Patents by Inventor Masakazu Yanase

Masakazu Yanase has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods, systems and apparatus for defect detection and classification
    Patent number: 8995747
    Abstract: Aspects of the present invention are related to systems, methods and apparatus for image-based automatic detection of a defective area in a flat panel display and classification of the defect type and the cause of the detected defect.
    Type: Grant
    Filed: July 29, 2010
    Date of Patent: March 31, 2015
    Assignee: Sharp Laboratories of America, Inc.
    Inventors: Xinyu Xu, Chang Yuan, Masakazu Yanase
  • System for feature detection for low contrast images
    Patent number: 8971632
    Abstract: A system for the identification of feature points in low contrast images.
    Type: Grant
    Filed: August 19, 2010
    Date of Patent: March 3, 2015
    Assignee: Sharp Laboratories of America, Inc.
    Inventors: Masakazu Yanase, Chang Yuan, Xinyu Xu
  • WIRING FAULT DETECTION METHOD AND WIRING FAULT DETECTION APPARATUS
    Publication number: 20140203815
    Abstract: A wiring fault detection method and apparatus capable of appropriately detecting a fault in the case of capturing an image of a panel a plurality of times using an infrared camera are provided. The wiring fault detection method according to the present invention acquires correspondence between individual test regions and pads corresponding to the individual test regions. The wiring fault detection apparatus according to the present invention includes pad switching means for switching a pad to which power is to be supplied to a pad corresponding to each test region.
    Type: Application
    Filed: September 10, 2012
    Publication date: July 24, 2014
    Applicant: SHARP KABUSHIKI KAISHA
    Inventor: Masakazu Yanase
  • DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
    Publication number: 20140184784
    Abstract: A defect inspection device of the present invention for detecting a position of a defect existing in a wire formed on a panel, includes: a probe which applies a voltage to a terminal section of the wire; probe moving means for moving the probe to the terminal section; a first infrared sensor which photographs an entire surface of the panel; a second infrared sensor which photographs a part of the panel; and sensor moving means for moving the second infrared sensor to each position on the panel, the first infrared sensor including a plurality of infrared cameras.
    Type: Application
    Filed: May 18, 2012
    Publication date: July 3, 2014
    Applicant: SHARP KABUSHIKI KAISHA
    Inventor: Masakazu Yanase
  • Methods, systems and apparatus for defect detection
    Patent number: 8331650
    Abstract: Aspects of the present invention are related to systems, methods and apparatus for image-based automatic defect detection.
    Type: Grant
    Filed: July 29, 2010
    Date of Patent: December 11, 2012
    Assignee: Sharp Laboratories of America, Inc.
    Inventors: Chang Yuan, Masakazu Yanase, Xinyu Xu
  • SYSTEM FOR FEATURE DETECTION FOR LOW CONTRAST IMAGES
    Publication number: 20120045135
    Abstract: A system for the identification of feature points in low contrast images.
    Type: Application
    Filed: August 19, 2010
    Publication date: February 23, 2012
    Applicant: SHARP LABORATORIES OF AMERICA, INC.
    Inventors: Masakazu Yanase, Chang Yuan, Xinyu Xu
  • Methods, Systems and Apparatus for Defect Detection
    Publication number: 20120027288
    Abstract: Aspects of the present invention are related to systems, methods and apparatus for image-based automatic defect detection.
    Type: Application
    Filed: July 29, 2010
    Publication date: February 2, 2012
    Inventors: Chang Yuan, Masakazu Yanase, Xinyu Xu
  • Methods, Systems and Apparatus for Defect Detection and Classification
    Publication number: 20120027286
    Abstract: Aspects of the present invention are related to systems, methods and apparatus for image-based automatic detection of a defective area in a flat panel display and classification of the defect type and the cause of the detected defect.
    Type: Application
    Filed: July 29, 2010
    Publication date: February 2, 2012
    Inventors: Xinyu Xu, Chang Yuan, Masakazu Yanase