiation direction of light received by a measurement target and which enables stable measurement. A computer functions as minute region extracting device for extracting respective surface height distributions of minute regions a and b containing points A and B in a predetermined region from an initial surface height distribution obtained by measuring the predetermined region (6) of the measurement target by a surface height measuring device, coordinate calculating device for calculating coordinates of points A? and B? in minute regions a? and b? most similar to the minute regions a and b over a time-advanced surface height distribution of the predetermined region 6 and corresponding to the points A and B in the minute regions a and b, respectively, and strain calculating device for calculating a strain in a direction of a line AB of the measurement target.
    Type: Application
    Filed: September 2, 2010
    Publication date: January 10, 2013
    Applicant: Smart Structures LLC
    Inventors: Yukihiro Ito, Kenyu Inoue, Hiroshi Matsuda, Masakazu Uchino
  • Patent number: 8345333
    Abstract: Provided are a displacement/distortion measuring method and a displacement/distortion measuring apparatus for easily and highly accurately measuring displacement or distortion of an object. An image of the surface of the measuring object is picked up by a line scanner apparatus adhered or brought close to the surface of the measuring object. The image is taken, displacement or distortion is measured by image analysis of the image of the measuring object surface prior to time lapse and that after time lapse, and displacement or distortion measuring results are outputted.
    Type: Grant
    Filed: December 21, 2006
    Date of Patent: January 1, 2013
    Assignee: Smart Structures LLC
    Inventors: Hiroshi Matsuda, Masakazu Uchino, Yukihiro Ito, Kousuke Yoshimaru, Chikara Yamazaki, Shuichi Yamazaki, Kousuke Uchida
  • Publication number: 20090284804
    Abstract: Provided are a displacement/distortion measuring method and a displacement/distortion measuring apparatus for easily and highly accurately measuring displacement or distortion of an object. An image of the surface of the measuring object is picked up by a line scanner apparatus adhered or brought close to the surface of the measuring object. The image is taken, displacement or distortion is measured by image analysis of the image of the measuring object surface prior to time lapse and that after time lapse, and displacement or distortion measuring results are outputted.
    Type: Application
    Filed: December 21, 2006
    Publication date: November 19, 2009
    Applicant: Smart Structures LLC
    Inventors: Hiroshi Matsuda, Masakazu Uchino, Yukihiro Ito, Kousuke Yoshimaru, Chikara Yamazaki, Shuichi Yamazaki, Kousuke Uchida